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For: Akimoto K, Emoto T. Quantitative strain analysis of surfaces and interfaces using extremely asymmetric x-ray diffraction. J Phys Condens Matter 2010;22:473001. [PMID: 21386607 DOI: 10.1088/0953-8984/22/47/473001] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
Number Cited by Other Article(s)
1
Wang Z, Lin H, Zhang X, Li J, Chen X, Wang S, Gong W, Yan H, Zhao Q, Lv W, Gong X, Xiao Q, Li F, Ji D, Zhang X, Dong H, Li L, Hu W. Revealing molecular conformation-induced stress at embedded interfaces of organic optoelectronic devices by sum frequency generation spectroscopy. SCIENCE ADVANCES 2021;7:7/16/eabf8555. [PMID: 33853785 PMCID: PMC8050595 DOI: 10.1126/sciadv.abf8555] [Citation(s) in RCA: 15] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/26/2020] [Accepted: 02/25/2021] [Indexed: 05/28/2023]
2
Behavior of Peak Intensity of Rocking Curve for Asymmetric Bragg Reflection Uniquely Determined by Strain Distribution. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2013. [DOI: 10.1380/ejssnt.2013.127] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
3
Mesoscopic-Scale and Small Strain Field beneath SiO2/Si Interface Revealed by a Multiple-Wave X-ray Diffraction Phenomenon - Depth of the Strain Field. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2011. [DOI: 10.1380/ejssnt.2011.47] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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