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For: Morgan AE, Werner HW. Quantitative analysis of low alloy steels by secondary ion mass spectrometry. Anal Chem 2002. [DOI: 10.1021/ac60368a020] [Citation(s) in RCA: 101] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Number Cited by Other Article(s)
1
Investigation of the relative sensitivity factor for the quantification of ion microprobe results for Nd isotopes in simulated nuclear fuel. Mikrochim Acta 2007. [DOI: 10.1007/s00604-007-0895-8] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/22/2022]
2
Wittmaack K. Depth profiling by means of sims: Recent progress and current problems. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/00337578208222841] [Citation(s) in RCA: 27] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
3
Coudray C, Slodzian G. Contribution of the Landau-Zener-Stueckelberg model to the understanding of positive secondary-ion emission. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:9344-9356. [PMID: 10009732 DOI: 10.1103/physrevb.49.9344] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
4
Michiels F, Butaye L, Adams F. Redistribution of boron during thermal oxidation of silicon studied by SIMS using Ar+ bombardment and the MISR method. Part II: Applications. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140404] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
5
Galuska AA, Wallace WO, Marquez N, Uht J. SIMS matrix effects in Alx Ga1 - xAs: Influence of instrumental parameters. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140109] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
6
Yu ML, Mann K. Bond breaking and the ionization of sputtered atoms. PHYSICAL REVIEW LETTERS 1986;57:1476-1479. [PMID: 10033459 DOI: 10.1103/physrevlett.57.1476] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
7
Role of electronic partition function in quantitative SIMS using the Saha-Eggert equation. Mikrochim Acta 1986. [DOI: 10.1007/bf01196825] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
8
Tamaki S. Improvement in quantitative correction in SIMS using Saha-Eggert equation. Mikrochim Acta 1985. [DOI: 10.1007/bf01201981] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
9
Morgan A. A comparison of secondary ion mass spectrometry and auger electron spectroscopy as surface analytical techniques. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)91012-8] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
10
Weinke H, Michiels E, Gijbels R. Investigation of meteoritic troilite by laser microprobe mass analysis. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0020-7381(83)87132-0] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
11
Burns MS. Applications of secondary ion mass spectrometry (SIMS) in biological research: a review. J Microsc 1982;127:237-58. [PMID: 7186545 DOI: 10.1111/j.1365-2818.1982.tb00419.x] [Citation(s) in RCA: 61] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/23/2023]
12
Sroubek Z. Theory of charge states in sputtering. ACTA ACUST UNITED AC 1982. [DOI: 10.1016/0029-554x(82)90577-8] [Citation(s) in RCA: 48] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
13
Quantifications of SIMS. ACTA ACUST UNITED AC 1982. [DOI: 10.1007/978-3-642-88152-7_37] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
14
Surman DJ, Vickerman JC. Surface analysis of glasses by fast atom bombardment mass spectrometry. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0378-5963(81)90030-1] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022]
15
Richter CE, Trapp M. Atomic and cluster ion emission from silicon in secondary-ion mass spectrometry. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0020-7381(81)85009-7] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
16
Wittmaack K. Implications in the use of reactive ion bombardment for secondary ion yield enhancement. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0378-5963(81)90045-3] [Citation(s) in RCA: 40] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
17
High-resolution secondary ion mass spectrometry (SIMS) for use in chemistry. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0020-7381(81)80123-4] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
18
Morgan A, de Grefte H, Warmoltz N, Werner H, Tolle H. The influence of bombardment conditions upon the sputtering and secondary ion yields of silicon. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0378-5963(81)90084-2] [Citation(s) in RCA: 64] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
