1
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Smirnov NS, Krivko EA, Moskaleva DA, Moskalev DO, Solovieva AA, Matanin AR, Echeistov VV, Ivanov АI, Malevannaya EI, Polozov VI, Zikiy EV, Korshakov ND, Teleganov MI, Mikhalin DA, Zhitkov NM, Romashkin RV, Korobenko IS, Yanilkin AV, Lebedev АV, Ryzhikov IA, Andriyash AV, Rodionov IA. Subangstrom ion beam engineering of buried ultrathin oxides for scalable quantum computing. SCIENCE ADVANCES 2025; 11:eads9744. [PMID: 40333973 PMCID: PMC12057654 DOI: 10.1126/sciadv.ads9744] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/05/2024] [Accepted: 04/01/2025] [Indexed: 05/09/2025]
Abstract
Multilayer nanoscale systems incorporating ultrathin tunnel barriers, magnetic materials, amorphous oxides, and promising dielectrics are essential for next-generation logics, memory, quantum, and neuro-inspired computing. Still, an ultrathin film control at the atomic scale remains challenging. Here, we introduce a complementary metal-oxide semiconductor-compatible approach using focused ion beam irradiation for buried ultrathin films' engineering with subangstrom thickness control. Molecular dynamics simulations confirm the pivotal role of ion-induced crystal defects. Its performance is exemplified by Josephson junction resistance tuning in the range of 2 to 37% with a 0.86% standard deviation in completed chips. Furthermore, it enables ±17-megahertz frequency accuracy (±0.172 angstrom tunnel barrier thickness variation) in superconducting multiqubit processors, as well as qubit energy relaxation and echo coherence times exceeding 0.5 milliseconds.
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Affiliation(s)
- Nikita S. Smirnov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | - Elizaveta A. Krivko
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | - Daria A. Moskaleva
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | - Dmitry O. Moskalev
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | - Anastasia A. Solovieva
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Aleksei R. Matanin
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Vladimir V. Echeistov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | - Аnton I. Ivanov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
| | | | - Viktor I. Polozov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Evgeny V. Zikiy
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Nikita D. Korshakov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Maksim I. Teleganov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Dmitry A. Mikhalin
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | - Nikolai M. Zhitkov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | | | - Igor S. Korobenko
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
| | | | | | - Ilya A. Ryzhikov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Institute for Theoretical and Applied Electrodynamics, Moscow 125412, Russia
| | | | - Ilya A. Rodionov
- Shukhov Labs, Quantum Park, Bauman Moscow State Technical University, Moscow 105005, Russia
- Dukhov Automatics Research Institute, VNIIA, Moscow 127030, Russia
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2
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Tu J, Li H, Liu X, Xi G, Liu X, Zhang M, Wu R, Du S, Lu D, Shi L, Xia J, Fang YW, Ding J, Liu Y, Jia Y, Yuan M, Yang R, Li X, Meng X, Tian J, Zhang L, Xing X. Giant switchable ferroelectric photovoltage in double-perovskite epitaxial films through chemical negative strain. SCIENCE ADVANCES 2025; 11:eads4925. [PMID: 40267205 PMCID: PMC12017332 DOI: 10.1126/sciadv.ads4925] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2024] [Accepted: 03/19/2025] [Indexed: 04/25/2025]
Abstract
Double-perovskite films have been extensively studied in multifunctional fields due to their modifiability. Here, a controlled process strategy to induce chemical strain and anomalous Poisson deformation is proposed for perovskite-based films. The chemical negative strain in the local-ordering BiSmFe2O6 double-perovskite films can be regulated by oxygen engineering to cause the effectively tunable bandgap. We markedly increased the switchable open-circuit voltage to ~1.56 V from ~0.50 V for Pt/BiSmFe2O6/Nb-SrTiO3 devices, which is the highest in single-layer perovskite-based ferroelectric photovoltaic perpendicular devices under white light-emitting diode irradiation. The multifield composite action mechanism reveals the electrical cause of the large open-circuit voltage. The synergy of the optical fields and ferroelectric fields provides the possibility of multilevel storage. Structural characterizations indicate that the chemical strain offers a dual role of lattice distortion and vacancy migration. The strategy of controllable chemical strain facilitates further exploration of the application potential of ferroelectric materials for multifunctional electronic devices.
