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For: Chen X, Hu H, Trasobares J, Nijhuis CA. Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions. ACS Appl Mater Interfaces 2019;11:21018-21029. [PMID: 31117425 DOI: 10.1021/acsami.9b02033] [Citation(s) in RCA: 27] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]

For:	Chen X, Hu H, Trasobares J, Nijhuis CA. Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions. ACS Appl Mater Interfaces 2019;11:21018-21029. [PMID: 31117425 DOI: 10.1021/acsami.9b02033] [Citation(s) in RCA: 27] [Impact Index Per Article: 4.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]

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