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For: Barrett N, Conrad E, Winkler K, Krömker B. Dark field photoelectron emission microscopy of micron scale few layer graphene. Rev Sci Instrum 2012;83:083706. [PMID: 22938302 DOI: 10.1063/1.4746279] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Number Cited by Other Article(s)
1
Wan G, Panditharatne S, Fox NA, Cattelan M. Graphene-diamond junction photoemission microscopy and electronic interactions. NANO EXPRESS 2020. [DOI: 10.1088/2632-959x/aba443] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
2
Cattelan M, Fox NA. A Perspective on the Application of Spatially Resolved ARPES for 2D Materials. NANOMATERIALS (BASEL, SWITZERLAND) 2018;8:E284. [PMID: 29702567 PMCID: PMC5977298 DOI: 10.3390/nano8050284] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/11/2018] [Revised: 04/20/2018] [Accepted: 04/23/2018] [Indexed: 12/13/2022]
3
Vondráček M, Kalita D, Kučera M, Fekete L, Kopeček J, Lančok J, Coraux J, Bouchiat V, Honolka J. Nanofaceting as a stamp for periodic graphene charge carrier modulations. Sci Rep 2016;6:23663. [PMID: 27040365 PMCID: PMC4819194 DOI: 10.1038/srep23663] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/07/2015] [Accepted: 02/23/2016] [Indexed: 11/30/2022]  Open
4
Menteş TO, Zamborlini G, Sala A, Locatelli A. Cathode lens spectromicroscopy: methodology and applications. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2014;5:1873-86. [PMID: 25383299 PMCID: PMC4222408 DOI: 10.3762/bjnano.5.198] [Citation(s) in RCA: 29] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/09/2014] [Accepted: 09/25/2014] [Indexed: 05/28/2023]
5
Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy. Ultramicroscopy 2013;130:94-100. [PMID: 23541462 DOI: 10.1016/j.ultramic.2013.02.010] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/28/2012] [Revised: 02/03/2013] [Accepted: 02/05/2013] [Indexed: 11/24/2022]
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