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Stolz M. The Revolution in Breast Cancer Diagnostics: From Visual Inspection of Histopathology Slides to Using Desktop Tissue Analysers for Automated Nanomechanical Profiling of Tumours. Bioengineering (Basel) 2024; 11:237. [PMID: 38534510 DOI: 10.3390/bioengineering11030237] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/06/2024] [Revised: 02/26/2024] [Accepted: 02/27/2024] [Indexed: 03/28/2024] Open
Abstract
We aim to develop new portable desktop tissue analysers (DTAs) to provide fast, low-cost, and precise test results for fast nanomechanical profiling of tumours. This paper will explain the reasoning for choosing indentation-type atomic force microscopy (IT-AFM) to reveal the functional details of cancer. Determining the subtype, cancer stage, and prognosis will be possible, which aids in choosing the best treatment. DTAs are based on fast IT-AFM at the size of a small box that can be made for a low budget compared to other clinical imaging tools. The DTAs can work in remote areas and all parts of the world. There are a number of direct benefits: First, it is no longer needed to wait a week for the pathology report as the test will only take 10 min. Second, it avoids the complicated steps of making histopathology slides and saves costs of labour. Third, computers and robots are more consistent, more reliable, and more economical than human workers which may result in fewer diagnostic errors. Fourth, the IT-AFM analysis is capable of distinguishing between various cancer subtypes. Fifth, the IT-AFM analysis could reveal new insights about why immunotherapy fails. Sixth, IT-AFM may provide new insights into the neoadjuvant treatment response. Seventh, the healthcare system saves money by reducing diagnostic backlogs. Eighth, the results are stored on a central server and can be accessed to develop strategies to prevent cancer. To bring the IT-AFM technology from the bench to the operation theatre, a fast IT-AFM sensor needs to be developed and integrated into the DTAs.
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Affiliation(s)
- Martin Stolz
- National Centre for Advanced Tribology at Southampton, Faculty of Engineering and Physical Sciences, University of Southampton, Southampton SO17 1BJ, UK
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2
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Roos AK, Scarano E, Arvidsson EK, Holmgren E, Haviland DB. Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2024; 15:242-255. [PMID: 38379930 PMCID: PMC10877079 DOI: 10.3762/bjnano.15.23] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/23/2023] [Accepted: 01/31/2024] [Indexed: 02/22/2024]
Abstract
We describe a transducer for low-temperature atomic force microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever) whose deflection is measured via a shift in the resonant frequency of a high-Q superconducting microwave resonator at 4.5 GHz. We present design simulations including mechanical finite-element modeling of surface strain and electromagnetic simulations of meandering nanowires with large kinetic inductance. We discuss a lumped-element model of the force sensor and describe the role of an additional shunt inductance for tuning the coupling to the transmission line used to measure the microwave resonance. A detailed description of our fabrication is presented, including information about the process parameters used for each layer. We also discuss the fabrication of sharp tips on the cantilever using focused electron beam-induced deposition of platinum. Finally, we present measurements that characterize the spread of mechanical resonant frequency, the temperature dependence of the microwave resonance, and the sensor's operation as an electromechanical transducer of force.