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Affiliation(s)
- Jie Tu
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Hangren Li
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Xudong Liu
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Guoqiang Xi
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Xiuqiao Liu
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Mengqi Zhang
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Rong Wu
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Siyuan Du
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Dongfei Lu
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Longyuan Shi
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Jing Xia
- Key Laboratory of Photochemical Conversion and Optoelectronic Materials, Technical Institute of Physics and Chemistry Chinese Academy of Sciences, Beijing 100190, China
| | - Yue-Wen Fang
- Centro de Física de Materiales (CFM-MPC), CSIC-UPV/EHU, Manuel de Lardizabal Pasealekua 5, 20018 Donostia/San Sebastián, Spain
| | - Jiaqi Ding
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha 410082, China
| | - Yuzhuo Liu
- University of Michigan-Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Yueyang Jia
- University of Michigan-Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Meng Yuan
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Rui Yang
- University of Michigan-Shanghai Jiao Tong University Joint Institute, Shanghai Jiao Tong University, Shanghai 200240, China
| | - Xiaolong Li
- Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
| | - Xiangmin Meng
- Key Laboratory of Photochemical Conversion and Optoelectronic Materials, Technical Institute of Physics and Chemistry Chinese Academy of Sciences, Beijing 100190, China
| | - Jianjun Tian
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
| | - Linxing Zhang
- Institute for Advanced Materials Technology, University of Science and Technology Beijing, Beijing 100083, China
- Institute of Solid State Chemistry, University of Science and Technology Beijing, Beijing 100083, China
| | - Xianran Xing
- Institute of Solid State Chemistry, University of Science and Technology Beijing, Beijing 100083, China
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3
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Peng Y, Liu X, Luo G, Zhang F, Sun T, Li H, Cheng Y, Peng Y. Flexible BaTiO 3 Ferroelectric Nonvolatile Memory for Neuromorphic Computation. ACS APPLIED MATERIALS & INTERFACES 2025; 17:18571-18581. [PMID: 40068696 PMCID: PMC11956775 DOI: 10.1021/acsami.4c21545] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/08/2024] [Revised: 03/03/2025] [Accepted: 03/06/2025] [Indexed: 03/28/2025]
Abstract
The use of BaTiO3 (BTO) ferroelectric thin films in flexible ferroelectric memory offers a promising pathway for next-generation nonvolatile memory applications, given BTO's excellent ferroelectric properties, stability, high dielectric constant, and strong fatigue resistance. However, the fabrication of BTO on flexible substrates presents a significant technical challenge. In this study, we achieved high-quality, single-crystalline (111)-oriented BTO films on mica substrates through the design of buffer layers. The BTO films exhibit strong polarization properties (remnant polarization, 2Pr ∼15.63 μC/cm2, and saturation polarization, 2Ps ∼36.61 μC/cm2), and the flexible BTO devices maintained exceptional stability under bending radii of 3.5 and 6 mm. After 107 bipolar switching cycles, polarization showed only minor changes, with a retention time exceeding 104 s. We further explored the application of flexible BTO ferroelectric memory in neuromorphic computing. The flexible BTO-based memory demonstrated adjustable synaptic behavior, effectively modulating EPSC (excitatory postsynaptic current) responses through pulse amplitude and width to simulate short-term memory. PPF (paired pulse facilitation) and LTP (long-term potentiation) behaviors verified its synaptic weight modulation capabilities, achieving 91.6% accuracy in neural network-based handwritten digit recognition after 103 training cycles. These findings underscore the potential of flexible BTO ferroelectric memory for memory devices and neuromorphic computing, offering promising applications for wearable AI systems.
