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Wang X, Wei M, Li X, Shao S, Ren Y, Xu W, Li M, Liu W, Liu X, Zhao J. Large-Area Flexible Printed Thin-Film Transistors with Semiconducting Single-Walled Carbon Nanotubes for NO 2 Sensors. ACS APPLIED MATERIALS & INTERFACES 2020; 12:51797-51807. [PMID: 33141551 DOI: 10.1021/acsami.0c13824] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Development of large-area, low-cost, low-voltage, low-power consumption, flexible high-performance printed carbon nanotube thin-film transistors (TFTs) is helpful to promote their future applications in sensors and biosensors, wearable electronics, and the Internet of things. In this work, low-voltage, flexible printed carbon nanotube TFTs with a large-area and low-cost fabrication process were successfully constructed using ultrathin (∼3.6 nm) AlOx thin films formed by plasma oxidation of aluminum as dielectrics and screen-printed silver electrodes as contact electrodes. The as-prepared bottom-gate/bottom-contact carbon nanotube TFTs exhibit a low leakage current (∼10-10 A), a high charge carrier mobility (up to 9.9 cm2 V-1 s-1), high on/off ratios (higher than 105), and small subthreshold swings (80-120 mV/dec) at low operation voltages (from -1.5 to 1 V). At the same time, printed carbon nanotube TFTs showed a high response (ΔR/R = 99.6%) to NO2 gas even at 16 ppm with a faster response and recovery speed (∼8 s, exposure to 0.5 ppm NO2), a lower detection limit (0.069 ppm NO2), and a low power consumption (0.86 μW, exposure to 16 ppm NO2) at a gate voltage of 0.2 V at room temperature. Moreover, the printed carbon nanotube devices exhibited excellent mechanical flexibility and bias stress stability after 12,000 bending cycles at a radius of 5 mm and a bias stress test for 7200 s at a gate voltage of ±1 V, which originated from the ultrathin and compact AlOx dielectric and the super adhesion force between screen-printed silver electrodes and polyethylene terephthalate substrates.
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Affiliation(s)
- Xin Wang
- School of Materials Science and Engineering, Zhengzhou University, No. 100 Science Avenue, Zhengzhou, Henan 450001, P. R. China
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Miaomiao Wei
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Xiaoqian Li
- School of Materials Science and Engineering, Zhengzhou University, No. 100 Science Avenue, Zhengzhou, Henan 450001, P. R. China
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Shuangshuang Shao
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Yunfei Ren
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Wenjing Xu
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Min Li
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
| | - Wentao Liu
- School of Materials Science and Engineering, Zhengzhou University, No. 100 Science Avenue, Zhengzhou, Henan 450001, P. R. China
| | - Xuying Liu
- School of Materials Science and Engineering, Zhengzhou University, No. 100 Science Avenue, Zhengzhou, Henan 450001, P. R. China
| | - Jianwen Zhao
- Printable Electronics Research Centre, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, No. 398 Ruoshui Road, SEID, Suzhou Industrial Park, Suzhou, Jiangsu Province 215123, PR China
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Abstract
In this study, contact properties of platinum/gold (Pt/Au) on the surface of hydrogen-terminated single crystal diamond (H-SCD) were studied with several treatment conditions. The electrodes of Pt (20 nm)/Au (100 nm) were deposited on H-SCD surface by electron beam evaporation technique. Then, the specific contact resistance (ρc) of the as-fabricated sample was measured by the circular transmission line model, which showed good ohmic properties with the value of 5.65 × 10−4 Ω·cm2. To identify the thermal stability of Pt/Au/H-SCD, the sample was annealed in hydrogen ambient from 200 to 700 °C for 20 min at each temperature. As the temperature increased, ρc demonstrated better thermal stability. In addition, the barrier height was evaluated to be −0.67 ± 0.12 eV by X-ray photoelectron spectroscopy (XPS) technique.
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