Compensating Local Magnifications in Atom Probe Tomography for Accurate Analysis of Nano-Sized Precipitates

Estimation of the Electric Field in Atom Probe Tomography Experiments Using Charge State Ratios

Kingham [(1982). The post-ionization of field evaporated ions: A theoretical explanation of multiple charge states. Surf Sci  116(2), 273-301] provided equations for the probability of observing higher charge states in atom probe tomography (APT) experiments. These "Kingham curves" have wide application in APT, but cannot be analytically transformed to provide the electric field in terms of the easily measured charge state ratio (CSR). Here we provide a numerical scheme for the calculation of Kingham curves and the variation in electric field with CSR. We find the variation in electric field with CSR is well described by a simple two- or three-parameter equation, and the model is accurate to most elements and charge states. The model is applied to experimental APT data of pure aluminium and a microalloyed steel, demonstrating that the methods described in this work can be easily applied to a variety of APT problems to understand electric field variations.

On the Use of a Cluster Identification Method and a Statistical Approach for Analyzing Atom Probe Tomography Data for GP Zones in Al-Zn-Mg(-Cu) Alloys

Early-stage clustering in two Al-Mg-Zn(-Cu) alloys has been investigated using atom probe tomography and transmission electron microscopy. Cluster identification by the isoposition method and a statistical approach based on the pair correlation function have both been applied to estimate the cluster size, composition, and volume fraction from atom probe data sets. To assess the accuracy of the quantification of clusters of different mean sizes, synthesized virtual data sets were used, accounting for a simulated degraded spatial resolution. The quality of the predictions made by the two complementary methods is discussed, considering the experimental and simulated data sets.

A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution

Atomic probe tomography (APT) is able to generate three-dimensional chemical maps in atomic resolution. The required instruments for APT have evolved over the last 20 years from an experimental to an established method of materials analysis. Here, we describe the realization of a new modular instrument concept that allows the direct attachment of APT to a dual-beam SEM microscope with the main achievement of fast and direct sample transfer and high flexibility in chamber and component configuration. New operational modes are enabled regarding sample geometry, alignment of tips, and the microelectrode. The instrument is optimized to handle cryo-samples at all stages of preparation and storage. It comes with its own software for evaluation and reconstruction. The performance in terms of mass resolution, aperture angle, and detection efficiency is demonstrated with a few application examples.