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For: Sagawa R, Yasuhara A, Hashiguchi H, Naganuma T, Tanba S, Ishikawa T, Riedel T, Hartel P, Linck M, Uhlemann S, Müller H, Sawada H. Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV. Ultramicroscopy 2022;233:113440. [PMID: 34920279 DOI: 10.1016/j.ultramic.2021.113440] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/30/2021] [Revised: 11/14/2021] [Accepted: 11/27/2021] [Indexed: 11/19/2022]
Number Cited by Other Article(s)
1
Theoretical study on sixth-order geometrical aberration correction. Ultramicroscopy 2022;239:113569. [DOI: 10.1016/j.ultramic.2022.113569] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/11/2022] [Revised: 05/29/2022] [Accepted: 06/03/2022] [Indexed: 11/18/2022]
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