Initial pseudo-steady state & asymptotic KPZ universality in semiconductor on polymer deposition

Competition between Kardar-Parisi-Zhang and Berezinskii-Kosterlitz-Thouless kinetic roughening on (001) singular surface during steady crystal growth

Kinetic roughening of the (001) singular surface during steady crystal growth is studied on the basis of a lattice model using the Monte Carlo method. At a sufficiently low temperature, there are known to be two kinetic roughening points as the driving force for crystal growth Δ μ increases. At a low driving force Δ μ KPZ ( 001 ) , there is the Karder-Parisi-Zhang (KPZ) roughening transition point. On the KPZ rough surface, elementary steps around islands are well defined though the surface is thermodynamically rough, with a roughness exponent α consistent with the KPZ universal value of 0.3869. Island-on-island structures were found to be crucial in forming the KPZ rough surface. To understand the effects of the atomical roughness of the (001) surface and the interplay of steps on long-period undulations on this surface, the dependence on the temperature T and driving force for crystal growth Δ μ of surface quantities is investigated. At higher temperatures, additional Berezinskii-Kosterlitz-Thouless (BKT) rough and re-entrant KPZ regions are found for large Δ μ , where the crystal surface grows adhesively. A T- Δ μ kinetic roughening diagram is also presented.

Dimensional crossover in Kardar-Parisi-Zhang growth

Two-dimensional (2D) Kardar-Parisi-Zhang (KPZ) growth is usually investigated on substrates of lateral sizes L_{x}=L_{y}, so that L_{x} and the correlation length (ξ) are the only relevant lengths determining the scaling behavior. However, in cylindrical geometry, as well as in flat rectangular substrates L_{x}≠L_{y} and, thus, the surfaces can become correlated in a single direction, when ξ∼L_{x}≪L_{y}. From extensive simulations of several KPZ models, we demonstrate that this yields a dimensional crossover in their dynamics, with the roughness scaling as W∼t^{β_{2D}} for t≪t_{c} and W∼t^{β_{1D}} for t≫t_{c}, where t_{c}∼L_{x}^{1/z_{2D}}. The height distributions (HDs) also cross over from the 2D flat (cylindrical) HD to the asymptotic Tracy-Widom Gaussian orthogonal ensemble (Gaussian unitary ensemble) distribution. Moreover, 2D to one-dimensional (1D) crossovers are found also in the asymptotic growth velocity and in the steady-state regime of flat systems, where a family of universal HDs exists, interpolating between the 2D and 1D ones as L_{y}/L_{x} increases. Importantly, the crossover scalings are fully determined and indicate a possible way to solve 2D KPZ models.

Kardar-Parisi-Zhang roughening associated with nucleation-limited steady crystal growth

The roughness of crystal surfaces and the shape of crystals play important roles in multiscale phenomena. For example, the roughness of the crystal surface affects the frictional and optical properties of materials such as ice or silica. Theoretical studies on crystal surfaces based on the symmetry principle proposed that the growing surfaces of crystal growth could be classified in the universal class of Kardar-Parisi-Zhang (KPZ), but experiments rarely observe KPZ properties. To fill this the gap, extensive numerical calculations of the crystal growth rates and the surface roughness (surface width) have been performed for a nanoscale lattice model using the Monte Carlo method. The results indicate that a (001) surface is smooth within the single nucleation growth region. In contrast, the same surface is atomically smooth but thermodynamically rough in the poly-nucleation growth region in conjunction with a KPZ roughness exponent. Inclined surfaces are known to become Berezinskii-Kosterlitz-Thouless (BKT) rough surfaces both at and near equilibrium. The two types of steps associated with the (001) and (111) terraces were found to induce KPZ surface roughness, while the interplay between steps and multilayered islands promoted BKT roughness.

One-point height fluctuations and two-point correlators of (2+1) cylindrical KPZ systems

While the one-point height distributions (HDs) and two-point covariances of (2+1) Kardar-Parisi-Zhang (KPZ) systems have been investigated in several recent works for flat and spherical geometries, for the cylindrical one the HD was analyzed for few models and nothing is known about the spatial and temporal covariances. Here, we report results for these quantities, obtained from extensive numerical simulations of discrete KPZ models, for three different setups yielding cylindrical growth. Beyond demonstrating the universality of the HD and covariances, our results reveal other interesting features of this geometry. For example, the spatial covariances measured along the longitudinal and azimuthal directions are different, with the former being quite similar to the curve for flat (2+1) KPZ systems, while the latter resembles the Airy_{2} covariance of circular (1+1) KPZ interfaces. We also argue (and present numerical evidence) that, in general, the rescaled temporal covariance A(t/t_{0}) decays asymptotically as A(x)∼x^{-λ[over ¯]} with an exponent λ[over ¯]=β+d^{*}/z, where d^{*} is the number of interface sides kept fixed during the growth (being d^{*}=1 for the systems analyzed here). Overall, these results complete the picture of the main statistics for the (2+1) KPZ class.

