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For: Jungmann-Smith JH, Bergamaschi A, Brückner M, Cartier S, Dinapoli R, Greiffenberg D, Jaggi A, Maliakal D, Mayilyan D, Medjoubi K, Mezza D, Mozzanica A, Ramilli M, Ruder C, Schädler L, Schmitt B, Shi X, Tinti G. Radiation hardness assessment of the charge-integrating hybrid pixel detector JUNGFRAU 1.0 for photon science. Rev Sci Instrum 2015;86:123110. [PMID: 26724009 DOI: 10.1063/1.4938166] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/19/2023]
Number Cited by Other Article(s)
1
Abela R, Beaud P, van Bokhoven JA, Chergui M, Feurer T, Haase J, Ingold G, Johnson SL, Knopp G, Lemke H, Milne CJ, Pedrini B, Radi P, Schertler G, Standfuss J, Staub U, Patthey L. Perspective: Opportunities for ultrafast science at SwissFEL. STRUCTURAL DYNAMICS (MELVILLE, N.Y.) 2017;4:061602. [PMID: 29376109 PMCID: PMC5758366 DOI: 10.1063/1.4997222] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/22/2017] [Accepted: 10/17/2017] [Indexed: 05/03/2023]
2
SwissFEL: The Swiss X-ray Free Electron Laser. APPLIED SCIENCES-BASEL 2017. [DOI: 10.3390/app7070720] [Citation(s) in RCA: 93] [Impact Index Per Article: 13.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/17/2022]
3
Holler M, Guizar-Sicairos M, Tsai EHR, Dinapoli R, Müller E, Bunk O, Raabe J, Aeppli G. High-resolution non-destructive three-dimensional imaging of integrated circuits. Nature 2017;543:402-406. [DOI: 10.1038/nature21698] [Citation(s) in RCA: 237] [Impact Index Per Article: 33.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/07/2016] [Accepted: 02/07/2017] [Indexed: 12/20/2022]
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