Study on response of CR-39 detector to light ions

Response of CR-39 to medium energy electron irradiation

The effect of 5-15 keV electron irradiation on the etch rate of CR-39 nuclear track detectors has been investigated for surface doses from 0.09 to 13.85 J/cm2. Even before etching, electrons produce a surface depression proportional to the surface dose raised to the power 0.78 +/- 0.01. Etch rate enhancement was observed in the surface region (about 4 micrometers deep) and was well approximated by a Gaussian function of depth. The depth and thickness of the etch rate enhancement increase with increasing electron energy, but are independent of dose. The maximum etch rate is proportional to the peak volumetric dose raised to the power of 1.45 +/- 0.06, independent of electron energy. No signs of a saturated response were found in the etch rate. This enhanced etching rate may significantly affect nuclear track identification in situations with an electron background.