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Li J, Li Y, Gan T, Shen CY, Jarrahi M, Ozcan A. All-optical complex field imaging using diffractive processors. LIGHT, SCIENCE & APPLICATIONS 2024; 13:120. [PMID: 38802376 PMCID: PMC11130282 DOI: 10.1038/s41377-024-01482-6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/29/2024] [Revised: 05/11/2024] [Accepted: 05/13/2024] [Indexed: 05/29/2024]
Abstract
Complex field imaging, which captures both the amplitude and phase information of input optical fields or objects, can offer rich structural insights into samples, such as their absorption and refractive index distributions. However, conventional image sensors are intensity-based and inherently lack the capability to directly measure the phase distribution of a field. This limitation can be overcome using interferometric or holographic methods, often supplemented by iterative phase retrieval algorithms, leading to a considerable increase in hardware complexity and computational demand. Here, we present a complex field imager design that enables snapshot imaging of both the amplitude and quantitative phase information of input fields using an intensity-based sensor array without any digital processing. Our design utilizes successive deep learning-optimized diffractive surfaces that are structured to collectively modulate the input complex field, forming two independent imaging channels that perform amplitude-to-amplitude and phase-to-intensity transformations between the input and output planes within a compact optical design, axially spanning ~100 wavelengths. The intensity distributions of the output fields at these two channels on the sensor plane directly correspond to the amplitude and quantitative phase profiles of the input complex field, eliminating the need for any digital image reconstruction algorithms. We experimentally validated the efficacy of our complex field diffractive imager designs through 3D-printed prototypes operating at the terahertz spectrum, with the output amplitude and phase channel images closely aligning with our numerical simulations. We envision that this complex field imager will have various applications in security, biomedical imaging, sensing and material science, among others.
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Affiliation(s)
- Jingxi Li
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA
- Bioengineering Department, University of California, Los Angeles, CA, 90095, USA
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA
| | - Yuhang Li
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA
- Bioengineering Department, University of California, Los Angeles, CA, 90095, USA
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA
| | - Tianyi Gan
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA
| | - Che-Yung Shen
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA
- Bioengineering Department, University of California, Los Angeles, CA, 90095, USA
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA
| | - Mona Jarrahi
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA
| | - Aydogan Ozcan
- Electrical and Computer Engineering Department, University of California, Los Angeles, CA, 90095, USA.
- Bioengineering Department, University of California, Los Angeles, CA, 90095, USA.
- California NanoSystems Institute (CNSI), University of California, Los Angeles, CA, 90095, USA.
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Cotrufo M, Sulejman SB, Wesemann L, Rahman MA, Bhaskaran M, Roberts A, Alù A. Reconfigurable image processing metasurfaces with phase-change materials. Nat Commun 2024; 15:4483. [PMID: 38802353 PMCID: PMC11130277 DOI: 10.1038/s41467-024-48783-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/27/2023] [Accepted: 05/08/2024] [Indexed: 05/29/2024] Open
Abstract
Optical metasurfaces have enabled analog computing and image processing within sub-wavelength footprints, and with reduced power consumption and faster speeds. While various image processing metasurfaces have been demonstrated, most of the considered devices are static and lack reconfigurability. Yet, the ability to dynamically reconfigure processing operations is key for metasurfaces to be used within practical computing systems. Here, we demonstrate a passive edge-detection metasurface operating in the near-infrared regime whose response can be drastically modified by temperature variations smaller than 10 °C around a CMOS-compatible temperature of 65 °C. Such reconfigurability is achieved by leveraging the insulator-to-metal phase transition of a thin layer of vanadium dioxide, which strongly alters the metasurface nonlocal response. Importantly, this reconfigurability is accompanied by performance metrics-such as numerical aperture, efficiency, isotropy, and polarization-independence - close to optimal, and it is combined with a simple geometry compatible with large-scale manufacturing. Our work paves the way to a new generation of ultra-compact, tunable and passive devices for all-optical computation, with potential applications in augmented reality, remote sensing and bio-medical imaging.
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Affiliation(s)
- Michele Cotrufo
- Photonics Initiative, Advanced Science Research Center, City University of New York, New York, NY, 10031, USA.
- The Institute of Optics, University of Rochester, Rochester, NY, 14627, USA.
| | - Shaban B Sulejman
- ARC Centre of Excellence for Transformative Meta-Optical Systems, School of Physics, The University of Melbourne, Melbourne, VIC, 3010, Australia
| | - Lukas Wesemann
- ARC Centre of Excellence for Transformative Meta-Optical Systems, School of Physics, The University of Melbourne, Melbourne, VIC, 3010, Australia
| | - Md Ataur Rahman
- Functional Materials and Microsystems Research Group and the Micro Nano Research Facility, RMIT University, Melbourne, VIC, Australia
| | - Madhu Bhaskaran
- Functional Materials and Microsystems Research Group and the Micro Nano Research Facility, RMIT University, Melbourne, VIC, Australia
- ARC Centre of Excellence for Transformative Meta-Optical Systems, RMIT University, Melbourne, VIC, Australia
| | - Ann Roberts
- ARC Centre of Excellence for Transformative Meta-Optical Systems, School of Physics, The University of Melbourne, Melbourne, VIC, 3010, Australia
| | - Andrea Alù
- Photonics Initiative, Advanced Science Research Center, City University of New York, New York, NY, 10031, USA.
