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Number Cited by Other Article(s)
1
Roest LI, van Heijst SE, Maduro L, Rojo J, Conesa-Boj S. Charting the low-loss region in electron energy loss spectroscopy with machine learning. Ultramicroscopy 2021;222:113202. [PMID: 33453606 DOI: 10.1016/j.ultramic.2021.113202] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/10/2020] [Revised: 12/22/2020] [Accepted: 01/05/2021] [Indexed: 11/25/2022]
2
Lazar S, Botton GA, Wu MY, Tichelaar FD, Zandbergen HW. Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy. Ultramicroscopy 2003;96:535-46. [PMID: 12871814 DOI: 10.1016/s0304-3991(03)00114-1] [Citation(s) in RCA: 133] [Impact Index Per Article: 6.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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