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For: Dresselhaus JL, Fleckenstein H, Domaracký M, Prasciolu M, Ivanov N, Carnis J, Murray KT, Morgan AJ, Chapman HN, Bajt S. Precise wavefront characterization of x-ray optical elements using a laboratory source. Rev Sci Instrum 2022;93:073704. [PMID: 35922318 DOI: 10.1063/5.0092269] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/22/2022] [Accepted: 06/12/2022] [Indexed: 06/15/2023]
Number Cited by Other Article(s)
1
Dresselhaus JL, Zakharova M, Ivanov N, Fleckenstein H, Prasciolu M, Yefanov O, Li C, Zhang W, Middendorf P, Egorov D, De Gennaro Aquino I, Chapman HN, Bajt S. X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses. OPTICS EXPRESS 2024;32:16004-16015. [PMID: 38859238 DOI: 10.1364/oe.518964] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/15/2024] [Accepted: 04/02/2024] [Indexed: 06/12/2024]
2
Li T, Dresselhaus JL, Ivanov N, Prasciolu M, Fleckenstein H, Yefanov O, Zhang W, Pennicard D, Dippel AC, Gutowski O, Villanueva-Perez P, Chapman HN, Bajt S. Dose-efficient scanning Compton X-ray microscopy. LIGHT, SCIENCE & APPLICATIONS 2023;12:130. [PMID: 37248250 DOI: 10.1038/s41377-023-01176-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Subscribe] [Scholar Register] [Received: 03/02/2023] [Revised: 04/28/2023] [Accepted: 05/05/2023] [Indexed: 05/31/2023]
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