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Belhadi J, Gabor U, Uršič H, Daneu N, Kim J, Tian Z, Koster G, Martin LW, Spreitzer M. Growth mode and strain effect on relaxor ferroelectric domains in epitaxial 0.67Pb(Mg 1/3Nb 2/3)O 3–0.33PbTiO 3/SrRuO 3 heterostructures. RSC Adv 2021; 11:1222-1232. [PMID: 35424096 PMCID: PMC8693390 DOI: 10.1039/d0ra10107a] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/30/2020] [Accepted: 12/21/2020] [Indexed: 11/23/2022] Open
Abstract
Controlling the growth of complex relaxor ferroelectric thin films and understanding the relationship between biaxial strain–structural domain characteristics are desirable for designing materials with a high electromechanical response. For this purpose, epitaxial thin films free of extended defects and secondary phases are urgently needed. Here, we used optimized growth parameters and target compositions to obtain epitaxial (40–45 nm) 0.67Pb(Mg1/3Nb2/3)O3–0.33PbTiO3/(20 nm) SrRuO3 (PMN–33PT/SRO) heterostructures using pulsed-laser deposition (PLD) on singly terminated SrTiO3 (STO) and ReScO3 (RSO) substrates with Re = Dy, Tb, Gd, Sm, and Nd. In situ reflection high-energy electron diffraction (RHEED) and high-resolution X-ray diffraction (HR-XRD) analysis confirmed high-quality and single-phase thin films with smooth 2D surfaces. High-resolution scanning transmission electron microscopy (HR-STEM) revealed sharp interfaces and homogeneous strain further confirming the epitaxial cube-on-cube growth mode of the PMN–33PT/SRO heterostructures. The combined XRD reciprocal space maps (RSMs) and piezoresponse force microscopy (PFM) analysis revealed that the domain structure of the PMN–33PT heterostructures is sensitive to the applied compressive strain. From the RSM patterns, an evolution from a butterfly-shaped diffraction pattern for mildly strained PMN–33PT layers, which is evidence of stabilization of relaxor domains, to disc-shaped diffraction patterns for high compressive strains with a highly distorted tetragonal structure, is observed. The PFM amplitude and phase of the PMN–33PT thin films confirmed the relaxor-like for a strain state below ∼1.13%, while for higher compressive strain (∼1.9%) the irregularly shaped and poled ferroelectric domains were observed. Interestingly, the PFM phase hysteresis loops of the PMN–33PT heterostructures grown on the SSO substrates (strain state of ∼0.8%) exhibited an enhanced coercive field which is about two times larger than that of the thin films grown on GSO and NSO substrates. The obtained results show that epitaxial strain engineering could serve as an effective approach for tailoring and enhancing the functional properties in relaxor ferroelectrics. Strain engineering in epitaxial PMN–33PT films revealed an evolution from a butterfly-shaped diffraction for mildly strained films, evidencing the stabilization of relaxor domains, to disc-shaped diffraction patterns for high compressive strains.![]()
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Affiliation(s)
- Jamal Belhadi
- Advanced Materials Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
| | - Urška Gabor
- Advanced Materials Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
| | - Hana Uršič
- Electronic Ceramics Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
| | - Nina Daneu
- Advanced Materials Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
| | - Jieun Kim
- Department of Materials Science and Engineering
- University of California
- Berkeley
- USA
| | - Zishen Tian
- Department of Materials Science and Engineering
- University of California
- Berkeley
- USA
| | - Gertjan Koster
- Advanced Materials Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
- MESA+ Institute for Nanotechnology
| | - Lane W. Martin
- Department of Materials Science and Engineering
- University of California
- Berkeley
- USA
| | - Matjaž Spreitzer
- Advanced Materials Department
- Jožef Stefan Institute
- Ljubljana
- Slovenia
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Kim J, Takenaka H, Qi Y, Damodaran AR, Fernandez A, Gao R, McCarter MR, Saremi S, Chung L, Rappe AM, Martin LW. Epitaxial Strain Control of Relaxor Ferroelectric Phase Evolution. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2019; 31:e1901060. [PMID: 30968488 DOI: 10.1002/adma.201901060] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/15/2019] [Revised: 03/15/2019] [Indexed: 06/09/2023]
Abstract
Understanding and ultimately controlling the large electromechanical effects in relaxor ferroelectrics requires intimate knowledge of how the local-polar order evolves under applied stimuli. Here, the biaxial-strain-induced evolution of and correlations between polar structures and properties in epitaxial films of the prototypical relaxor ferroelectric 0.68PbMg1/3 Nb2/3 O3 -0.32PbTiO3 are investigated. X-ray diffuse-scattering studies reveal an evolution from a butterfly- to disc-shaped pattern and an increase in the correlation-length from ≈8 to ≈25 nm with increasing compressive strain. Molecular-dynamics simulations reveal the origin of the changes in the diffuse-scattering patterns and that strain induces polarization rotation and the merging of the polar order. As the magnitude of the strain is increased, relaxor behavior is gradually suppressed but is not fully quenched. Analysis of the dynamic evolution of dipole alignment in the simulations reveals that, while, for most unit-cell chemistries and configurations, strain drives a tendency toward more ferroelectric-like order, there are certain unit cells that become more disordered under strain, resulting in stronger competition between ordered and disordered regions and enhanced overall susceptibilities. Ultimately, this implies that deterministic creation of specific local chemical configurations could be an effective way to enhance relaxor performance.
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Affiliation(s)
- Jieun Kim
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Hiroyuki Takenaka
- Department of Physics, University of Nebraska, Lincoln, Lincoln, NE, 68588, USA
| | - Yubo Qi
- Department of Chemistry, University of Pennsylvania, Philadelphia, PA, 19104-6323, USA
| | - Anoop R Damodaran
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Abel Fernandez
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Ran Gao
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Margaret R McCarter
- Department of Physics, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Sahar Saremi
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Linh Chung
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
| | - Andrew M Rappe
- Department of Chemistry, University of Pennsylvania, Philadelphia, PA, 19104-6323, USA
| | - Lane W Martin
- Department of Materials Science and Engineering, University of California, Berkeley, Berkeley, CA, 94720, USA
- Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA
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