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For: Musumeci P, Cesar D, Maxson J. Double-shot MeV electron diffraction and microscopy. Struct Dyn 2017;4:044025. [PMID: 28612040 PMCID: PMC5438282 DOI: 10.1063/1.4983390] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/14/2017] [Accepted: 05/01/2017] [Indexed: 06/07/2023]
Number Cited by Other Article(s)
1
Temporal magnification for streaked ultrafast electron diffraction and microscopy. Ultramicroscopy 2019;199:1-6. [PMID: 30711716 DOI: 10.1016/j.ultramic.2019.01.003] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/17/2018] [Revised: 12/10/2018] [Accepted: 01/26/2019] [Indexed: 11/23/2022]
2
Makita M, Vartiainen I, Mohacsi I, Caleman C, Diaz A, Jönsson HO, Juranić P, Medvedev N, Meents A, Mozzanica A, Opara NL, Padeste C, Panneels V, Saxena V, Sikorski M, Song S, Vera L, Willmott PR, Beaud P, Milne CJ, Ziaja-Motyka B, David C. Femtosecond phase-transition in hard x-ray excited bismuth. Sci Rep 2019;9:602. [PMID: 30679456 PMCID: PMC6345934 DOI: 10.1038/s41598-018-36216-3] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/23/2018] [Accepted: 11/14/2018] [Indexed: 11/26/2022]  Open
3
Single-shot real-time sub-nanosecond electron imaging aided by compressed sensing: Analytical modeling and simulation. Micron 2018;117:47-54. [PMID: 30472498 DOI: 10.1016/j.micron.2018.11.003] [Citation(s) in RCA: 19] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/03/2018] [Revised: 11/15/2018] [Accepted: 11/15/2018] [Indexed: 11/20/2022]
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