Accessibility of the surface fractal dimension during film growth

Fractal properties on self-affine surfaces of films growing under nonequilibrium conditions are important in understanding the corresponding universality class. However, measurement of the surface fractal dimension has been intensively investigated and is still very problematic. In this work, we report the behavior of the effective fractal dimension in the context of film growth involving lattice models believed to belong to the Kardar-Parisi-Zhang (KPZ) universality class. Our results, which are presented for growth in a d-dimensional substrate (d=1,2) and use the three-point sinuosity (TPS) method, show universal scaling of the measure M, which is defined in terms of discretization of the Laplacian operator applied to the height of the film surface, M=t^{δ}g[Θ], where t is the time, g[Θ] is a scale function, δ=2β, Θ≡τt^{-1/z}, β, and z are the KPZ growth and dynamical exponents, respectively, and τ is a spatial scale length used to compute M. Importantly, we show that the effective fractal dimensions are consistent with the expected KPZ dimensions for d=1,2, if Θ≲0.3, which include a thin film regime for the extraction of the fractal dimension. This establishes the scale limits in which the TPS method can be used to accurately extract effective fractal dimensions that are consistent with those expected for the corresponding universality class. As a consequence, for the steady state, which is inaccessible to experimentalists studying film growth, the TPS method provided effective fractal dimension consistent with the KPZ ones for almost all possible τ, i.e., 1≲τ<L/2, where L is the lateral size of the substrate on which the deposit is grown. In the growth of thin films, the true fractal dimension can be observed in a narrow range of τ, the upper limit of which is of the same order of magnitude as the correlation length of the surface, indicating the limits of self-affinity of a surface in an experimentally accessible regime. This upper limit was comparatively lower for the Higuchi method or the height-difference correlation function. Scaling corrections for the measure M and the height-difference correlation function are studied analytically and compared for the Edwards-Wilkinson class at d=1, yielding similar accuracy for both methods. Importantly, we extend our discussion to a model representing diffusion-dominated growth of films and find that the TPS method achieves the corresponding fractal dimension only at steady state and in a narrow range of the scale length, compared to that found for the KPZ class.

Kardar-Parisi-Zhang universality class in (d+1)-dimensions

The determination of the exact exponents of the KPZ class in any substrate dimension d is one of the most important open issues in Statistical Physics. Based on the behavior of the dimensional variation of some exact exponent differences for other growth equations, I find here that the KPZ growth exponents (related to the temporal scaling of the fluctuations) are given by β_{d}=7/8d+13. These exponents present an excellent agreement with the most accurate estimates for them in the literature. Moreover, they are confirmed here through extensive Monte Carlo simulations of discrete growth models and real-space renormalization group (RG) calculations for directed polymers in random media (DPRM), up to d=15. The left-tail exponents of the probability density functions for the DPRM energy provide another striking verification of the analytical result above.

Height distributions in interface growth: The role of the averaging process

Height distributions (HDs) are key quantities to uncover universality and geometry-dependence in evolving interfaces. To quantitatively characterize HDs, one uses adimensional ratios of their first central moments (m_{n}) or cumulants (κ_{n}), especially the skewness S and kurtosis K, whose accurate estimate demands an averaging over all L^{d} points of the height profile at a given time, in translation-invariant interfaces, and over N independent samples. One way of doing this is by calculating m_{n}(t) [or κ_{n}(t)] for each sample and then carrying out an average of them for the N interfaces, with S and K being calculated only at the end. Another approach consists in directly calculating the ratios for each interface and, then, averaging the N values. It turns out, however, that S and K for the growth regime HDs display strong finite-size and -time effects when estimated from these "interface statistics," as already observed in some previous works and clearly shown here, through extensive simulations of several discrete growth models belonging to the EW and KPZ classes on one- and two-dimensional substrates of sizes L=const. and L∼t. Importantly, I demonstrate that with "1-point statistics," i.e., by calculating m_{n}(t) [or κ_{n}(t)] once for all NL^{d} heights together, these corrections become very weak, so that S and K attain values very close to the asymptotic ones already at short times and for small L's. However, I find that this "1-point" (1-pt) approach fails in uncovering the universality of the HDs in the steady-state regime (SSR) of systems whose average height, h[over ¯], is a fluctuating variable. In fact, as demonstrated here, in this regime the 1-pt height evolves as h(t)=h[over ¯](t)+s_{λ}A^{1/2}L^{α}ζ+⋯-where P(ζ) is the underlying SSR HD-and the fluctuations in h[over ¯] yield S_{1-pt}∼t^{-1/2} and K_{1-pt}∼t^{-1}. Nonetheless, by analyzing P(h-h[over ¯]), the cumulants of P(ζ) can be accurately determined. I also show that different, but universal, asymptotic values for S and K (related, so, to different HDs) can be found from the "interface statistics" in the SSR. This reveals the importance of employing the various complementary approaches to reliably determine the universality class of a given system through its different HDs.

