1
|
Developing a Simple Scanning Probe System for Soft X-ray Spectroscopy with a Nano-focusing Mirror. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2023. [DOI: 10.1380/ejssnt.2023-020] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/20/2023]
|
2
|
Micrometer-scale monolayer SnS growth by physical vapor deposition. NANOSCALE 2020; 12:23274-23281. [PMID: 33206097 DOI: 10.1039/d0nr06022d] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Recently, monolayer SnS, a two-dimensional group IV monochalcogenide, was grown on a mica substrate at the micrometer-size scale by the simple physical vapor deposition (PVD), resulting in the successful demonstration of its in-plane room temperature ferroelectricity. However, the reason behind the monolayer growth remains unclear because it had been considered that the SnS growth inevitably results in a multilayer thickness due to the strong interlayer interaction arising from lone pair electrons. Here, we investigate the PVD growth of monolayer SnS from two different feed powders, highly purified SnS and commercial phase-impure SnS. Contrary to expectations, it is suggested that the mica substrate surface is modified by sulfur evaporated from the Sn2S3 contaminant in the as-purchased powder and the lateral growth of monolayer SnS is facilitated due to the enhanced surface diffusion of SnS precursor molecules, unlike the growth from the highly purified powder. This insight provides a guide to identify further controllable growth conditions.
Collapse
|
3
|
All 2D Heterostructure Tunnel Field-Effect Transistors: Impact of Band Alignment and Heterointerface Quality. ACS APPLIED MATERIALS & INTERFACES 2020; 12:51598-51606. [PMID: 33146991 DOI: 10.1021/acsami.0c13233] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Van der Waals heterostructures are the ideal material platform for tunnel field-effect transistors (TFETs) because a band-to-band tunneling (BTBT) dominant current is feasible at room temperature (RT) because of ideal, dangling bond-free heterointerfaces. However, achieving subthreshold swing (SS) values lower than 60 mV dec-1 of the Boltzmann limit is still challenging. In this work, we systematically studied the band alignment and heterointerface quality in n-MoS2 channel heterostructure TFETs. By selecting a p+-MoS2 source with a sufficiently high doping level, stable gate modulation to a type III band alignment was achieved regardless of the number of MoS2 channel layers. For the gate stack formation, it was found that the deposition of Al2O3 as the top gate introduces defect states for the generation current under reverse bias, while the integration of a hexagonal boron nitride (h-BN) top gate provides a defect-free, clean interface, resulting in the BTBT dominant current even at RT. All 2D heterostructure TFETs produced by combining the type III n-MoS2/p+-MoS2 heterostructure with the h-BN top-gate insulator resulted in low SS values at RT.
Collapse
|
4
|
Development of a scanning soft X-ray spectromicroscope to investigate local electronic structures on surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere. JOURNAL OF SYNCHROTRON RADIATION 2020; 27:664-674. [PMID: 32381766 PMCID: PMC7285684 DOI: 10.1107/s1600577520002258] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2019] [Accepted: 02/18/2020] [Indexed: 06/11/2023]
Abstract
A scanning soft X-ray spectromicroscope was recently developed based mainly on the photon-in/photon-out measurement scheme for the investigation of local electronic structures on the surfaces and interfaces of advanced materials under conditions ranging from low vacuum to helium atmosphere. The apparatus was installed at the soft X-ray beamline (BL17SU) at SPring-8. The characteristic features of the apparatus are described in detail. The feasibility of this spectromicroscope was demonstrated using soft X-ray undulator radiation. Here, based on these results, element-specific two-dimensional mapping and micro-XAFS (X-ray absorption fine structure) measurements are reported, as well as the observation of magnetic domain structures from using a reference sample of permalloy micro-dot patterns fabricated on a silicon substrate, with modest spatial resolution (e.g. ∼500 nm). Then, the X-ray radiation dose for Nafion® near the fluorine K-edge is discussed as a typical example of material that is not radiation hardened against a focused X-ray beam, for near future experiments.
