Surface composition of poly(styrene-d8-styrene) random copolymers studied by static secondary ion mass spectroscopy

Changes in Thermodynamic Interactions at Highly Immiscible Polymer/Polymer Interfaces due to Deuterium Labeling

Deuterium labeling has been shown previously to affect thermodynamic interactions at polymer surfaces, polymer/polymer heterogeneous interfaces, and in bulk (away from a surface or interface). However, the changes in polymer-polymer interactions due to deuterium labeling have not been thoroughly investigated for highly immiscible systems. It is shown here that deuterium labeling can influence polymer-polymer interactions at heterogeneous interfaces with highly immiscible systems, namely, polystyrene/poly(2-vinylpyridine) (PS/P2VP), polystyrene/poly(4-vinylpyridine) (PS/P4VP), and polystyrene/poly(methyl methacrylate) (PS/PMMA). Using secondary ion mass spectrometry, segregation of deuterium labeled polystyrene (dPS) in a dPS + unlabeled PS (dPS:hPS) blend layer was observed at the dPS:hPS/hP2VP, dPS:hPS/hP4VP, and dPS:hPS/hPMMA heterogeneous interfaces. However, a reference system involving PS on a PS brush shows no segregation of dPS to the interface.

Carbon-13 Labeled Polymers: An Alternative Tracer for Depth Profiling of Polymer Films and Multilayers Using Secondary Ion Mass Spectrometry

13C labeling is introduced as a tracer for depth profiling of polymer films and multilayers using secondary ion mass spectrometry (SIMS). Deuterium substitution has traditionally been used in depth profiling of polymers but can affect the phase behavior of the polymer constituents with reported changes in both bulk-phase behavior and surface and interfacial interactions. SIMS can provide contrast by examining various functional groups, chemical moieties, or isotopic labels. 13C-Labeled PS (13C-PS) and unlabeled PS (12C-PS) and PMMA were synthesized using atom-transfer radical polymerization and assembled in several model thin-film systems. Depth profiles were recorded using a Cameca IMS-6f magnetic sector mass spectrometer using both 6.0-keV impact energy Cs+ and 5.5-keV impact energy O2+ primary ion bombardment with detection of negative and positive secondary ions, respectively. Although complete separation of 12C1H from 13C is achieved using both primary ion species, 6.0-keV Cs+ clearly shows improved detection sensitivity and signal-to-noise ratio for detection of 12C, 12C1H, and 13C secondary ions. The use of Cs+ primary ion bombardment results in somewhat anomalous, nonmonotonic changes in the 12C, 12C1H, and 13C secondary ion yields through the PS/PMMA interface; however, it is shown that this behavior is not due to sample charging. Through normalization of the 13C secondary ion yield to the total C (12C + 13C) ion yield, the observed effects through the PS/PMMA interface can be greatly minimized, thereby significantly improving analysis of polymer films and multilayers using SIMS. Mass spectra of 13C-PS and 12C-PS were also analyzed using a PHI TRIFT I time-of-flight mass spectrometer, with 15-keV Ga+ primary ion bombardment and detection of positive secondary ions. The (12)C7(1)H7 ion fragment and its 13C-enriched analogues have significant secondary ion yields with negligible mass interferences, providing an early indication of the potential for future use of this technique for cluster probe depth profiling of high molecular weight 13C-labeled fragments.

Mass spectra of copolymers

Recent and older literature (covering the last 12-13 years) in the field of mass spectra of random and block copolymers is reviewed. A detailed description is given of the information on copolymer properties that can be recovered from the analysis of the low-mass region of the spectrum (the region below 500 Da) and the high-mass region. The features of mass spectra of copolymers obtained by different synthetic routes are discussed, such as free radical, condensation, ring-chain equilibration, microbial synthesis, ring-opening, simple anionic, cationic, Ziegler-Natta, and/or metallocene catalysis, along with some random and block copolymers that occur in Nature. The emphasis is on copolymer composition and average molar mass determination, and on the benefits of coupling mass spectrometry (MS) with separation techniques such as size-exclusion chromatography (SEC) and high performance liquid chromatography (HPLC).

Evidence of simple intramolecular rearrangement at polymer end groups in secondary ion mass spectrometry

Polystyrenes with various end groups were analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS). These end groups were obtained by termination of the active anionic group by sulfonate or chlorosilane derivatives. Characteristic end group fragments for each sulfonate derivative were observed. On the one hand, for PS capped by methyl sulfonate, or -(CH(2))(4)-O-SO(2)-CH(3), almost complete end group fragment is observed at m/z 95 and a [O-SO(2)-CH(3)](-) molecular structure. On the other hand, when PS is terminated by silyl methyl sulfonate, or -Si(CH(3))(2)-(CH(2))(3)-O-SO(2)-CH(3), the most characteristic fragment in the fingerprint secondary ion mass spectrum is located at m/z 153 with [Si(CH(3))(2)-O-SO(2)-CH(3)](+) and the complete end group peak, [Si(CH(3))(2)-(CH(2))(3)-O-SO(2)-CH(3)](+), at m/z 201, is absent. According to the molecular structure, characteristic end group secondary ions can be emitted as complete or rearranged fragments. Various silylalkyl alcohol or sulfonate functionalities are analyzed and fragmentation pathways are discussed. To our knowledge, this is the first time that such rearrangement at silyl functions has been observed and demonstrated in fingerprint secondary ion mass spectra. Copyright 1999 John Wiley & Sons, Ltd.

Phase Separation and Dewetting of Weakly Incompatible Polymer Blend Films

The phase separation and dewetting of thin films of blends of deuterated polystyrene (dPS) and poly(p-methylstyrene) (PpMS) were investigated during annealing. The surface morphology, obtained from atomic force microscopy and phase measurement interference microscopy, the density profile, determined by X-ray reflectivity in the region of total external reflection, and the surface composition obtained from static secondary ion mass spectroscopy, are reported. This system is only weakly incompatible. The interaction of the components with substrate and air during phase separation leads to a bilayer formation with a broad polymer-polymer interface. PpMS segregates to the air interface. The bilayer structure is unstable and defines the starting point for the dewetting of PpMS on top of the dPS layer. In the final dewetting state a homogeneous layer of dPS on top of the substrate is covered with an ultrathin layer of PpMS as well as with quite thick mesoscopic drops of PpMS.