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For: Vu NTT, Loh L, Chen Y, Wu Q, Verzhbitskiy IA, Watanabe K, Taniguchi T, Bosman M, Ang YS, Ang LK, Trushin M, Eda G. Single Atomic Defect Conductivity for Selective Dilute Impurity Imaging in 2D Semiconductors. ACS Nano 2023;17:15648-15655. [PMID: 37565985 DOI: 10.1021/acsnano.3c02758] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/12/2023]
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Wang H, Tang D, Wang X, Wan X, Tang D. Surface plasmon resonance-enhanced photoelectrochemical immunoassay with Cu-doped porous Bi2WO6 nanosheets. Talanta 2024;273:125863. [PMID: 38460424 DOI: 10.1016/j.talanta.2024.125863] [Citation(s) in RCA: 5] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/23/2024] [Revised: 02/19/2024] [Accepted: 02/29/2024] [Indexed: 03/11/2024]
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