Collapse
|
5
|
Microscopic photoelectron analysis of single crystalline LiCoO 2 particles during the charge-discharge in an all solid-state lithium ion battery. Sci Rep 2019; 9:12452. [PMID: 31462743 PMCID: PMC6713709 DOI: 10.1038/s41598-019-48842-6] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/17/2018] [Accepted: 08/14/2019] [Indexed: 11/09/2022] Open
Abstract
We report synchrotron-based operando soft X-ray microscopic photoelectron spectroscopy under charge-discharge control of single crystalline LiCoO2 (LCO) particles as an active electrode material for an all solid-state lithium-ion battery (LIB). Photoelectron mapping and the photoelectron spectrum of a selected microscopic region are obtained by a customized operando cell for LIBs. During the charge process, a more effective Li extraction from a side facet of the single crystalline LCO particle than from the central part is observed, which ensures the reliability of the system as an operando microscopic photoelectron analyzer that can track changes in the electronic structure of a selected part of the active particle. Based on these assessments, the no drastic change in the Co 2p XPS spectra during charge-discharge of LCO supports that the charge-polarization may occur at the oxygen side by strong hybridization between Co 3d and O 2p orbitals. The success of tracking the electronic-structure change at each facet of a single crystalline electrode material during charge-discharge is a major step toward the fabrication of innovative active electrode materials for LIBs.
Collapse
|
6
|
Spectrum adapted the expectation-maximization algorithm for high-throughput peak shift analysis. SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS 2019; 20:733-745. [PMID: 31275463 PMCID: PMC6598525 DOI: 10.1080/14686996.2019.1620123] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/19/2018] [Revised: 05/14/2019] [Accepted: 05/14/2019] [Indexed: 06/09/2023]
Abstract
We introduce a spectrum-adapted expectation-maximization (EM) algorithm for high-throughput analysis of a large number of spectral datasets by considering the weight of the intensity corresponding to the measurement energy steps. Proposed method was applied to synthetic data in order to evaluate the performance of the analysis accuracy and calculation time. Moreover, the proposed method was performed to the spectral data collected from graphene and MoS2 field-effect transistors devices. The calculation completed in less than 13.4 s per set and successfully detected systematic peak shifts of the C 1s in graphene and S 2p in MoS2 peaks. This result suggests that the proposed method can support the investigation of peak shift with two advantages: (1) a large amount of data can be processed at high speed; and (2) stable and automatic calculation can be easily performed.
Collapse
|
7
|
Abstract
Synchrotron-based scanning photoelectron microscopy (SPEM) has opened unique opportunities for exploiting processes occurring at surfaces and interfaces, which control the properties of materials for electrochemical devices, where issues of chemical and morphological complexity at microscopic length scales should be faced and understood. The present article aims to demonstrate the present capabilities of SPEM to explore the surface composition of micro- and nano-structured materials, focusing on cases relevant to electrochemical technologies. We report and discuss a selection of recent results about three different systems, targeting hot topics in the fields of electrochemical energy storage and electrochemical fabrication: (i) an in-depth analysis of Ag-In electrodeposited alloys exhibiting dynamic pattern formation, (ii) the analysis of electrochemical processes at the electrodes of a self-driven solid oxide fuel cell and (iii) an operando characterization of a single-chamber solid oxide fuel cell. The last example has been performed at near-ambient pressure conditions using a unique specially designed setup which extends the traditional capabilities of scanning photoemission microscopes in the ultra-high and high-vacuum regimes to operating conditions that are closer to realistic ones, contributing to overcome the so-called “pressure gap”.
Collapse
|
8
|
Operando XAFS Imaging of Distribution of Pt Cathode Catalysts in PEFC MEA. CHEM REC 2018; 19:1380-1392. [PMID: 30375154 DOI: 10.1002/tcr.201800123] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/09/2018] [Accepted: 09/28/2018] [Indexed: 11/10/2022]
Abstract
Three-dimensional imaging using X-ray as a probe is state-of-the-art for the characterization of heterogeneous materials. In addition to simple imaging of sample morphology, imaging of elemental distribution and chemical states provides advanced maps of key structural parameters of functional materials. The combination of X-ray absorption fine structure (XAFS) spectroscopy and three-dimensional imaging such as computed tomography (CT) can visualize the three-dimensional distribution of target elements, their valence states, and local structures in a non-destructive manner. In this personal account, our recent results on the three-dimensional XAFS imaging for Pt cathode catalysts in the membrane electrode assembly (MEA) of polymer electrolyte fuel cell (PEFC) are introduced. The distribution and chemical states of Pt cathode catalysts in MEAs remarkably change under PEFC operating conditions, and the 3D XAFS imaging revealed essential events in PEFC MEAs.