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Affiliation(s)
- August K Roos
- Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvéns väg 12, SE-114 19 Stockholm, Sweden
| | - Ermes Scarano
- Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvéns väg 12, SE-114 19 Stockholm, Sweden
| | - Elisabet K Arvidsson
- Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvéns väg 12, SE-114 19 Stockholm, Sweden
| | - Erik Holmgren
- Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvéns väg 12, SE-114 19 Stockholm, Sweden
| | - David B Haviland
- Department of Applied Physics, KTH Royal Institute of Technology, Hannes Alfvéns väg 12, SE-114 19 Stockholm, Sweden
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Winkler R, Brugger-Hatzl M, Seewald LM, Kuhness D, Barth S, Mairhofer T, Kothleitner G, Plank H. Additive Manufacturing of Co 3Fe Nano-Probes for Magnetic Force Microscopy. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:1217. [PMID: 37049311 PMCID: PMC10097098 DOI: 10.3390/nano13071217] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/03/2023] [Revised: 03/23/2023] [Accepted: 03/27/2023] [Indexed: 06/19/2023]
Abstract
Magnetic force microscopy (MFM) is a powerful extension of atomic force microscopy (AFM), which mostly uses nano-probes with functional coatings for studying magnetic surface features. Although well established, additional layers inherently increase apex radii, which reduce lateral resolution and also contain the risk of delamination, rendering such nano-probes doubtful or even useless. To overcome these limitations, we now introduce the additive direct-write fabrication of magnetic nano-cones via focused electron beam-induced deposition (FEBID) using an HCo3Fe(CO)12 precursor. The study first identifies a proper 3D design, confines the most relevant process parameters by means of primary electron energy and beam currents, and evaluates post-growth procedures as well. That way, highly crystalline nano-tips with minimal surface contamination and apex radii in the sub-15 nm regime are fabricated and benchmarked against commercial products. The results not only reveal a very high performance during MFM operation but in particular demonstrate virtually loss-free behavior after almost 8 h of continuous operation, thanks to the all-metal character. Even after more than 12 months of storage in ambient conditions, no performance loss is observed, which underlines the high overall performance of the here-introduced FEBID-based Co3Fe MFM nano-probes.
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Affiliation(s)
- Robert Winkler
- Christian Doppler Laboratory—DEFINE, Graz University of Technology, 8010 Graz, Austria
| | | | | | - David Kuhness
- Christian Doppler Laboratory—DEFINE, Graz University of Technology, 8010 Graz, Austria
| | - Sven Barth
- Institute of Physics, Goethe University, 60438 Frankfurt, Germany
- Institute for Inorganic and Analytical Chemistry, Goethe University Frankfurt, Max-von-Laue-Str. 7, 60438 Frankfurt, Germany
| | - Thomas Mairhofer
- Institute of Electron Microscopy, Graz University of Technology, 8010 Graz, Austria
| | - Gerald Kothleitner
- Graz Centre for Electron Microscopy, 8010 Graz, Austria
- Institute of Electron Microscopy, Graz University of Technology, 8010 Graz, Austria
| | - Harald Plank
- Christian Doppler Laboratory—DEFINE, Graz University of Technology, 8010 Graz, Austria
- Graz Centre for Electron Microscopy, 8010 Graz, Austria
- Institute of Electron Microscopy, Graz University of Technology, 8010 Graz, Austria
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Plank H, Winkler R, Schwalb CH, Hütner J, Fowlkes JD, Rack PD, Utke I, Huth M. Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review. MICROMACHINES 2019; 11:E48. [PMID: 31906005 PMCID: PMC7019982 DOI: 10.3390/mi11010048] [Citation(s) in RCA: 47] [Impact Index Per Article: 7.8] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/29/2019] [Revised: 12/20/2019] [Accepted: 12/20/2019] [Indexed: 11/17/2022]
Abstract
Scanning probe microscopy (SPM) has become an essential surface characterization technique in research and development. By concept, SPM performance crucially depends on the quality of the nano-probe element, in particular, the apex radius. Now, with the development of advanced SPM modes beyond morphology mapping, new challenges have emerged regarding the design, morphology, function, and reliability of nano-probes. To tackle these challenges, versatile fabrication methods for precise nano-fabrication are needed. Aside from well-established technologies for SPM nano-probe fabrication, focused electron beam-induced deposition (FEBID) has become increasingly relevant in recent years, with the demonstration of controlled 3D nanoscale deposition and tailored deposit chemistry. Moreover, FEBID is compatible with practically any given surface morphology. In this review article, we introduce the technology, with a focus on the most relevant demands (shapes, feature size, materials and functionalities, substrate demands, and scalability), discuss the opportunities and challenges, and rationalize how those can be useful for advanced SPM applications. As will be shown, FEBID is an ideal tool for fabrication / modification and rapid prototyping of SPM-tipswith the potential to scale up industrially relevant manufacturing.
