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For: Noyce SG, Doherty JL, Cheng Z, Han H, Bowen S, Franklin AD. Electronic Stability of Carbon Nanotube Transistors Under Long-Term Bias Stress. Nano Lett 2019;19:1460-1466. [PMID: 30720283 DOI: 10.1021/acs.nanolett.8b03986] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
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