X-Ray induced desorption and photochemistry in CO ice

Indirect X-ray photodesorption of 15N2 and 13CO from mixed and layered ices

X-ray photodesorption yields of 15N2 and 13CO are derived as a function of the incident photon energy near the N (~ 400 eV) and O K-edge (~ 500 eV) for pure 15N2 ice and mixed 13CO:15N2 ices. The photodesorption spectra from the mixed ices reveal an indirect desorption mechanism for which the desorption of 15N2 and 13CO is triggered by the photo-absorption of respectively 13CO and 15N2. This mechanism is confirmed by the X-ray photodesorption of 13CO from a layered 13CO/15N2 ice irradiated at 401 eV, on the N 1s -> π* transition of 15N2. This latter experiment enables to quantify the relevant depth involved in the indirect desorption process, which is found to be 30 - 40 ML in that case. This value is further related to the energy transport of Auger electrons emitted from the photo-absorbing 15N2molecules that scatter towards the ice surface, inducing the desorption of 13CO. The photodesorption yields corrected from the energy that can participate to the desorption process (expressed in molecules desorbed by eV deposited) do not depend on the photon energy hence neither on the photo-absorbing molecule nor on its state after Auger decay. This demonstrates that X-ray induced electron stimulated desorption (XESD), mediated by Auger scattering, is the dominant process explaining the desorption of 15N2 and 13CO from the ices studied in this work.

A newly designed compact CEY-XAFS cell in the soft X-ray region and its application to surface XAFS measurements under ambient-pressure conditions without photoinduced side effects

We report a newly designed compact cell to measure XAFS spectra with the conversion electron yield (CEY) method in the soft X-ray region under ambient-pressure gas conditions. Secondary electrons generated from the gas and sample by collision of X-ray-absorption-induced Auger electrons are collected by a positively biased collector electrode to obtain XAFS spectra. It was confirmed that this cell is applicable to soft X-ray surface XAFS measurements for different types of materials such as insulating organic materials and metal oxides under 1 bar gas conditions. During the measurements, photoinduced side effects were observed; i.e. photoinduced degradation of organic materials and photoinduced reduction/oxidation of metal oxides. We found that these photoinduced side effects can be sufficiently suppressed by controlling the measuring conditions. The presented measuring approach will enable surface XAFS spectra to be obtained in the soft X-ray region for various types of functional materials under ambient-pressure working conditions.