Collapse
|
9
|
Operation Mechanism of GaN-based Transistors Elucidated by Element-Specific X-ray Nanospectroscopy. Sci Rep 2018; 8:13268. [PMID: 30185804 PMCID: PMC6125406 DOI: 10.1038/s41598-018-31485-4] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/18/2018] [Accepted: 08/16/2018] [Indexed: 11/09/2022] Open
Abstract
With the rapid depletion of communication-frequency resources, mainly due to the explosive spread of information communication devices for the internet of things, GaN-based high-frequency high-power transistors (GaN-HEMTs) have attracted considerable interest as one of the key devices that can operate in the high-frequency millimeter-wave band. However, GaN-HEMT operation is destabilized by current collapse phenomena arising from surface electron trapping (SET), which has not been fully understood thus far. Here, we conduct quantitative mechanistic studies on SET in GaN-HEMTs by applying element- and site-specific photoelectron nanospectroscopy to a GaN-HEMT device under operation. Our study reveals that SET is induced by a large local electric field. Furthermore, surface passivation using a SiN thin film is demonstrated to play a dual role: electric-field weakening and giving rise to chemical interactions that suppress SET. Our findings can contribute to the realization of high-capacity wireless communication systems based on GaN-HEMTs.
Collapse
|
10
|
Photoelectron Nano-spectroscopy of Reactive Ion Etching-Induced Damages to the Trench Sidewalls and Bottoms of 4H-SiC Trench-MOSFETs. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2018. [DOI: 10.1380/ejssnt.2018.257] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
|
11
|
Compact Sub Micro-resolution X-ray Microscope Based on Carbon Nanotube FE-SEM. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2018. [DOI: 10.1380/ejssnt.2018.84] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
|
12
|
Vacuum scanning capillary photoemission microscopy. Ultramicroscopy 2017; 179:90-93. [PMID: 28454043 DOI: 10.1016/j.ultramic.2017.04.013] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/08/2016] [Revised: 04/05/2017] [Accepted: 04/17/2017] [Indexed: 10/19/2022]
Abstract
We demonstrate the use of a conical capillary in a scanning probe microscopy for surface analysis. The probe can measure photoemission from a substrate by transmitting photoelectrons along the capillary as a function of probe position. The technique is demonstrated on a model substrate consisting of a gold reflecting layer on a compact disc which has been illuminated by an unfocused laser beam with a wavelength 400nm, from a femtosecond laser with a beam size of 4mm. A quartz capillary with a 2-µm aperture has been used in the experiments. The period of gold microstructure, shown to be 1.6µ, was measured by the conical probe operating in shear force mode. In shear force regime, the dielectric capillary has been used as a "classical" SPM tip, which provided images reflecting the surface topology. In a photoelectron regime photoelectrons passed through hollow tip and entered a detector. The spatial distribution of the recorded photoelectrons consisted of periodic mountain-valley strips, resembling the surface profile of the sample. Submicron spatial resolution has been achieved. This approach paves the way to study pulsed photodesorption of large organic molecular ions with high spatial and element resolution using the combination of a hollow-tip scanner with time-of-flight technique.
Collapse
|
13
|
Enhanced spatial resolution in vector potential photoelectron microscopy. J Microsc 2017; 267:176-192. [DOI: 10.1111/jmi.12558] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/30/2016] [Revised: 02/20/2017] [Accepted: 02/20/2017] [Indexed: 11/29/2022]
|
14
|
Investigation of the enhanced photocathodic activity of La 5Ti 2CuS 5O 7 photocathodes in H 2 evolution by synchrotron radiation nanospectroscopy. NANOSCALE 2016; 8:18893-18896. [PMID: 27824194 DOI: 10.1039/c6nr06541d] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The local electronic structures of La5Ti2MS5O7 (M = Cu, Ag) particulate photoelectrodes with and without Ga doping were investigated, using a photoemission spectroscopy system with a lateral resolution of approximately 100 nm. The band alignments for La5Ti2MS5O7 were determined on the basis of pinpoint photoemission spectra acquired at optimal positions on the sample surfaces. A clear upward chemical potential shift of approximately 0.35 eV was observed in the case of Ga-doped La5Ti2CuS5O7. On the other hand, the electronic structure of La5Ti2AgS5O7 remained almost unaffected by Ga doping. These results explain the enhanced photocathodic response of La5Ti2CuS5O7 upon Ga doping.
