Superior Photo-thermionic electron Emission from Illuminated Phosphorene Surface

Straintronics in phosphorene via tensile vs shear strains and their combinations for manipulating the band gap

We study the effects of the uniaxial tensile strain and shear deformation as well as their combinations on the electronic properties of single-layer black phosphorene. The evolutions of the strain-dependent band gap are obtained using the numerical calculations within the tight-binding (TB) model as well as the first-principles (DFT) simulations and compared with previous findings. The TB-model-based findings show that the band gap of the strain-free phosphorene agrees with the experimental value and linearly depends on both stretching and shearing: increases (decreases) as the stretching increases (decreases), whereas gradually decreases with increasing the shear. A linear dependence is less or more similar as compared to that obtained from the ab initio simulations for shear strain, however disagrees with a non-monotonic behaviour from the DFT-based calculations for tensile strain. Possible reasons for the discrepancy are discussed. In case of a combined deformation, when both strain types (tensile/compression + shear) are loaded simultaneously, their mutual influence extends the realizable band gap range: from zero up to the values respective to the wide-band-gap semiconductors. At a switched-on combined strain, the semiconductor-semimetal phase transition in the phosphorene is reachable at a weaker (strictly non-destructive) strain, which contributes to progress in fundamental and breakthroughs.

Electronic work function modulation of phosphorene by thermal oxidation

In this study, we evaluate the variation of the work function of phosphorene during thermal oxidation at different temperatures. The ultraviolet photoelectron spectroscopy results show an N-shaped behaviour that is explained by the oxidation process and the dangling-to-interstitial conversion at elevated temperatures. The exfoliation degree and x-ray photoelectron spectroscopy confirm the formation of native oxides in the top-most layer that passivates the material. Ex-situ XPS reveals the full oxidation of monolayers at temperatures higher than 140 °C, but few-layer phosphorene withstands the thermal oxidation even up to 200 °C with slight modifications of the A 2 g/A 1 g and A 2 g/B 2g vibrational mode ratios and a weak fluorescence in the Raman spectra of the heat-treated samples.