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For: Zhang Q, Hu G, de Boo GG, Rančić M, Johnson BC, McCallum JC, Du J, Sellars MJ, Yin C, Rogge S. Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors. Nano Lett 2019;19:5025-5030. [PMID: 31251075 DOI: 10.1021/acs.nanolett.9b01281] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]

For:	Zhang Q, Hu G, de Boo GG, Rančić M, Johnson BC, McCallum JC, Du J, Sellars MJ, Yin C, Rogge S. Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors. Nano Lett 2019;19:5025-5030. [PMID: 31251075 DOI: 10.1021/acs.nanolett.9b01281] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]

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(The first 100,000 artilces are displayed in RCA.)