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Affiliation(s)
- Yiming Peng
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Xingpeng Liu
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Guojian Luo
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Fabi Zhang
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Tangyou Sun
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Haiou Li
- Guangxi
Key Laboratory of Precision Navigation Technology and Application, Guilin University of Electronic Technology, Guilin 541004, China
| | - Yan Cheng
- Key
Laboratory of Polar Materials and Devices (MOE), Department of Electronics, East China Normal University, Shanghai 200241, China
| | - Ying Peng
- College
of Optoelectronic Engineering, Guilin University
of Electronic Technology, Guilin 541004, China
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4
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Luo KF, Ma Z, Sando D, Zhang Q, Valanoor N. Hybrid Ferroelectric Tunnel Junctions: State of the Art, Challenges, and Opportunities. ACS NANO 2025; 19:6622-6647. [PMID: 39937054 DOI: 10.1021/acsnano.4c14446] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/13/2025]
Abstract
Ferroelectric tunnel junctions (FTJs) harness the combination of ferroelectricity and quantum tunneling and thus herald opportunities in next-generation nonvolatile memory technologies. Recent advancements in the fabrication of ultrathin heterostructures have enabled the integration of ferroelectrics with various functional materials, forming hybrid tunneling-diode junctions. These junctions benefit from the modulation of the functional layer/ferroelectric interface through ferroelectric polarization, thus enabling further modalities and functional capabilities in addition to tunneling electroresistance. This Perspective aims to provide in-depth insight into the physical phenomena of several typical ferroelectric hybrid junctions, ranging from ferroelectric/dielectric, ferroelectric/multiferroic, and ferroelectric/superconducting to ferroelectric/2D materials, and finally their expansion into the realm of ferroelectric resonant tunneling diodes (FeRTDs). This latter aspect, i.e., resonant tunneling, offers an approach to exploiting tunneling behavior in ferroelectric heterostructures. We discuss examples that have successfully shown room-temperature ferroelectric control of parameters such as the resonant peak, tunnel current ratio at peak, and negative differential resistance. We conclude the Perspective by summarizing the challenges and highlighting the opportunities for the future development of hybrid FTJs, with a special emphasis on a possible type of FeRTD device. The prospects for enhanced performance and expanded functionality ignite tremendous excitement in hybrid FTJs and FeRTDs for future nanoelectronics.
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Affiliation(s)
- King-Fa Luo
- School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
| | - Zhijun Ma
- Ministry of Education Key Laboratory for the Synthesis and Application of Organic Functional Molecules, Hubei Key Laboratory for Precision Synthesis of Small Molecule Pharmaceuticals, Hubei Key Laboratory of Micro-Nanoelectronic Materials and Devices, Hubei University, Wuhan 430062, China
| | - Daniel Sando
- School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
- The MacDiarmid Institute for Advanced Materials and Nanotechnology, School of Physical and Chemical Sciences, University of Canterbury, Christchurch 8140, New Zealand
| | - Qi Zhang
- School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
- CSIRO, Manufacturing, Lindfield, NSW 2070, Australia
| | - Nagarajan Valanoor
- School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia
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5
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Liu G, Wang Y, Xu Z, Zeng Z, Huang L, Ge C, Wang X. Out-of-plane polarization induces a picosecond photoresponse in rhombohedral stacked bilayer WSe 2. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2024; 15:1362-1368. [PMID: 39530022 PMCID: PMC11552432 DOI: 10.3762/bjnano.15.109] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/09/2024] [Accepted: 10/14/2024] [Indexed: 11/16/2024]
Abstract
Constructing van der Waals materials with spontaneous out-of-plane polarization through interlayer engineering expands the family of two-dimensional ferroelectrics and provides an excellent platform for enhancing the photoelectric conversion efficiency. Here, we reveal the effect of spontaneous polarization on ultrafast carrier dynamics in rhombohedral stacked bilayer WSe2. Using precise stacking techniques, a 3R WSe2-based vertical heterojunction was successfully constructed and confirmed by polarization-resolved second harmonic generation measurements. Through output characteristics and the scanning photocurrent map under zero bias, we reveal a non-zero short-circuit current in the graphene/3R WSe2/graphene heterojunction region, demonstrating the bulk photovoltaic effect. Furthermore, the out-of-plane polarization enables the 3R WSe2 heterojunction region to achieve an ultrafast intrinsic photoresponse time of approximately 3 ps. The ultrafast response time remains consistent across varying detection powers, demonstrating environmental stability and highlighting the potential in optoelectronic applications. Our study presents an effective strategy for enhancing the response time of photodetectors.
