A novel vacuum spectrometer for total reflection x-ray fluorescence analysis with two exchangeable low power x-ray sources for the analysis of low, medium, and high Z elements in sequence

Suitability and Applications of Total-Reflection X-Ray Fluorescence Spectrometry for Analytical Characterization of Nuclear Materials

The suitability and applications of Total reflection X-ray Fluorescence (TXRF) for characterization of nuclear materials are numerous. TXRF has been successfully applied for trace, minor and major determinations of constituents in nuclear materials such as fuel, clad, control rod, coolant, etc. The two major advantages of TXRF i.e. requirement of very small sample for analysis and non-requirement of matrix matched standards, make this technique further more attractive and suitable for nuclear industry. The applications of TXRF for trace analysis in nuclear materials such as fuel, clad, coolant and control rods are described in detail along with its applications for determination of major and speciation studies in TXRF mode.

Total Reflection X-ray Fluorescence Spectrometric Analysis of Ten Lanthanides at the Ultratrace Level Having a High Degree of Overlap in the Emission Lines

The extensive use of lanthanide elements in the medical, electrical, agricultural, and nuclear fields has increased their contamination in the environment. The detrimental effect of lanthanides on human health can be reduced or eliminated by their fast determination in the concerned specimen. For this purpose, an offline conjugation of the cloud point extraction (CPE) process with total reflection X-ray fluorescence (TXRF) spectrometry was done. This process was found to provide simple, quick, and precise simultaneous determination of ten lanthanides whose emission lines have a high degree of overlap at the ultratrace level. N,N,N',N'-tetra-octyl-diglycolamide in triton X-114 micelles was found to offer a selective CPE of all of the lanthanides in the presence of higher concentrations of naturally abundant cations and anions. A multivariative partial least-squares regression (PLSR) calibration approach was preferred due to the complex overlapped spectra of L lines of the lanthanides. Ten lanthanides, viz., La, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Tm, and Lu, were simultaneously determined by this method, having concentrations in the range from 10 to 5 × 103 μg L-1. The proposed method was validated by analyzing three certified reference materials (CRMs), viz., NASS-7 seawater, SRLS-6 river water, and NIST 1640a natural water, via standard addition with the relative standard deviations of ≤10%.

A highly sensitive method for uranium quantification in water samples at ultra-trace level by total reflection X-ray fluorescence, after its direct pre-concentration on the surface of amidoxime functionalized quartz sample supports

In this work we have developed a Total reflection X-Ray Fluorescence (TXRF) based methodology for the determination of uranium in natural water samples at ultra-trace concentration level. The methodology involves functionalization of quartz sample supports used for TXRF measurements with (3-Amidoxy) triethoxysilane, which has very high uranium uptake efficiency. (3-Amidoxy) triethoxysilane has been synthesized from (3-Cyanopropyl) triethoxysilane (CPTS). This amidoxime functionalized sample supports, simply needed to be dipped in the uranium solution for 3 h after which, it can be directly taken for TXRF measurements. The developed methodology is very fast, simple with less sample preparation steps involved. The present work utilizes Rayleigh scattered peak to construct the calibration curve for the quantification purpose. The developed methodology has improved accuracy as well as precision for the quantification of uranium at such low concentrations level. The detection limit and accuracy obtained are 0.013 ng/mL (13 ppt) and 1.9%, respectively which are the lowest using any X-Ray Fluorescence based method, to the best of our knowledge. The method was successfully applied for the U determination in natural water samples like ground water, river water and sea water.

Direct Multielemental Trace Determinations in Plutonium Samples by Total Reflection X-ray Fluorescence Spectrometry Using a Very Small Sample Amount

A simple, safe, and sensitive method for direct multielemental trace determinations in plutonium samples using total reflection X-ray fluorescence (TXRF) spectrometry has been developed. A very small volume (2 μL) of the sample solutions was deposited on TXRF supports after separation of the plutonium matrix from these solutions. Since the amount of the plutonium deposited on the supports was in the ng level only fixed on the supports and the specimen spots were not disturbed during the sample preparation, the samples could be analyzed directly without putting the instrument in a glovebox. This approach avoided a cumbersome operation of the instrument in a glovebox, which is normally utilized for Pu-based samples using other techniques. Similarly, the requirement of small amounts of the samples minimized the radiation dose to the operator as well as a cumbersome problem of management of radioactive analytical waste of plutonium samples. The samples were analyzed using the TXRF spectra of the specimens, concentration of the internal standard Se or Ga and predetermined sensitivity values. The elemental detection limits for the elements K-Sr varied from 1.06 to 0.09 ng. The elements K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, Sr, Ba, Tl, and Pb were analyzed at μg/mL level. The analytical results of TXRF determinations showed average relative standard deviation (RSD) value of 4.5% (1σ, n = 3) and the TXRF determined results deviated from the expected values by 5.9% on average for samples prepared by adding multielements in plutonium solutions. Two real plutonium samples were also analyzed in similar manner. For the real plutonium sample solution the average RSD values of TXRF determinations were 10.6% (1σ, n = 3) for the elemental concentrations in the range of 0.2 to 61 μg/mL. These values are comparable with conventional trace element analytical techniques with added advantages mentioned above.

Dual energy-band excitation from a low power Rh anode X-ray tube for the simultaneous determination of low Z and high Z elements (Na-U) using total-reflection X-ray fluorescence analysis (TXRF)

This article presents results from an experimental setup for a dual energy-band vacuum spectrometer for total-reflection X-ray fluorescence analysis allowing simultaneous efficient excitation of low, medium, and high Z elements. The spectrometer is equipped with an air-cooled 35 W low power Rh X-ray tube and a 17 mm² silicon drift detector with a thin 8 µm beryllium window. A Pd/B₄C multilayer monochromator is used at the same time as a Bragg reflector for Rh-Kα radiation and as a high-energy cut-off reflector above 5 keV, where the characteristic Rh-L radiation is totally reflected and present in the spectrum of the exciting radiation. This leaves one broad low energy band below 5 keV and one high energy band around the energy of Rh-Kα. As Rh-L radiation would be absorbed on its path through air, a new beam entrance system was designed in order to guide the Rh-L photons into the vacuum chamber for efficient excitation of low Z elements. With this setup, elements down to sodium (Z = 11, E = 1.04 keV) could be detected. First results are presented, and spectra obtained in air as well as in vacuum are compared and discussed. Detection limits in the range of 1000 µg/kg for Na and around 140 µg/kg for Mg were achieved using the NIST SRM 1640 (trace elements in water).