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Vu QTL, Seon G, Ghaffari S, Makeev A, Lachaud F, Charlotte M, Gourinat Y. Evaluating Residual Stress in Carbon Fiber-Reinforced Polymer (CFRP) at Microscale Using Fiber Push-Out Experiment and Finite Element Modeling. Polymers (Basel) 2023; 15:2596. [PMID: 37376242 DOI: 10.3390/polym15122596] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/24/2023] [Revised: 05/28/2023] [Accepted: 05/30/2023] [Indexed: 06/29/2023] Open
Abstract
Microscale residual stress may develop during the manufacturing of Carbon Fiber-Reinforced Polymer (CFRP) composites and negatively affect apparent macroscale mechanical properties. Accordingly, accurately capturing residual stress may be essential in computational methods used for composite material design. This work presents a new data-driven methodology for the evaluation of microscale residual stress in CFRPs using fiber push-out experiments with in situ scanning electron microscopy (SEM) imaging. SEM images reveal significant through-thickness matrix sink-in deformation in resin-rich areas after nearby fibers are pushed out, which is attributed to the release of microscale process-induced residual stress. The sink-in deformation is measured experimentally, and a Finite Element Model Updating (FEMU) method is used to retrieve the associated residual stress. The finite element (FE) analysis includes simulation of the curing process, test sample machining, and fiber push-out experiment. Significant out-of-plane matrix deformation larger than 1% of the specimen thickness is reported and associated with a high level of residual stress in resin-rich areas. This work emphasizes the importance of in situ data-driven characterization for integrated computational materials engineering (ICME) and material design.
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Affiliation(s)
- Quy Tung Linh Vu
- Department of Mechanical and Aerospace Engineering, The University of Texas at Arlington (UTA), 701 S. Nedderman Drive, Arlington, TX 76019, USA
- Institut Clément Ader (ICA), DMSM, ISAE-SUPAERO, 10 Av. Edouard Belin, 31400 Toulouse, France
| | - Guillaume Seon
- Department of Mechanical and Aerospace Engineering, The University of Texas at Arlington (UTA), 701 S. Nedderman Drive, Arlington, TX 76019, USA
| | - Sarvenaz Ghaffari
- Department of Mechanical and Aerospace Engineering, The University of Texas at Arlington (UTA), 701 S. Nedderman Drive, Arlington, TX 76019, USA
| | - Andrew Makeev
- Department of Mechanical and Aerospace Engineering, The University of Texas at Arlington (UTA), 701 S. Nedderman Drive, Arlington, TX 76019, USA
| | - Frédéric Lachaud
- Institut Clément Ader (ICA), DMSM, ISAE-SUPAERO, 10 Av. Edouard Belin, 31400 Toulouse, France
| | - Miguel Charlotte
- Institut Clément Ader (ICA), DMSM, ISAE-SUPAERO, 10 Av. Edouard Belin, 31400 Toulouse, France
| | - Yves Gourinat
- Institut Clément Ader (ICA), DMSM, ISAE-SUPAERO, 10 Av. Edouard Belin, 31400 Toulouse, France
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Suryanto H, Marsyahyo E, Surya Irawan Y, Soenoko R, Aminudin. Improvement of Interfacial Shear Strength of Mendong Fiber ( Fimbristylis globulosa ) Reinforced Epoxy Composite Using the AC Electric Fields. INT J POLYM SCI 2015; 2015:1-10. [DOI: 10.1155/2015/542376] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/07/2023] Open
Abstract
The effects of the AC electric field treatment on the interfacial shear strength of mendong fiber-reinforced epoxy composites were investigated. For this purpose, the epoxy (DGEBA) with a cycloaliphatic amine curing agent was treated by the AC electric field during the curing process. The heat generated during the epoxy polymerization process was monitored. Structure of the epoxy was studied by X-ray diffraction, Fourier transform infrared spectroscopy (FTIR), and Scanning Electron Microscope, respectively. The interfacial shear strength (IFSS) was also measured using a single fiber pull-out test. XRD analyzes indicated that the treatment of AC electric fields was able to form a crystalline phase of epoxy. IFSS of the mendong fiber-reinforced epoxy composites was optimum increased by 38% in the AC electric fields treatment of 750 V/cm.