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Affiliation(s)
- Guixian Liu
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Yufan Wang
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Zhoujuan Xu
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Zhouxiaosong Zeng
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Lanyu Huang
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Cuihuan Ge
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
| | - Xiao Wang
- Key Laboratory for Micro-Nano Physics and Technology of Hunan Province, College of Materials Science and Engineering, School of Physics and Electronics, Hunan University, Changsha, 410082, China
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6
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Chen Z, Zhao X, Bengel C, Liu F, Li K, Menzel S, Du N. Assessment of functional performance in self-rectifying passive crossbar arrays utilizing sneak path current. Sci Rep 2024; 14:24682. [PMID: 39433831 PMCID: PMC11494113 DOI: 10.1038/s41598-024-74667-z] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/12/2023] [Accepted: 09/27/2024] [Indexed: 10/23/2024] Open
Abstract
Self-rectifying memristive devices have emerged as promising contenders for low-power in-memory computing, presenting numerous advantages. However, characterizing the functional behavior of passive crossbar arrays incorporating these devices remains challenging due to sophisticated parasitic currents stemming from rich memristive dynamic behavior. Conventional methods using read margin assessments to evaluate functional behavior in passive crossbars are hindered by the voltage divider effect from the pull-up resistor. In this study, we propose a novel performance metric, Δ SC, harnessing sneak path currents to assess functional behavior. Through the application of a pair of negative rectification factors,RF n, L andRF n, H , we comprehensively delineate dynamic rectification behavior in both positive and negative bias regimes, as well as in low-resistance state and high-resistance state, deviating from conventional metrics such as on/off ratios, nonlinearity, and rectifying factors. Notably, Δ SC provides a quantitative evaluation of the interaction between sneak path currents and read margin, demonstrating its efficacy and addressing a pivotal research gap in the field. For instance, employing self-rectifying BiFeO3 memristive cells featuringRF n, L = 1.22E3 andRF n, H = 9.27, we showcase the successful functional performance of a passive crossbar array, achieving Δ SC < 2.19E-2, while ensuring a read margin > 0.
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Affiliation(s)
- Ziang Chen
- Institute for Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 3, 07743, Jena, Germany
- Department of Quantum Detection, Leibniz Institute of Photonic Technology (IPHT), Albert-Einstein-Strasse 9, 07745, Jena, Germany
| | - Xianyue Zhao
- Institute for Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 3, 07743, Jena, Germany
- Department of Quantum Detection, Leibniz Institute of Photonic Technology (IPHT), Albert-Einstein-Strasse 9, 07745, Jena, Germany
| | - Christopher Bengel
- Institute for Electronic Materials 2, RWTH Aachen University, Sommerfeldstrasse 18/24, 52074, Aachen, Germany
| | - Feng Liu
- Peter Grünberg Institut (PGI-7), Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Strasse, 52428, Jülich, Germany
| | - Kefeng Li
- Institute for Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 3, 07743, Jena, Germany
- Department of Quantum Detection, Leibniz Institute of Photonic Technology (IPHT), Albert-Einstein-Strasse 9, 07745, Jena, Germany
| | - Stephan Menzel
- Peter Grünberg Institut (PGI-7), Forschungszentrum Juelich GmbH, Wilhelm-Johnen-Strasse, 52428, Jülich, Germany
| | - Nan Du
- Institute for Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 3, 07743, Jena, Germany.
- Department of Quantum Detection, Leibniz Institute of Photonic Technology (IPHT), Albert-Einstein-Strasse 9, 07745, Jena, Germany.
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7
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Gao P, Duan M, Yang G, Zhang W, Jia C. Ultralow Energy Consumption and Fast Neuromorphic Computing Based on La 0.1Bi 0.9FeO 3 Ferroelectric Tunnel Junctions. NANO LETTERS 2024; 24:10767-10775. [PMID: 39172999 DOI: 10.1021/acs.nanolett.4c01924] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/24/2024]
Abstract
Low-power and fast artificial neural network devices represent the direction in developing analogue neural networks. Here, an ultralow power consumption (0.8 fJ) and rapid (100 ns) La0.1Bi0.9FeO3/La0.7Sr0.3MnO3 ferroelectric tunnel junction artificial synapse has been developed to emulate the biological neural networks. The visual memory and forgetting functionalities have been emulated based on long-term potentiation and depression with good linearity. Moreover, with a single device, logical operations of "AND" and "OR" are implemented, and an artificial neural network was constructed with a recognition accuracy of 96%. Especially for noisy data sets, the recognition speed is faster after preprocessing by the device in the present work. This sets the stage for highly reliable and repeatable unsupervised learning.
