Beam shaping and probe characterization in the scanning electron microscope

An automated algorithm for the determination of oil absorption strategy of magnetic nanoparticles from SEM images

In recent years, the magnetic iron oxide nanoparticles (MNPs) are employed as efficient absorbents for oil removal from water. In this research, the particle size (diameter) obtained from Scanning Electron Microscopy (SEM) images of MNPs, before and after oil-absorption, are utilized to determine the oil-absorption capacity. However, the manual evaluation of the particle size and particle size distribution (PSD) are highly time-consuming and needs expertised people for accurate analysis. Hence, an image processing algorithm is employed for the determination of particle size and PSD from the Scanning Electron Microscopy (SEM) images. The key objective revolves with the preparation of the Maleic Anhydride Grafted Polypropylene anchored Magnetic Nanoparticles (MAPP-a-MNPs) to absorb crude oil from the marine water. The shape, size, and size distribution of MAPP-a-MNPs were assessed by both manual and automated analysis. For this purpose, expertise people help with the manual analysis and Threshold Adaptive-Canny Edge Detection (TA-CED) and Accumulator Updated-Circular Hough Transform (AU-CHT) method is employed for automated analysis. All the automated process were conducted in MATLAB and the measurements were taken for both before and after the oil absorption images. These measurements aid us to determine the quantity of oil absorbed by MAPP-a-MNPs. The results demonstrates excellent oil removal capacity of MAPP-a-MNPs.

SEM Nano: An Electron Wave Optical Simulation for the Scanning Electron Microscope

The simulation program “SEM Nano” is introduced to explain and visualize probe formation in field-emission scanning electron microscopes (SEMs). The program offers an easy and intuitive graphical user interface (GUI) to provide input in terms of understandable SEM parameters and visualization of the output. The simulations are based on wave optics treatment of the electron beam in the SEM column. Based on input parameters provided by the user, the spatial intensity distribution of electrons is calculated at the specimen by incorporating the effects of diffraction, aberrations, coherence, and noise. Given the specimen structure signal (So), the program has the capability to produce an image of the specimen using the electron probe intensity distribution. Finally, a feature is provided to reconstruct the electron probe intensity from the noisy image using a Wiener filter-based deconvolution.

Shaping of Electron Beams Using Sculpted Thin Films

Electron beam shaping by sculpted thin films relies on electron-matter interactions and the wave nature of electrons. It can be used to study physical phenomena of special electron beams and to develop technological applications in electron microscopy that offer new and improved measurement techniques and increased resolution in different imaging modes. In this Perspective, we review recent applications of sculpted thin films for electron orbital angular momentum sorting, improvements in phase contrast transmission electron microscopy, and aberration correction. For the latter, we also present new results of our work toward correction of the spherical aberration of Lorentz scanning transmission electron microscopes and suggest a method to correct chromatic aberration using thin films. This review provides practical insight for researchers in the field and motivates future progress in electron microscopy.