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For: Singh V, Mondal C, Bhattacharjee PP, Ghosal P. Microstructural Characterization by Automated Crystal Orientation and Phase Mapping by Precession Electron Diffraction in TEM: Application to Hot Deformation of a γ-TiAl-based Alloy. Microsc Microanal 2019;25:1457-1465. [PMID: 30973126 DOI: 10.1017/s1431927619000394] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
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1
Characterization of Microstructure of Crept Nb and Ta-Rich γ-TiAl Alloys by Automated Crystal Orientation Mapping and Electron Back Scatter Diffraction. Symmetry (Basel) 2022. [DOI: 10.3390/sym14020399] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/01/2023]  Open
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