Geometry dependence in linear interface growth

The effect of geometry in the statistics of nonlinear universality classes for interface growth has been widely investigated in recent years, and it is well known to yield a split of them into subclasses. In this work, we investigate this for the linear classes of Edwards-Wilkinson and of Mullins-Herring in one and two dimensions. From comparison of analytical results with extensive numerical simulations of several discrete models belonging to these classes, as well as numerical integrations of the growth equations on substrates of fixed size (flat geometry) or expanding linearly in time (radial geometry), we verify that the height distributions (HDs) and the spatial and the temporal covariances are universal but geometry-dependent. In fact, the HDs are always Gaussian, and, when defined in terms of the so-called "KPZ ansatz" [h≃v_{∞}t+(Γt)^{β}χ], their probability density functions P(χ) have mean null, so that all their cumulants are null, except by their variances, which assume different values in the flat and radial cases. The shape of the (rescaled) covariance curves is analyzed in detail and compared with some existing analytical results for them. Overall, these results demonstrate that the splitting of such university classes is quite general, being not restricted to the nonlinear ones.

From cellular automata to growth dynamics: The Kardar-Parisi-Zhang universality class

We demonstrate that in the continuous limit the etching mechanism yields the Kardar-Parisi-Zhang (KPZ) equation in a (d+1)-dimensional space. We show that the parameters ν, associated with the surface tension, and λ, associated with the nonlinear term of the KPZ equation, are not phenomenological, but rather they stem from a new probability distribution function. The Galilean invariance is recovered independently of d, and we illustrate this via very precise numerical simulations. We obtain firsthand the coupling parameter as a function of the probabilities. In addition, we strengthen the argument that there is no upper critical limit for the KPZ equation.

Geometric and chemical nonuniformity may induce the stability of more than one wetting state in the same hydrophobic surface

It is well established that roughness and chemistry play a crucial role in the wetting properties of a substrate. Yet, few studies have analyzed systematically the effect of the nonuniformity in the distribution of texture and surface tension of substrates on its wetting properties. In this work we investigate this issue theoretically and numerically. We propose a continuous model that takes into account the total energy required to create interfaces of a droplet in two possible wetting states: Cassie-Baxter (CB) with air pockets trapped underneath the droplet; and the other characterized by the homogeneous wetting of the surface, called the Wenzel (W) state. To introduce geometrical nonregularity we suppose that pillar heights and pillar distances are Gaussian distributed instead of having a constant value. Similarly, we suppose a heterogeneous distribution of Young's angle on the surface to take into account the chemical nonuniformity. This allows to vary the "amount" of disorder by changing the variance of the distribution. We first solve this model analytically and then we also propose a numerical version of it, which can be applied to study any type of disorder. In both versions, we employ the same physical idea: The energies of both states are minimized to predict the thermodynamic wetting state of the droplet for a given volume and surface texture. We find that the main effect of disorder is to induce the stability of both wetting states on the same substrate. In terms of the influence of the disorder on the contact angle of the droplet, we find that it is negligible for the chemical disorder and for pillar-distance disorder. However, in the case of pillar-height disorder, it is observed that the average contact angle of the droplet increases with the amount of disorder. We end the paper investigating how the region of stability of both wetting states behaves when the droplet volume changes.

Kardar-Parisi-Zhang growth on one-dimensional decreasing substrates

Recent experimental works on one-dimensional (1D) circular Kardar-Parisi-Zhang (KPZ) systems whose radii decrease in time have reported controversial conclusions about the statistics of their interfaces. Motivated by this, here we investigate several one-dimensional KPZ models on substrates whose size changes in time as L(t)=L_{0}+ωt, focusing on the case ω<0. From extensive numerical simulations, we show that for L_{0}≫1 there exists a transient regime in which the statistics is consistent with that of flat KPZ systems (the ω=0 case), for both ω<0 and ω>0. Actually, for a given model, L_{0} and |ω|, we observe that a difference between ingrowing (ω<0) and outgrowing (ω>0) systems arises only at long times (t∼t_{c}=L_{0}/|ω|), when the expanding surfaces cross over to the statistics of curved KPZ systems, whereas the shrinking ones become completely correlated. A generalization of the Family-Vicsek scaling for the roughness of ingrowing interfaces is presented. Our results demonstrate that a transient flat statistics is a general feature of systems starting with large initial sizes, regardless of their curvature. This is consistent with their recent observation in ingrowing turbulent liquid crystal interfaces, but it is in contrast with the apparent observation of curved statistics in colloidal deposition at the edge of evaporating drops. A possible explanation for this last result, as a consequence of the very small number of monolayers analyzed in this experiment, is given. This is illustrated in a competitive growth model presenting a few-monolayer transient and an asymptotic behavior consistent, respectively, with the curved and flat statistics.