Energy-filtered transmission electron microscopy of multilayers in semiconductors

Controlling the surface chemistry of cerium oxide nanoparticles for biological applications

Room temperature doping of cerium oxide nanoparticles to control the surface chemistry for enhanced biocatalytic activity is proposed.

A new algorithm to reduce noise in microscopy images implemented with a simple program in python

All microscopical images contain noise, increasing when (e.g., transmission electron microscope or light microscope) approaching the resolution limit. Many methods are available to reduce noise. One of the most commonly used is image averaging. We propose here to use the mode of pixel values. Simple Python programs process a given number of images, recorded consecutively from the same subject. The programs calculate the mode of the pixel values in a given position (a, b). The result is a new image containing in (a, b) the mode of the values. Therefore, the final pixel value corresponds to that read in at least two of the pixels in position (a, b). The application of the program on a set of images obtained by applying salt and pepper noise and GIMP hurl noise with 10-90% standard deviation showed that the mode performs better than averaging with three-eight images. The data suggest that the mode would be more efficient (in the sense of a lower number of recorded images to process to reduce noise below a given limit) for lower number of total noisy pixels and high standard deviation (as impulse noise and salt and pepper noise), while averaging would be more efficient when the number of varying pixels is high, and the standard deviation is low, as in many cases of Gaussian noise affected images. The two methods may be used serially.

Structural characterization of TiN/NbN multilayers: X-ray diffraction, energy-filtered TEM and Fresnel contrast techniques compared

Two TiN/NbN multilayers with wavelength 13.6 and 6.15 nm have been characterized by X-ray diffraction (XRD), Fresnel contrast analysis (FCA) and energy-filtered transmission electron microscopy (EFTEM). Good agreement between the composition profile obtained by FCA and EFTEM is obtained if the lower resolution of the EFTEM images is taken into account. The relative advantages and disadvantages of the techniques are discussed. Used together the two TEM techniques provide a quantitative characterization that is consistent with, and for some parameters provides more precise values than, that from XRD. The analysis shows that the multilayers have narrow interfaces (< 1 nm) and a composition amplitude close to 95% for the longer wavelength.

Spectroscopic electron tomography

The elemental mapping techniques in analytical transmission electron microscopy (TEM), energy filtered imaging (EFTEM) and EDX-mapping, are shown to provide new routes for tomographic reconstructions of 3D chemical maps on the nanoscale. The inelastic scattering does not only provide chemical sensitivity but also improves the linear projection relationship between mass density and image intensity, which often fails in bright field TEM of crystalline materials due to diffraction contrast. Instrumental requirements and artefact sources within the contrast formation mechanisms and within the numerical reconstruction are assessed.