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Yuan L, Pokharel R, Devkota S, Kuchoor H, Dawkins K, Lee MC, Huang Y, Yarotski D, Iyer S, Prasankumar RP. Revealing charge carrier dynamics and transport in Te-doped GaAsSb and GaAsSbN nanowires by correlating ultrafast terahertz spectroscopy and optoelectronic characterization. NANOTECHNOLOGY 2022; 33:425702. [PMID: 35772308 DOI: 10.1088/1361-6528/ac7d61] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/06/2022] [Accepted: 06/30/2022] [Indexed: 06/15/2023]
Abstract
Recent advances in the growth of III-V semiconductor nanowires (NWs) hold great promise for nanoscale optoelectronic device applications. It is established that a small amount of nitrogen (N) incorporation in III-V semiconductor NWs can effectively red-shift their wavelength of operation and tailor their electronic properties for specific applications. However, understanding the impact of N incorporation on non-equilibrium charge carrier dynamics and transport in semiconducting NWs is critical in achieving efficient semiconducting NW devices. In this work, ultrafast optical pump-terahertz probe spectroscopy has been used to study non-equilibrium carrier dynamics and transport in Te-doped GaAsSb and dilute nitride GaAsSbN NWs, with the goal of correlating these results with electrical characterization of their equilibrium photo-response under bias and low-frequency noise characteristics. Nitrogen incorporation in GaAsSb NWs led to a significant increase in the carrier scattering rate, resulting in a severe reduction in carrier mobility. Carrier recombination lifetimes of 33 ± 1 picoseconds (ps) and 147 ± 3 ps in GaAsSbN and GaAsSb NWs, respectively, were measured. The reduction in the carrier lifetime and photoinduced optical conductivities are due to the presence of N-induced defects, leading to deterioration in the electrical and optical characteristics of dilute nitride NWs relative to the non-nitride NWs. Finally, we observed a very fast rise time of ∼2 ps for both NW materials, directly impacting their potential use as high-speed photodetectors.
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Affiliation(s)
- Long Yuan
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America
| | - Rabin Pokharel
- Nanoengineering Department, Joint School of Nanoscience and Nanoengineering, North Carolina A&T University, Greensboro, NC 27401, United States of America
| | - Shisir Devkota
- Nanoengineering Department, Joint School of Nanoscience and Nanoengineering, North Carolina A&T University, Greensboro, NC 27401, United States of America
| | - Hirandeep Kuchoor
- Nanoengineering Department, Joint School of Nanoscience and Nanoengineering, North Carolina A&T University, Greensboro, NC 27401, United States of America
| | - Kendall Dawkins
- Nanoengineering Department, Joint School of Nanoscience and Nanoengineering, North Carolina A&T University, Greensboro, NC 27401, United States of America
| | - Min-Cheol Lee
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America
| | - Yue Huang
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America
| | - Dzmitry Yarotski
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America
| | - Shanthi Iyer
- Nanoengineering Department, Joint School of Nanoscience and Nanoengineering, North Carolina A&T University, Greensboro, NC 27401, United States of America
| | - Rohit P Prasankumar
- Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States of America
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