Motion picture imaging of a nanometer-thick liquid film dewetting by ellipsometric microscopy with a submicrometer lateral resolution

Instability, self-organization and pattern formation in thin soft films

The free surface of a thin soft polymer film is often found to become unstable and self-organizes into various meso-scale structures. In this article we classify the instability of a thin polymer film into three broad categories, which are: category 1: instability of an ultra-thin (<100 nm) viscous film engendered by amplification of thermally excited surface capillary waves due to interfacial dispersive van der Waals forces; category 2: instability arising from the attractive inter-surface interactions between the free surface of a soft film exhibiting room temperature elasticity and another rigid surface in its contact proximity; and category 3: instability caused by an externally applied field such as an electric field or a thermal gradient, observed in both viscous and elastic films. We review the salient features of each instability class and highlight how characteristic length scales, feature morphologies, evolution pathways, etc. depend on initial properties such as film thickness, visco-elasticity (rheology), residual stress, and film preparation conditions. We emphasize various possible strategies for aligning and ordering of the otherwise isotropic structures by combining the essential concepts of bottom-up and top-down approaches. A perspective, including a possible future direction of research, novelty and limitations of the methods, particularly in comparison to the existing patterning techniques, is also presented for each setting.

Theoretical and experimental study on two-stage-imaging microscopy using ellipsometric contrast for real-time visualization of molecularly thin films

A two-stage-imaging ellipsometric-contrast microscope (TIEM) has been developed to measure the distribution of film thickness over a wide area of molecularly thin liquid films with a high lateral resolution, wide field of view, high thickness resolution, and high-speed. Moreover, this ellipsometric microscope enables us to achieve simultaneous measurements with other measurement apparatuses. We present the principle used to parallelize an object image to an imaging sensor and to reduce the incident angle entering the imaging sensor. In addition, we discuss the characteristic shape deformation of the object image due to oblique observation. The performance of the actual setup for TIEM was experimentally studied. A lateral resolution of about 1 μm was obtained by measuring the modulation transfer function of the TIEM. We also found that the shape deformation approximately agreed with that from theory. Furthermore, for molecularly thin films, we confirmed linearity between the film thickness and the light intensity measured with TIEM, which enables us to quantify the thickness of the films. TIEM can open up a new field of real-time imaging of thin films such as visualization of a liquid lubricant film under shear.