Collapse
|
15
|
In-situ observations of catalytic surface reactions with soft x-rays under working conditions. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2015; 27:083003. [PMID: 25667354 DOI: 10.1088/0953-8984/27/8/083003] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Catalytic chemical reactions proceeding on solid surfaces are an important topic in fundamental science and industrial technologies such as energy conversion, pollution control and chemical synthesis. Complete understanding of the heterogeneous catalysis and improving its efficiency to an ultimate level are the eventual goals for many surface scientists. Soft x-ray is one of the prime probes to observe electronic and structural information of the target materials. Most studies in surface science using soft x-rays have been performed under ultra-high vacuum conditions due to the technical limitation, though the practical catalytic reactions proceed under ambient pressure conditions. However, recent developments of soft x-ray based techniques operating under ambient pressure conditions have opened a door to the in-situ observation of materials under realistic environments. The near-ambient-pressure x-ray photoelectron spectroscopy (NAP-XPS) using synchrotron radiation enables us to observe the chemical states of surfaces of condensed matters under the presence of gas(es) at elevated pressures, which has been hardly conducted with the conventional XPS technique. Furthermore, not only the NAP-XPS but also ambient-pressure compatible soft x-ray core-level spectroscopies, such as near-edge absorption fine structure (NEXAFS) and x-ray emission spectroscopy (XES), have been significantly contributing to the in-situ observations. In this review, first we introduce recent developments of in-situ observations using soft x-ray techniques and current status. Then we present recent new findings on catalytically active surfaces using soft x-ray techniques, particularly focusing on the NAP-XPS technique. Finally we give a perspective on the future direction of this emerging technique.
Collapse
|
16
|
Microscopically-tuned band structure of epitaxial graphene through interface and stacking variations using Si substrate microfabrication. Sci Rep 2014; 4:5173. [PMID: 24903119 PMCID: PMC4047530 DOI: 10.1038/srep05173] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/04/2014] [Accepted: 05/16/2014] [Indexed: 11/13/2022] Open
Abstract
Graphene exhibits unusual electronic properties, caused by a linear band structure near the Dirac point. This band structure is determined by the stacking sequence in graphene multilayers. Here we present a novel method of microscopically controlling the band structure. This is achieved by epitaxy of graphene on 3C-SiC(111) and 3C-SiC(100) thin films grown on a 3D microfabricated Si(100) substrate (3D-GOS (graphene on silicon)) by anisotropic etching, which produces Si(111) microfacets as well as major Si(100) microterraces. We show that tuning of the interface between the graphene and the 3C-SiC microfacets enables microscopic control of stacking and ultimately of the band structure of 3D-GOS, which is typified by the selective emergence of semiconducting and metallic behaviours on the (111) and (100) portions, respectively. The use of 3D-GOS is thus effective in microscopically unlocking various potentials of graphene depending on the application target, such as electronic or photonic devices.
Collapse
|
17
|
A new X-ray fluorescence spectroscopy for extraterrestrial materials using a muon beam. Sci Rep 2014; 4:5072. [PMID: 24861282 PMCID: PMC4033923 DOI: 10.1038/srep05072] [Citation(s) in RCA: 24] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/09/2013] [Accepted: 05/01/2014] [Indexed: 11/08/2022] Open
Abstract
The recent development of the intense pulsed muon source at J-PARC MUSE, Japan Proton Accelerator Research Complex/MUon Science Establishment (10(6) s(-1) for a momentum of 60 MeV/c), enabled us to pioneer a new frontier in analytical sciences. Here, we report a non-destructive elemental analysis using µ(-) capture. Controlling muon momentum from 32.5 to 57.5 MeV/c, we successfully demonstrate a depth-profile analysis of light elements (B, C, N, and O) from several mm-thick layered materials and non-destructive bulk analyses of meteorites containing organic materials. Muon beam analysis, enabling a bulk analysis of light to heavy elements without severe radioactivation, is a unique analytical method complementary to other non-destructive analyses. Furthermore, this technology can be used as a powerful tool to identify the content and distribution of organic components in future asteroidal return samples.
Collapse
|
18
|
New soft X-ray beamline BL07LSU at SPring-8. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:352-65. [PMID: 24562556 PMCID: PMC3945419 DOI: 10.1107/s1600577513034796] [Citation(s) in RCA: 26] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/12/2013] [Accepted: 12/29/2013] [Indexed: 05/19/2023]
Abstract
A new soft X-ray beamline, BL07LSU, has been constructed at SPring-8 to perform advanced soft X-ray spectroscopy for materials science. The beamline is designed to achieve high energy resolution (E/ΔE> 10000) and high photon flux [>10(12) photons s(-1) (0.01% bandwidth)(-1)] in the photon energy range 250-2000 eV with controllable polarization. To realise this state-of-the-art performance, a novel segmented cross undulator was developed and adopted as a light source. The details of the undulator light source and beamline monochromator design are described. The achieved performance of the beamline, such as the photon flux, energy resolution and the state of polarization, is reported.
Collapse
|