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Wu H, Zhu H, Zhang J, Yu J, Tang Z, Yao G, Zhao W, Wu G, Jin X. Enhanced Acetone-Sensing Performance of a Bilayer Structure Gas Sensor Composed of a ZnO Nanorod Top Layer and a ZnFe 2O 4 Nanoparticle Decorated ZnO Nanorod Bottom Layer. SENSORS (BASEL, SWITZERLAND) 2024; 24:7851. [PMID: 39686388 DOI: 10.3390/s24237851] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/31/2024] [Revised: 11/29/2024] [Accepted: 12/06/2024] [Indexed: 12/18/2024]
Abstract
In this study, we report a high-performance acetone gas sensor utilizing a bilayer structure composed of a ZnO nanorod top layer and a ZnFe2O4 nanoparticle-decorated ZnO nanorod bottom layer. ZnO nanorods were synthesized via a water-bath method, after which the ZnFe2O4 nanoparticle-decorated ZnO nanorods were prepared using a simple immersion and calcination method. SEM and TEM revealed the porous morphology of the samples and the formation of ZnO-ZnFe2O4 heterojunctions. XPS analysis demonstrated an increase in oxygen vacancy content with the introduction of ZnFe2O4 nanoparticles. Compared to pure ZnO nanorods, ZnFe2O4-decorated ZnO nanorods showed a 3.9-fold increase in response to 50 ppm acetone. Covering this layer with ZnO nanorods further increased the response by an additional 1.6 times, and simultaneously enhanced the selectivity to acetone. The top layer improves gas sensing performance by introducing heterojunctions with the bottom layer, partially blocking acetone gas at the bottom layer to facilitate a more complete reaction, and filtering ethanol interference.
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Affiliation(s)
- Hao Wu
- School of Control Science and Engineering, Dalian University of Technology, Dalian 116024, China
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
| | - Huichao Zhu
- School of Control Science and Engineering, Dalian University of Technology, Dalian 116024, China
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
| | - Jianwei Zhang
- School of Control Science and Engineering, Dalian University of Technology, Dalian 116024, China
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
| | - Jun Yu
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
- School of Biomedical Engineering, Dalian University of Technology, Dalian 116024, China
| | - Zhenan Tang
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
- School of Biomedical Engineering, Dalian University of Technology, Dalian 116024, China
| | - Guanyu Yao
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
- School of Biomedical Engineering, Dalian University of Technology, Dalian 116024, China
| | - Wenqing Zhao
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
- School of Biomedical Engineering, Dalian University of Technology, Dalian 116024, China
| | - Guohui Wu
- Key Lab of Liaoning for Integrated Circuits and Medical Electronic Systems, Dalian University of Technology, Dalian 116024, China
- School of Biomedical Engineering, Dalian University of Technology, Dalian 116024, China
| | - Xia Jin
- Department of Biomedical Engineering, School of Intelligent Medicine, China Medical University, Shenyang 110122, China
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2
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Monish M, Major SS. Mg incorporation induced microstructural evolution of reactively sputtered GaN epitaxial films to Mg-doped GaN nanorods. NANOTECHNOLOGY 2024; 35:225603. [PMID: 38373390 DOI: 10.1088/1361-6528/ad2ac6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/13/2023] [Accepted: 02/18/2024] [Indexed: 02/21/2024]
Abstract
Mg-doped GaN films/nanorods were grown epitaxially onc-sapphire by reactive co-sputtering of GaAs and Mg at different N2percentages in Ar-N2sputtering atmosphere. Energy dispersive x-ray spectroscopy revealed that the Mg incorporation increases with increase of Mg area coverage of GaAs target, but does not depend on N2percentage. In comparison to undoped GaN films, Mg-doped GaN displayed substantial decrease of lateral conductivity and electron concentration with the initial incorporation of Mg, indicatingp-type doping, but revealed insulating behaviour at larger Mg content. Morphological investigations by scanning electron microscopy have shown that the films grown with 2%-4% Mg area coverages displayed substantially improved columnar structure, compared to undoped GaN films, along with rough and voided surface features at lower N2percentages. With increase of Mg area coverage to 6%, the growth of vertically aligned and well-separated nanorods, terminating with smooth hexagonal faces was observed in the range of 50%-75% N2in sputtering atmosphere. High-resolution x-ray diffraction studies confirmed the epitaxial character of Mg-doped GaN films and nanorods, which displayed completec-axis orientation of crystallites and a mosaic structure, aligned laterally with thec-sapphire lattice. The catalyst-free growth of self-assembled Mg-doped GaN nanorods is attributed to increase of surface energy anisotropy due to the incorporation of Mg. However, with further increase of Mg area coverage to 8%, the nanorods revealed lateral merger, suggesting enhanced radial growth at larger Mg content.
