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For: Nicolai L, Biermann K, Trampert A. Application of electron tomography for comprehensive determination of III-V interface properties. Ultramicroscopy 2021;224:113261. [PMID: 33756441 DOI: 10.1016/j.ultramic.2021.113261] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/11/2021] [Revised: 03/05/2021] [Accepted: 03/11/2021] [Indexed: 11/22/2022]
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Paysen E, Capellini G, Talamas Simola E, Di Gaspare L, De Seta M, Virgilio M, Trampert A. Three-Dimensional Reconstruction of Interface Roughness and Alloy Disorder in Ge/GeSi Asymmetric Coupled Quantum Wells Using Electron Tomography. ACS APPLIED MATERIALS & INTERFACES 2024;16:4189-4198. [PMID: 38190284 DOI: 10.1021/acsami.3c15546] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/10/2024]
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