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Eschbach J, Rouxel D, Vincent B, Mugnier Y, Galez C, Le Dantec R, Bourson P, Krüger J, Elmazria O, Alnot P. Development and characterization of nanocomposite materials. Materials Science and Engineering: C 2007; 27:1260-4. [DOI: 10.1016/j.msec.2006.07.035] [Citation(s) in RCA: 24] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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Duval E, Boukenter A, Achibat T, Champagnon B, Seruchetti J, Dumas J. Structure of silica aerogels and vibrational dynamics in fractal materials and glasses: Electron microscopy and low-frequency Raman scattering. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/13642819208217895] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
Affiliation(s)
- E. Duval
- a Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité de Recherche associée au CNRS 442, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
| | - A. Boukenter
- a Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité de Recherche associée au CNRS 442, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
| | - T. Achibat
- a Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité de Recherche associée au CNRS 442, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
| | - B. Champagnon
- a Laboratoire de Physico-Chimie des Matériaux Luminescents, Unité de Recherche associée au CNRS 442, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
| | - J. Seruchetti
- b Département de Physique des Matériaux , Unité de Recherche associée au CNRS 172, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
| | - J. Dumas
- b Département de Physique des Matériaux , Unité de Recherche associée au CNRS 172, Université Lyon I , Campus de La Doua, F-69622 , Villeurbanne , France
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Boukenter A, Champagnon B, Duval E, Rousset JL, Rosenberg HM. Low-frequency Raman scattering from disordered or heterogeneous materials. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/13642818908208451] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
Affiliation(s)
- A. Boukenter
- a Physico-Chimie des Mattéiaux Luminescents (Unité associé au CNRS 442) , Université Lyon I , 69622 , Villeurbanne , France
| | - B. Champagnon
- a Physico-Chimie des Mattéiaux Luminescents (Unité associé au CNRS 442) , Université Lyon I , 69622 , Villeurbanne , France
| | - E. Duval
- a Physico-Chimie des Mattéiaux Luminescents (Unité associé au CNRS 442) , Université Lyon I , 69622 , Villeurbanne , France
| | - J. L. Rousset
- a Physico-Chimie des Mattéiaux Luminescents (Unité associé au CNRS 442) , Université Lyon I , 69622 , Villeurbanne , France
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Affiliation(s)
- V. Z. Gochiyaev
- a Institute of Automation and Electrometry, Siberian Branch of the U.S.S.R. Academy of Sciences , 630090 , Novosibirsk , U.S.S.R
| | - V. K. Malinovsky
- a Institute of Automation and Electrometry, Siberian Branch of the U.S.S.R. Academy of Sciences , 630090 , Novosibirsk , U.S.S.R
| | - V. N. Novikov
- a Institute of Automation and Electrometry, Siberian Branch of the U.S.S.R. Academy of Sciences , 630090 , Novosibirsk , U.S.S.R
| | - A. P. Sokolov
- a Institute of Automation and Electrometry, Siberian Branch of the U.S.S.R. Academy of Sciences , 630090 , Novosibirsk , U.S.S.R
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Boukenter A, Champagnon B, Duval E, Rousset JL, Dumas J, Serughetti J. Vibrational modes in silica aerogels: low-frequency Raman scattering. ACTA ACUST UNITED AC 2000. [DOI: 10.1088/0022-3719/21/34/001] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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Ivanda M, Hartmann I, Kiefer W. Boson peak in the Raman spectra of amorphous gallium arsenide: Generalization to amorphous tetrahedral semiconductors. Phys Rev B Condens Matter 1995; 51:1567-1574. [PMID: 9978873 DOI: 10.1103/physrevb.51.1567] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Achibat T, Boukenter A, Duval E, Lorentz G, Etienne S. Low‐frequency Raman scattering and structure of amorphous polymers: Stretching effect. J Chem Phys 1991. [DOI: 10.1063/1.460896] [Citation(s) in RCA: 47] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Open
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Grace JM, Anderson AC. Low-temperature specific heat and thermal conductivity of a glassy polymer under applied pressure. Phys Rev B Condens Matter 1989; 40:1901-1917. [PMID: 9992052 DOI: 10.1103/physrevb.40.1901] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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