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Affiliation(s)
- Mohammad Monish
- Department of Physics, Indian Institute of Technology Bombay, Mumbai 400076, India
| | - S S Major
- Department of Physics, Indian Institute of Technology Bombay, Mumbai 400076, India
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3
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Hwang HY, Baek H, Yi GC, Jho YD. Nanoscale mapping of surface strain in tapered nanorods using confocal photoluminescence spectroscopy. NANOTECHNOLOGY 2022; 33:485703. [PMID: 35998510 DOI: 10.1088/1361-6528/ac8bd9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/14/2022] [Accepted: 08/22/2022] [Indexed: 06/15/2023]
Abstract
The strain occurs spontaneously at the heterogeneous interfaces of virtually all crystalline materials. Consequently, the analysis across multiple interfaces requires a complementary characterization scheme with a resolution that fits the deformation scale. By implementing two-photon confocal laser scanning nanoscopy with an axial resolution of 10 nm, we extract the surface strain from the photoluminescence (PL) spectra, epitomized by a 2-fold enhancement at the tapered tips in comparison to the substrate of ZnO nanorods. We firstly traced the well-established contribution from quantum confinement (QC) to PL shift in three geometrically classified regions: (I) a strongly tapered region where the diameter increases from 3 to 20 nm; (II) a weakly tapered region with a gradually increasing diameter from 20 to 58 nm; (III) round cylindrical region interfacing the sapphire substrate. The measured PL shift influenced by the deformation is significantly stronger than the attained QC effect. Particularly, surface strain at the strongly tapered region turned out to drastically increase the PL shift which matches well with the analysis based on the surface to volume ratio incorporating mechanical parameters such as the compliance tensor component, strain dislocation constant, and surface stress. The surface strain increased at a lower temperature, further disclosing its inherent dependence on the thermal expansion coefficients in clear contrast to the temperature-invariant characteristics of QC.
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Affiliation(s)
- Hyeong-Yong Hwang
- Clarendon Laboratory, Department of Physics, University of Oxford, Oxford OX1 3PU, United Kingdom
| | - Hyeonjun Baek
- Department of Physics, Sogang University, Seoul 04107, Republic of Korea
| | - Gyu-Chul Yi
- Department of Physics and Astronomy, and Institute of Applied Physics, Seoul National University, Seoul 08826, Republic of Korea
| | - Young-Dahl Jho
- School of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea
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4
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Yan T, Min Y, Lin M, Chen C, Lee C, Zhao L, Ye N, Chou MMC, Liu H, Zhou W. Intersected nonpolar ZnO nanosail arrays aligned epitaxially on LiGaO
2
substrate towards enhanced photoelectrochemical responses. NANO SELECT 2021. [DOI: 10.1002/nano.202000273] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022] Open
Affiliation(s)
- Tao Yan
- Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou 350002 China
| | - Yunxiao Min
- Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou 350002 China
| | - Mei‐Yi Lin
- Department of Materials and Optoelectronic Science National Sun Yat‐sen University Kaohsiung 80424 Taiwan
| | - Chenlong Chen
- Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou 350002 China
| | - Chun‐Yu Lee
- Department of Materials and Optoelectronic Science National Sun Yat‐sen University Kaohsiung 80424 Taiwan
| | - Lili Zhao
- Institute for Advanced Interdisciplinary Research (IAIR) University of Jinan Jinan 250022 China
| | - Ning Ye
- Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter Chinese Academy of Sciences Fuzhou 350002 China
| | - Mitch M. C. Chou
- Department of Materials and Optoelectronic Science National Sun Yat‐sen University Kaohsiung 80424 Taiwan
| | - Hong Liu
- Institute for Advanced Interdisciplinary Research (IAIR) University of Jinan Jinan 250022 China
| | - Weijia Zhou
- Institute for Advanced Interdisciplinary Research (IAIR) University of Jinan Jinan 250022 China
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Hang T, Wu J, Xiao S, Li B, Li H, Yang C, Yang C, Hu N, Xu Y, Zhang Y, Xie X. Anti-biofouling NH 3 gas sensor based on reentrant thorny ZnO/graphene hybrid nanowalls. MICROSYSTEMS & NANOENGINEERING 2020; 6:41. [PMID: 34567654 PMCID: PMC8433158 DOI: 10.1038/s41378-020-0151-5] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/28/2019] [Revised: 02/23/2020] [Accepted: 03/03/2020] [Indexed: 05/19/2023]
Abstract
Since toxic gas leakage may cause ecological environmental problems and even life-threatening damage, effective monitoring of toxic gas is of great importance and subject to increasing demand. However, complicated environmental factors, as well as various coexisting interferences can easily affect the sensitivity and selectivity of gas sensors, hindering their performance. Recent reports have successfully demonstrated the development of hierarchical nanostructures with desirable self-cleaning properties, yet gas sensors that can resist contamination have rarely been realized. Here, we developed a reentrant thorny ZnO/graphene hybrid nanowall structure that simultaneously repels liquid contamination and possesses NH3 gas sensing properties. The unique reentrant and hierarchical structure, featuring an interconnected vertical graphene nanowall framework with numerous ZnO nanospikes branched on the top nanowall, is highly repellent to liquids, even biofluids with low surface tension. The hierarchical structure consisting of gas sensing graphene and ZnO can be successfully applied as an NH3 gas sensor at room temperature, exhibiting not only excellent sensitivity, selectivity, and repeatability, but also outstanding stability even after bacterial contamination. This study provides a versatile method for fabricating reentrant and hierarchical structures with excellent liquid repellency, and offers a promising method for designing reliable gas sensors with anti-biofouling properties.
