Ion transport and softening in a polymerized ionic liquid

Effects of Local Order Parameter Dependent Transport Coefficient in Diblock Copolymers Under Applied Electric Fields

We present an approach for constructing thermodynamically consistent time-dependent models relevant to thin films of diblock copolymers in applied electric fields. The approach is based on the principles of linear irreversible thermodynamics and in this work, it is applied to study the effects of electric  fields on thin  films of incompressible diblock copolymers. Enforcement of local incompressibility constraint at all times leads to a local order parameter dependent transport coefficient in the model for the diblock copolymers. The dependence of transport coefficient on the local order parameter is used to relate it with diffusion constant of Rouse chains and leads to sensitivity of the model to initial conditions. Also, transient behavior is found to be a affected when compared with an ad hoc model assuming a constant transport coefficient. Numerical results such as electric  field induced alignment of lamellae domains due to the  field are found to be in qualitative agreements with experiments.This approach opens up a systematic way of developing kinetic models for simulating effects of electrolytes added to thin  films containing diblock copolymers in the presence of applied electric  fields.

Solvent Effect in Imidazole-Based Poly(Ionic liquid) Membranes: Energy Storage and Sensing

Polymerized ionic liquids (PILs) are interesting new materials in sustainable technologies for energy storage and for gas sensor devices, and they provide high ion conductivity as solid polymer electrolytes in batteries. We introduce here the effect of polar protic (aqueous) and polar aprotic (propylene carbonate, PC) electrolytes, with the same concentration of lithium bis(trifluoromethane) sulfonimide (LiTFSI) on hydrophobic PIL films. Cyclic voltammetry, scanning ionic conductance microscopy and square wave voltammetry were performed, revealing that the PIL films had better electroactivity in the aqueous electrolyte and three times higher ion conductivity was obtained from electrochemical impedance spectroscopy measurements. Their energy storage capability was investigated with chronopotentiometric measurements, and it revealed 1.6 times higher specific capacitance in the aqueous electrolyte as well as novel sensor properties regarding the applied solvents. The PIL films were characterized with scanning electron microscopy, energy dispersive X-ray, FTIR and solid state nuclear magnetic resonance spectroscopy.

Nanoscale Resolution of Electric-field Induced Motion in Ionic Diblock Copolymer Thin Films

Understanding the responses of ionic block copolymers to applied electric fields is crucial when targeting applications in areas such as energy storage, microelectronics, and transducers. This work shows that the identity of counterions in ionic diblock copolymers substantially affects their responses to electric fields, demonstrating the importance of ionic species for materials design. In situ neutron reflectometry measurements revealed that thin films containing imidazolium based cationic diblock copolymers, tetrafluoroborate counteranions led to film contraction under applied electric fields, while bromide counteranions drove expansion under similar field strengths. Coarse-grained molecular dynamics simulations were used to develop a fundamental understanding of these responses, uncovering a nonmonotonic trend in thickness change as a function of field strength. This behavior was attributed to elastic responses of microphase separated diblock copolymer chains resulting from variations in interfacial tension of polymer-polymer interfaces due to the redistribution of counteranions in the presence of electric fields.

Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review

Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid-liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels, etc and possess complex time and voltage dependent dynamics. This necessitates time-resolved and real-space probing of these phenomena. In this review, we discuss the applications of force-sensitive voltage modulated scanning probe microscopy (SPM) for probing electrical phenomena at solid-liquid interfaces. We first describe the working principles behind electrostatic and Kelvin probe force microscopies (EFM & KPFM) at the gas-solid interface, review the state of the art in advanced KPFM methods and developments to (i) overcome limitations of classical KPFM, (ii) expand the information accessible from KPFM, and (iii) extend KPFM operation to liquid environments. We briefly discuss the theoretical framework of electrical double layer (EDL) forces and dynamics, the implications and breakdown of classical EDL models for highly charged interfaces or under high ion concentrations, and describe recent modifications of the classical EDL theory relevant for understanding nanoscale electrical measurements at the solid-liquid interface. We further review the latest achievements in mapping surface charge, dielectric constants, and electrodynamic and electrochemical processes in liquids. Finally, we outline the key challenges and opportunities that exist in the field of nanoscale electrical measurements in liquid as well as providing a roadmap for the future development of liquid KPFM.

Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

Atomic force microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnessed in several AFM imaging modes. Here, we demonstrate a cantilever-resonance-based method to quantify electrostatic forces on a probe in the probe-sample junction in the presence of a surface potential or when a bias voltage is applied to the AFM probe. We find that the electrostatic forces acting on the probe tip apex can produce signals equivalent to a few pm of surface displacement. In combination with modeling, the measurements of the force were used to access the strength of the electrical field at the probe tip apex in contact with a sample. We find an evidence that the electric field strength in the junction can reach ca. 1 V nm-1 at a bias voltage of a few volts and is limited by non-ideality of the tip-sample contact. This field is sufficiently strong to significantly influence material states and kinetic processes through charge injection, Maxwell stress, shifts of phase equilibria, and reduction of energy barriers for activated processes. Besides, the results provide a baseline for accounting for the effects of local electrostatic forces in electromechanical AFM measurements as well as offer additional means to probe ionic mobility and field-induced phenomena in solids.

Effects of counterion size and backbone rigidity on the dynamics of ionic polymer melts and glasses

Backbone rigidity, counterion size and the static dielectric constant affect the glass transition temperature, segmental relaxation time and decoupling between counterion and segmental dynamics in significant manners.

Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy

Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of atomic force microscopy (AFM) have been shown capable of detecting ∼1-3 pm-level surface displacements, an approach used in techniques such as piezoresponse force microscopy, atomic force acoustic microscopy, and ultrasonic force microscopy. Here, based on an analytical model of AFM cantilever vibrations, we demonstrate a guideline to quantify surface displacements with high accuracy by taking into account the cantilever shape at the first resonant contact mode, depending on the tip-sample contact stiffness. The approach has been experimentally verified and further developed for piezoresponse force microscopy (PFM) using well-defined ferroelectric materials. These results open up a way to accurate and precise measurements of surface displacement as well as piezoelectric constants at the pm-scale with nanometer spatial resolution and will allow avoiding erroneous data interpretations and measurement artifacts. This analysis is directly applicable to all cantilever-resonance-based scanning probe microscopy (SPM) techniques.