Surface-based DNA computing operations: DESTROY and READOUT

DNA multi-bit non-volatile memory and bit-shifting operations using addressable electrode arrays and electric field-induced hybridization

DNA has been employed to either store digital information or to perform parallel molecular computing. Relatively unexplored is the ability to combine DNA-based memory and logical operations in a single platform. Here, we show a DNA tri-level cell non-volatile memory system capable of parallel random-access writing of memory and bit shifting operations. A microchip with an array of individually addressable electrodes was employed to enable random access of the memory cells using electric fields. Three segments on a DNA template molecule were used to encode three data bits. Rapid writing of data bits was enabled by electric field-induced hybridization of fluorescently labeled complementary probes and the data bits were read by fluorescence imaging. We demonstrated the rapid parallel writing and reading of 8 (2³) combinations of 3-bit memory data and bit shifting operations by electric field-induced strand displacement. Our system may find potential applications in DNA-based memory and computations.

DNA based technology holds promise for non-volatile memory and computational tasks, yet the relatively slow hybridization kinetics remain a bottleneck. Here, Song et al. have developed an electric field-induced hybridization platform that can speed up multi-bit memory and logic operations.

DNA algorithm for an unbounded fan-in Boolean circuit

In this paper, we present a new DNA-based evaluation algorithm for a Boolean circuit that employs standard bio-molecular techniques. The algorithm operates on an unbounded fan-in Boolean circuit consisting of AND and OR gates. The whole simulation of our algorithm is proposed in a single test tube in O(1) time complexity and is much easier to implement in the laboratory than previously described models. Furthermore, the algorithm allows for evaluating any number of Boolean circuits in parallel in a single test tube.