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For: Li Y, Wang Y, Wang Y, Wu Y. Achieving Good Bonding Strength of the Cu Layer on PET Films by Pretreatment of a Mixed Plasma of Carbon and Copper. ACS Appl Mater Interfaces 2023;15:12590-12602. [PMID: 36847329 DOI: 10.1021/acsami.2c23144] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Number Cited by Other Article(s)
1
Dong S, Yang A, Fu Y, Su C. Substrate-dependent deposition of Cu thin films by molecular dynamics simulations. Phys Chem Chem Phys 2025;27:8994-9004. [PMID: 40223680 DOI: 10.1039/d4cp04405c] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/15/2025]
2
Du Y, Luo Y, Shi K, Zuo P, Zhang Q, Zheng Z, Sun B, Xie J. From Metals to Polymers: Material Evolution and Functional Advancements in Current Collectors. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2025:e2502095. [PMID: 40275773 DOI: 10.1002/adma.202502095] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/30/2025] [Revised: 04/15/2025] [Indexed: 04/26/2025]
3
Kattoor V, Wei PT, He ZF, Wei TC. Manipulating the adhesion of electroless plated Cu film on liquid polymer crystal substrate for advanced microelectronic manufacturing. iScience 2024;27:111136. [PMID: 39524345 PMCID: PMC11544086 DOI: 10.1016/j.isci.2024.111136] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/29/2024] [Revised: 08/20/2024] [Accepted: 10/07/2024] [Indexed: 11/16/2024]  Open
4
Tsai YN, Chin SC, Chen HY, Yang TI, Tsai MH, Tseng IH. Sputtered anti-reflection layer on transparent polyimide - substrate improves adhesion strength to - copper layer: effects of layer thickness and sputtering power. RSC Adv 2023;13:13880-13885. [PMID: 37152568 PMCID: PMC10162370 DOI: 10.1039/d3ra02148c] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/01/2023] [Accepted: 04/28/2023] [Indexed: 05/09/2023]  Open
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