Dynamic View on Nanostructures: A Technique for Time Resolved Optical Luminescence using Synchrotron Light Pulses at SRC, APS, and CLS

Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline

Time-resolved X-ray excited optical luminescence (TR-XEOL) was developed successfully for the 23A X-ray nanoprobe beamline located at the Taiwan Photon Source (TPS). The advantages of the TR-XEOL facility include (i) a nano-focused X-ray beam (<60 nm) with excellent spatial resolution and (ii) a streak camera that can simultaneously record the XEOL spectrum and decay time. Three time spans, including normal (30 ps to 2 ns), hybrid (30 ps to 310 ns) and single (30 ps to 1.72 µs) bunch modes, are available at the TPS, which can fulfil different experimental conditions involving samples with various lifetimes. It is anticipated that TR-XEOL at the TPS X-ray nanoprobe could provide great characterization capabilities for investigating the dynamics of photonic materials.

Investigation of Cavity Enhanced XEOL of a Single ZnO Microrod by Using Multifunctional Hard X-ray Nanoprobe

The multifunctional hard X-ray nanoprobe at Taiwan Photon Source (TPS) exhibits the excellent ability to simultaneously characterize the X-ray absorption, X-ray excited optical luminescence (XEOL) as well as the dynamics of XEOL of materials. Combining the scanning electron microscope (SEM) into the TPS 23A end-station, we can easily and quickly measure the optical properties to map out the morphology of a ZnO microrod. A special phenomenon has been observed that the oscillations in the XEOL associated with the confinement of the optical photons in the single ZnO microrod shows dramatical increase while the X-ray excitation energy is set across the Zn K-edge. Besides having the nano-scale spatial resolution, the synchrotron source also gives a good temporal domain measurement to investigate the luminescence dynamic process. The decay lifetimes of different emission wavelengths and can be simultaneously obtained from the streak image. Besides, SEM can provide the cathodoluminescence (CL) to be a complementary method to analyze the emission properties of materials, we anticipate that the X-ray nanoprobe will open new avenues with great characterization ability for developing nano/microsized optoelectronic devices.

XEOL spectroscopy of lanthanides in aqueous solution

As part of an ongoing study of the electronic interactions between solute and solvent molecules, a method for X-ray excited optical luminescence (XEOL) analysis of aqueous solutions was developed at the double-crystal monochromator beamline (DCM) of the Canadian Synchrotron Radiation Facility (CSRF). It was tested using a series of solutions containing lanthanide ions. The samples were contained in a sample holder for liquids with a 3 μm Mylar window separating them from the vacuum (≤3 × 10−6 torr, 1 torr = 133.3224 Pa) in the solid state absorption chamber of the DCM beamline. Terbium, samarium, and dysprosium have 4 intense and narrow luminescence peaks between 450 and 700 nm, well separated from the luminescence peak of the Mylar window between 300 and 425 nm. The intensity of the rare earth (RE3+) luminescence peaks was lower for the solutions than for solid RECl3·6H2O. In part, this was caused by the lower RE3+ concentration in the solutions than in the solid. In addition, the solvent (water) acts as a quencher. The disorder and the molecular motion in the solution increase the availability of nonradiative de-excitation pathways. A high concentration of SO42− in the solution enhanced the luminescence intensity, probably by inhibiting some nonradiative de-excitation pathways. This study has shown that it is in principle possible to investigate the luminescence of aqueous solutions with XEOL spectroscopy. Furthermore, it is possible to use this technique as a quantitative analytical tool for concentrated luminescent solutions and to study the shielding effects of anions in the solution that increase the luminescence intensity.

Photon-in/photon-out spectroscopic techniques for materials analysis: some recent developments

Third-generation synchrotron light source technology has greatly improved the capabilities for materials analysis using tunable X-rays. Two such capabilities developed recently are reported herein - inverse partial fluorescence yield (IPFY) XANES (X-ray absorption near edge structure) and 2D XANES - XEOL (X-ray excited optical luminescence) in both the energy and time domain. These techniques take advantage of recent advances in soft X-ray solid state detector, optical spectrometer with a CCD detector and optical streak camera on a soft X-ray beamline as well as new data acquisition schemes. The studies of LiFePO4 materials for Li ion battery and solid solutions of GaN-ZnO nanostructures for water splitting are used to illustrate these capabilities. The prospects of these and related synchrotron photon-in photon-out techniques are also noted.

Time-resolved synchrotron radiation excited optical luminescence: light-emission properties of silicon-based nanostructures

The recent advances in the study of light emission from matter induced by synchrotron radiation: X-ray excited optical luminescence (XEOL) in the energy domain and time-resolved X-ray excited optical luminescence (TRXEOL) are described. The development of these element (absorption edge) selective, synchrotron X-ray photons in, optical photons out techniques with time gating coincide with advances in third-generation, insertion device based, synchrotron light sources. Electron bunches circulating in a storage ring emit very bright, widely energy tunable, short light pulses (<100 ps), which are used as the excitation source for investigation of light-emitting materials. Luminescence from silicon nanostructures (porous silicon, silicon nanowires, and Si-CdSe heterostructures) is used to illustrate the applicability of these techniques and their great potential in future applications.