19
Outer Shell Excitation During Sputtering and Low Energy Ion Scattering. ACTA ACUST UNITED AC 1981. [DOI: 10.1007/978-3-642-87065-1_17] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
20
Boundary Conditions for Models of Ion and Excited-State Formation in the Sputtering Process. ACTA ACUST UNITED AC 1981. [DOI: 10.1007/978-3-642-87065-1_21] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
21
Jurela Z. The application of the SIMS technique to quantitive chemical analysis. ACTA ACUST UNITED AC 1981. [DOI: 10.1016/0020-7381(81)80109-x] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
22
Morgan AE. An alternative to the relative sensitivity factor approach to quantitative SIMS analysis. SURF INTERFACE ANAL 1980. [DOI: 10.1002/sia.740020402] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
23
Illgen L, Mai H, Seidenkranz U, Voigtmann R. Problems of quantitative secondary ion microanalysis (SIMA) of low alloy steels. SURF INTERFACE ANAL 1980. [DOI: 10.1002/sia.740020302] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
24
Quantitative secondary ion mass spectrometry: A review. SURF INTERFACE ANAL 1980. [DOI: 10.1002/sia.740020205] [Citation(s) in RCA: 107] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
25
Warmoltz N, Werner HW, Morgan AE. The dependence on the angle of incidence of the steady state sputter yield of silicon bombarded by oxygen ions. SURF INTERFACE ANAL 1980. [DOI: 10.1002/sia.740020203] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
26
Williams P, Katz W, Evans C. Towards a universal model for sputtered ion emission. ACTA ACUST UNITED AC 1980. [DOI: 10.1016/0029-554x(80)91278-1] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
27
Wittmaack̀ K. Aspects of quantitative secondary ion mass spectrometry. ACTA ACUST UNITED AC 1980. [DOI: 10.1016/0029-554x(80)91275-6] [Citation(s) in RCA: 78] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
28
Discrimination effects in SIMS. Part III. Ion optical and energy discrimination. ACTA ACUST UNITED AC 1979. [DOI: 10.1016/0020-7381(79)80082-0] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
29
Rudat M, Morrison G. A study of the energy spectra of secondary ions from metal matrices. ACTA ACUST UNITED AC 1979. [DOI: 10.1016/0020-7381(79)83001-6] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/01/2022]
30
The effects of oxygen and nitrogen adsorption on secondary ion energy spectra. ACTA ACUST UNITED AC 1979. [DOI: 10.1016/0020-7381(79)83002-8] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
31
Rudat MA, Morrison G. Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ions. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0020-7381(78)80112-0] [Citation(s) in RCA: 31] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
32
Morgan AE, Werner HW. Molecular versus atomic secondary ion emission from solids. J Chem Phys 1978. [DOI: 10.1063/1.436199] [Citation(s) in RCA: 49] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
33
Kelly R, Good-Zamin C, Shehata M, Squires D. An attempt to understand secondary photon emission. ACTA ACUST UNITED AC 1978. [DOI: 10.1016/0029-554x(78)90927-8] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
34
Good-zamin CJ, Shehata MT, Squires DB, Kelly R. On the problem of whether excited states amongst sputtered particles are of thermal origin. ACTA ACUST UNITED AC 1978. [DOI: 10.1080/00337577808240833] [Citation(s) in RCA: 45] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
35
Semiquantitative analyses by secondary ion mass spectrometry using one fitting parameter. Mikrochim Acta 1978. [DOI: 10.1007/bf01196466] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
36
Effect of energy selection on quantitative analysis in secondary ion microanalysis. ACTA ACUST UNITED AC 1977. [DOI: 10.1016/0020-7381(77)87005-8] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
37
Uriano GA, Gravatt CC, Morrison GH. The Role of Reference Materials and Reference Methods in Chemical Analysis. ACTA ACUST UNITED AC 1977. [DOI: 10.1080/10408347708542696] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/22/2022]
38
Applications of Secondary Ion Mass Spectrometry (SIMS). ACTA ACUST UNITED AC 1977. [DOI: 10.1007/978-3-7091-3724-6_4] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/08/2023]
39
Morgan AE, Werner HW. On the abundance of molecular ions in secondary ion mass spectrometry. ACTA ACUST UNITED AC 1976. [DOI: 10.1007/bf00920605] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
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