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Affiliation(s)
- Pan Gao
- Henan Key Laboratory of Quantum Materials and Quantum Energy, School of Quantum Information Future Technology, Henan University, Kaifeng 475004, China
| | - Mengyuan Duan
- Henan Key Laboratory of Quantum Materials and Quantum Energy, School of Quantum Information Future Technology, Henan University, Kaifeng 475004, China
| | - Guanghong Yang
- Key Lab for Special Functional Materials of Ministry of Education, School of Materials, Henan University, Kaifeng 475004, P. R. China
| | - Weifeng Zhang
- Henan Key Laboratory of Quantum Materials and Quantum Energy, School of Quantum Information Future Technology, Henan University, Kaifeng 475004, China
- Institute of Quantum Materials and Physics, Henan Academy of Sciences, Zhengzhou 450046, China
| | - Caihong Jia
- Henan Key Laboratory of Quantum Materials and Quantum Energy, School of Quantum Information Future Technology, Henan University, Kaifeng 475004, China
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Jayakrishnan AR, Kim JS, Hellenbrand M, Marques LS, MacManus-Driscoll JL, Silva JPB. Growth of emergent simple pseudo-binary ferroelectrics and their potential in neuromorphic computing devices. MATERIALS HORIZONS 2024; 11:2355-2371. [PMID: 38477152 PMCID: PMC11104485 DOI: 10.1039/d4mh00153b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/09/2024] [Accepted: 02/27/2024] [Indexed: 03/14/2024]
Abstract
Ferroelectric memory devices such as ferroelectric memristors, ferroelectric tunnel junctions, and field-effect transistors are considered among the most promising candidates for neuromorphic computing devices. The promise arises from their defect-independent switching mechanism, low energy consumption and high power efficiency, and important properties being aimed for are reliable switching at high speed, excellent endurance, retention, and compatibility with complementary metal-oxide-semiconductor (CMOS) technology. Binary or doped binary materials have emerged over conventional complex-composition ferroelectrics as an optimum solution, particularly in terms of CMOS compatibility. The current state-of-the-art route to achieving superlative ferroelectric performance of binary oxides is to induce ferroelectricity at the nanoscale, e.g., in ultra-thin films of doped HfO2, ZrO2, Zn1-xMgxO, Al-xScxN, and Bi1-xSmxO3. This short review article focuses on the materials science of emerging new ferroelectric materials, including their different properties such as remanent polarization, coercive field, endurance, etc. The potential of these materials is discussed for neuromorphic applications.
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Affiliation(s)
- Ampattu R Jayakrishnan
- Physics Center of Minho and Porto Universities (CF-UM-UP), University of Minho, Campus de Gualtar, 4710-057 Braga, Portugal.
- Laboratory of Physics for Materials and Emergent Technologies, LapMET, University of Minho, 4710-057 Braga, Portugal
| | - Ji S Kim
- Dept. of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Rd., Cambridge, CB3 OFS, UK.
| | - Markus Hellenbrand
- Dept. of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Rd., Cambridge, CB3 OFS, UK.
| | - Luís S Marques
- Physics Center of Minho and Porto Universities (CF-UM-UP), University of Minho, Campus de Gualtar, 4710-057 Braga, Portugal.
- Laboratory of Physics for Materials and Emergent Technologies, LapMET, University of Minho, 4710-057 Braga, Portugal
| | - Judith L MacManus-Driscoll
- Dept. of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Rd., Cambridge, CB3 OFS, UK.
| | - José P B Silva
- Physics Center of Minho and Porto Universities (CF-UM-UP), University of Minho, Campus de Gualtar, 4710-057 Braga, Portugal.
- Laboratory of Physics for Materials and Emergent Technologies, LapMET, University of Minho, 4710-057 Braga, Portugal
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