Griffith KS, Gellene GI. A simple method for estimating effective ion source residence time.
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY 1993;
4:787-791. [PMID:
24227463 DOI:
10.1016/1044-0305(93)80036-x]
[Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/16/1993] [Revised: 06/04/1993] [Accepted: 06/08/1993] [Indexed: 06/02/2023]
Abstract
A method is presented that uses the well-understood O2/Ax ion-molecule reaction system to determine the effective ion source residence time of a chemical ionization source. The process consists of: (1) defining the kinetic system in terms of reactions, reaction rates, and ionization cross sections; (2) solving the differential equations that describe the time evolu-tion of the kinetic system, and (3) comparing the calculated results to experimentally measured relative ion intensities. These steps are repeated for a variety of 02/Ar sample ratios and inlet pressures. The method leads to a simple relationship between inlet pressure and effective ion source residence time, independent of the 02/Ar sample ratio.
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