- Physics Program, Graduate Center of the City University of New York, New York, NY, 10016, USA.
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Cheng W, Wang Y, Zhang Y, Chen H, Lu Z, Zhao F, Wang Y, Wu J, Yang J. Broadband Achromatic Imaging of a Metalens with Optoelectronic Computing Fusion. NANO LETTERS 2024; 24:254-260. [PMID: 38133576 DOI: 10.1021/acs.nanolett.3c03891] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/23/2023]
Abstract
The remarkable ultrathin ability of metalenses gives them potential as a next-generation imaging candidate. However, the inherent chromatic aberration of metalenses restricts their widespread application. We present an achromatic metalens with optoelectronic computing fusion (OCF) to mitigate the impact of chromatic aberration and simultaneously avoid the significant challenges of nanodesign, nanofabrication, and mass production of metalenses, a method different from previous methods. Leveraging the nonlinear fitting, we demonstrate that OCF can effectively learn the chromatic aberration mapping of metalens and thus restore the chromatic aberration. In terms of the peak signal-to-noise ratio index, there is a maximum improvement of 12 dB, and ∼8 ms is needed to correct the chromatic aberration. Furthermore, the edge extraction of images and super-resolution reconstruction that effectively enhances resolution by a factor of 4 are also demonstrated with OCF. These results offer the possibility of applications of metalenses in mobile cameras, virtual reality, etc.
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Affiliation(s)
- Wei Cheng
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
- College of Computer, Key Laboratory of Advanced Microprocessor Chips and Systems, National University of Defense Technology, Changsha, Hunan 410073, China
- School of Physical Science and Technology, Southwest University, Chongqing 400715, China
| | - Yan Wang
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
- School of Physical Science and Technology, Southwest University, Chongqing 400715, China
- Institute for Quantum Information & State Key Laboratory of High Performance Computing, College of Computer Science and Technology, National University of Defense Technology, Changsha, Hunan 410073, China
| | - Yuqing Zhang
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
- School of Physical Science and Technology, Southwest University, Chongqing 400715, China
| | - Huan Chen
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
| | - Zhechun Lu
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
| | - Fen Zhao
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
- School of Artificial Intelligence, Chongqing University of Technology, Chongqing 400054, China
| | - Yaohua Wang
- College of Computer, Key Laboratory of Advanced Microprocessor Chips and Systems, National University of Defense Technology, Changsha, Hunan 410073, China
| | - Jiagui Wu
- School of Physical Science and Technology, Southwest University, Chongqing 400715, China
| | - Junbo Yang
- Center of Material Science, National University of Defense Technology, Changsha, Hunan 410073, China
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Li L, Wang S, Zhao F, Zhang Y, Wen S, Chai H, Gao Y, Wang W, Cao L, Yang Y. Single-shot deterministic complex amplitude imaging with a single-layer metalens. SCIENCE ADVANCES 2024; 10:eadl0501. [PMID: 38181086 PMCID: PMC10776002 DOI: 10.1126/sciadv.adl0501] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/26/2023] [Accepted: 12/01/2023] [Indexed: 01/07/2024]
Abstract
Conventional imaging systems can only capture light intensity. Meanwhile, the lost phase information may be critical for a variety of applications such as label-free microscopy and optical metrology. Existing phase retrieval techniques typically require a bulky setup, multiframe measurements, or prior information of the target scene. Here, we proposed an extremely compact system for complex amplitude imaging, leveraging the extreme versatility of a single-layer metalens to generate spatially multiplexed and polarization phase-shifted point spread functions. Combining the metalens with a polarization camera, the system can simultaneously record four polarization shearing interference patterns along both in-plane directions, thus allowing the deterministic reconstruction of the complex amplitude light field in a single shot. Using an incoherent light-emitting diode as the illumination, we experimentally demonstrated speckle-noise-free complex amplitude imaging for both static and moving objects with tailored magnification ratio and field of view. The miniaturized and robust system may open the door for complex amplitude imaging in portable devices for point-of-care applications.
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Affiliation(s)
| | | | - Feng Zhao
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Yixin Zhang
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Shun Wen
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Huichao Chai
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Yunhui Gao
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Wenhui Wang
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
| | - Liangcai Cao
- State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instrument, Tsinghua University, Beijing 100084, China
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