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For: Brison J, Muramoto S, Castner DG. ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis. J Phys Chem C Nanomater Interfaces 2010;114:5565-5573. [PMID: 20383274 PMCID: PMC2850126 DOI: 10.1021/jp9066179] [Citation(s) in RCA: 32] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/13/2023]

For:	Brison J, Muramoto S, Castner DG. ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis. J Phys Chem C Nanomater Interfaces 2010;114:5565-5573. [PMID: 20383274 PMCID: PMC2850126 DOI: 10.1021/jp9066179] [Citation(s) in RCA: 32] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/13/2023]

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(The first 100,000 artilces are displayed in RCA.)