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Affiliation(s)
- Tian Hang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Jiangming Wu
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Shuai Xiao
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Baohong Li
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Hongbo Li
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Chengduan Yang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Cheng Yang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Ning Hu
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Yonghang Xu
- School of Materials Science and Energy Engineering, Foshan University, Foshan, 528000 China
| | - Yu Zhang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
| | - Xi Xie
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Electronics and Information Technology, Guangdong Province Key Laboratory of Display Material and Technology, Sun Yat-Sen University, Guangzhou, 510006 China
- The First Affiliated Hospital of Sun Yat-Sen University, Guangzhou, 510080 China
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6
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Li X, Cheng S, Deng S, Wei X, Zhu J, Chen Q. Direct Observation of the Layer-by-Layer Growth of ZnO Nanopillar by In situ High Resolution Transmission Electron Microscopy. Sci Rep 2017; 7:40911. [PMID: 28098261 PMCID: PMC5241657 DOI: 10.1038/srep40911] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/10/2016] [Accepted: 12/12/2016] [Indexed: 01/18/2023] Open
Abstract
Catalyst-free methods are important for the fabrication of pure nanowires (NWs). However, the growth mechanism remains elusive due to the lack of crucial information on the growth dynamics at atomic level. Here, the noncatalytic growth process of ZnO NWs is studied through in situ high resolution transmission electron microscopy. We observe the layer-by-layer growth of ZnO nanopillars along the polar [0001] direction under electron beam irradiation, while no growth is observed along the radial directions, indicating an anisotropic growth mechanism. The source atoms are mainly from the electron beam induced damage of the sample and the growth is assisted by subsequent absorption and then diffusion of atoms along the side surface to the top (0002) surface. The different binding energy on different ZnO surface is the main origin for the anisotropic growth. Additionally, the coalescence of ZnO nanocrystals related to the nucleation stage is uncovered to realize through the rotational motions and recrystallization. Our in situ results provide atomic-level detailed information about the dynamic growth and coalescence processes in the noncatalytic synthesis of ZnO NW and are helpful for understanding the vapor-solid mechanism of catalyst-free NW growth.
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Affiliation(s)
- Xing Li
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, P.R. China
| | - Shaobo Cheng
- National Center for Electron Microscopy in Beijing, School of Materials Science and Engineering, The State Key Laboratory of New Ceramics and Fine Processing, Key Laboratory of Advanced Materials (MOE), Tsinghua University, Beijing 100084, P.R. China.,Center for Nano and Micro Mechanics, Tsinghua University, Beijing 100084, P.R. China
| | - Shiqing Deng
- National Center for Electron Microscopy in Beijing, School of Materials Science and Engineering, The State Key Laboratory of New Ceramics and Fine Processing, Key Laboratory of Advanced Materials (MOE), Tsinghua University, Beijing 100084, P.R. China
| | - Xianlong Wei
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, P.R. China
| | - Jing Zhu
- National Center for Electron Microscopy in Beijing, School of Materials Science and Engineering, The State Key Laboratory of New Ceramics and Fine Processing, Key Laboratory of Advanced Materials (MOE), Tsinghua University, Beijing 100084, P.R. China.,Center for Nano and Micro Mechanics, Tsinghua University, Beijing 100084, P.R. China
| | - Qing Chen
- Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, P.R. China
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