Light Scattering from Rough Silver Surfaces: Modeling of Absorption Loss Measurements

We consider two series of experimental setups of multilayered Ag/ZnO thin films with varying surface morphologies given by atomic force microscopy images. The absorption loss under diffuse scattering is studied theoretically by applying a combination of the scattering matrix approach with diffraction theory for randomly nanotextured interfaces. Our modeling is in excellent agreement with the respective measurements. The theoretical approach is applicable to a wide range of wavelengths, surface morphologies, and materials for both measured and computed rough surface morphologies.

Near-field nanoimprinting using colloidal monolayers

We experimentally and theoretically explore near-field nanopatterning obtained by irradiation of hexagonal monolayers of micron-sized polystyrene spheres on photosensitive Ge(2)Sb(5)Te(5) (GST) films. The imprinted patterns are strongly sensitive to the illumination conditions, as well as the size of the spheres and the orientation of the monolayer, which we change to demonstrate control over the resulting structures. We show that the presence of multiple scattering effects cannot be neglected to describe the resulting pattern. The experimental patterns imprinted are shown to be robust to small displacements and structural defects of the monolayer. Our method enables the design and experimental verification of patterns with multiple focii per particle and complex shapes, which can be directly implemented for large scale fabrication on different substrates.

Nanostructuring thin polymer films with optical near fields

In the present work, we report on the application of optical near fields to nanostructuring of poly(trimethylene terephthalate) (PTT) thin films. By exposure to a single ultraviolet nanosecond laser pulse, the spatial intensity modulation of the near-field distribution created by a silica microsphere is imprinted into the films. Setting different angles of incidence of the laser, elliptical or circular periodic ring patterns can be produced with periods as small as half the laser wavelength used. These highly complex patterns show optical and topographical contrast and can be characterized by optical microscopy (OM) and atomic force microscopy (AFM). We demonstrate the key role of the laser wavelength and coherence length in achieving smooth, extended patterns in PTT by using excimer laser (193 nm) and Nd:YAG laser (266 nm) pulses. Reference experiments performed in Ge2Sb2Te5 (GST) demonstrate that nanopatterning in PTT is triggered by ablation as opposed to GST, in which nanopatterning originates from laser-induced phase change, accompanied by a small topographical contrast. The experiments presented in this work demonstrate the suitability of optical near fields for structuring polymer films, opening up new possibilities for nanopatterning and paving the way for potential applications where optical near fields and polymer nanostructures are involved.

Quantitative imaging of the optical near field

When exposing small particles on a substrate to a light plane wave, the scattered optical near field is spatially modulated and highly complex. We show, for the particular case of dielectric microspheres, that it is possible to image these optical near-field distributions in a quantitative way. By placing a single microsphere on a thin film of the photosensitive phase change material Ge(2)Sb(5)Te(5) and exposing it to a single short laser pulse, the spatial intensity modulation of the near field is imprinted into the film as a pattern of different material phases. The resulting patterns are investigated by using optical as well as high-resolution scanning electron microscopy. Quantitative information on the local optical near field at each location is obtained by calibrating the material response to pulsed laser irradiation. We discuss the influence of polarization and angle of incidence of the laser beam as well as particle size on the field distribution. The experimental results are in good quantitative agreement with a model based on a rigorous solution of Maxwell's equations. Our results have potential application to near-field optical lithography and experimental determination of near fields in complex nanostructures.