Gomes GHDM, Andrade RRD, Mohallem NDS. Investigation of phase transition employing strain mapping in TT- and T-Nb
2O
5 obtained by HRTEM micrographs.
Micron 2021;
148:103112. [PMID:
34256317 DOI:
10.1016/j.micron.2021.103112]
[Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/05/2021] [Revised: 07/01/2021] [Accepted: 07/05/2021] [Indexed: 10/20/2022]
Abstract
This work aimed to study the crystalline structure of TT-,T-phases of Nb2O5 nanoparticles through XRD, Rietveld refinement, and HRTEM, using geometric phase analysis (GPA). The results show the presence of distorted NbO6 and NbO7 polyhedral, producing strain effects, mainly in the plane boundaries and along the b-c plane. XRD and HRTEM analyses show the TT→T transition at 700 °C, with increased particle size and increased strain in the boundaries between nanoparticles. The sample calcinated at 700 °C presents segregation of the TT-(001), (100), and T-(130) planes, where the strain effect is more relevant along the [100] zone axis and between phases.
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