Photoion spectra of C60 molecules at resonance excitation and ionization energies near the C 1s edge

Double photoionization of C(60) and C(70) in the valence region

Photoion yields from gaseous fullerenes, C(60) and C(70), for production of singly and doubly charged ions are measured by mass spectrometry combined with tunable synchrotron radiation at hnu=25-150 eV. Since the signal of triply or highly charged ions is very weak, the total photoionization yield curve can be estimated from the sum of the yields of the singly and doubly charged ions. A distinct feature appears in the resultant curve of C(60) which is absent in the calculated total photoabsorption cross section previously reported. This difference is attributed to C(60) (2+) ions chiefly produced by spectator Auger ionization of the shape resonance states followed by tunneling of the trapped electron or by cascade Auger ionization. Ratios between the yields of doubly and singly charged ions for C(60) and C(70) are larger than unity at hnu>50 eV. These ratios are quite different from those reported in the experiments using electron impact ionization.

Experimental evidence for modulations in the relative double-photoionization cross section of C60 from threshold up to 280 eV

The relative double-photoionization cross section of neutral C60 clusters was investigated using monochromatized synchrotron radiation between 18 and 283 eV. Our measurement of the double-to-single photoionization ratio reveals two modulating components that are superimposed on a smooth ratio curve from threshold (19.0 eV) up to 280 eV, when inner-shell excitations become possible. The maxima in the modulation can be related to geometrical dimensions of the C60 cluster.

Multiple ionization and fragmentation of negatively charged fullerene ions by electron impact

Cross sections for the electron-impact multiple ionization and fragmentation of negatively charged fullerene ions C(-)(n) ( n = 60, 70) to C(q+)(n-m) ( q = 1,2,3 and m = 0,2,4) have been measured for electron energies up to 1 keV. In the case of pure ionization all threshold energies are about 10 eV higher than the values expected. This shift, however, is not observed for the fragment ions. The experimental data indicate that there is no strong electron-electron interaction between the incident electron and the attached electron. A novel ionization mechanism is proposed which can be expected to be valid for all negatively charged molecular or cluster ions which are able to shield the attached electron from the incident electron.