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Affiliation(s)
- Harald Plank
- Christian Doppler Laboratory for Direct–Write Fabrication of 3D Nano–Probes (DEFINE), Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria;
- Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria
- Graz Centre for Electron Microscopy, 8010 Graz, Austria
| | - Robert Winkler
- Christian Doppler Laboratory for Direct–Write Fabrication of 3D Nano–Probes (DEFINE), Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria;
| | | | - Johanna Hütner
- GETec Microscopy GmbH, 1220 Vienna, Austria; (C.H.S.); (J.H.)
| | - Jason D. Fowlkes
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA; (J.D.F.); (P.D.R.)
- Materials Science and Engineering, The University of Tennessee, Knoxville, Knoxville, TN 37996, USA
| | - Philip D. Rack
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA; (J.D.F.); (P.D.R.)
- Materials Science and Engineering, The University of Tennessee, Knoxville, Knoxville, TN 37996, USA
| | - Ivo Utke
- Mechanics of Materials and Nanostructures Laboratory, Empa-Swiss Federal Laboratories for Materials Science and Technology, Feuerwerkerstrasse 39, 3602 Thun, Switzerland;
| | - Michael Huth
- Physics Institute, Goethe University Frankfurt, 60323 Frankfurt am Main, Germany;
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Qian W, Sun S, Song J, Nguyen C, Ducharme S, Turner JA. Focused electron-beam-induced deposition for fabrication of highly durable and sensitive metallic AFM-IR probes. NANOTECHNOLOGY 2018; 29:335702. [PMID: 29790858 DOI: 10.1088/1361-6528/aac73c] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
We report on the fabrication of metallic, ultra-sharp atomic force microscope tips for localized nanoscale infrared (IR) spectrum measurements by using focused electron-beam-induced deposition of platinum or tungsten. The tip length can be controlled by changing the duration time of the electron beam. Probes of 12.0 ± 5.0 nm radius-of-curvature can be routinely produced with high repeatability and near-100% yield. The near-field-enhancement appears stronger at the extremity of the metallic tip, compared with commercial pristine silicon-nitride probe tip. Finally, the performance of the modified metallic tips is demonstrated by imaging PVDF and PMMA thin films, which shows that spatial resolution is greatly enhanced. In addition, the signal intensity of the localized nanoscale IR spectrum is increased offering greater sensitivity for chemical IR imaging.
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Affiliation(s)
- Wen Qian
- Department of Mechanical & Materials Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska NE, United States of America
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Janbaz S, Noordzij N, Widyaratih DS, Hagen CW, Fratila-Apachitei LE, Zadpoor AA. Origami lattices with free-form surface ornaments. SCIENCE ADVANCES 2017; 3:eaao1595. [PMID: 29209661 PMCID: PMC5710187 DOI: 10.1126/sciadv.aao1595] [Citation(s) in RCA: 24] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/20/2017] [Accepted: 11/06/2017] [Indexed: 05/21/2023]
Abstract
Lattice structures are used in the design of metamaterials to achieve unusual physical, mechanical, or biological properties. The properties of such metamaterials result from the topology of the lattice structures, which are usually three-dimensionally (3D) printed. To incorporate advanced functionalities into metamaterials, the surface of the lattice structures may need to be ornamented with functionality-inducing features, such as nanopatterns or electronic devices. Given our limited access to the internal surfaces of lattice structures, free-form ornamentation is currently impossible. We present lattice structures that are folded from initially flat states and show that they could bear arbitrarily complex surface ornaments at different scales. We identify three categories of space-filling polyhedra as the basic unit cells of the cellular structures and, for each of those, propose a folding pattern. We also demonstrate "sequential self-folding" of flat constructs to 3D lattices. Furthermore, we folded auxetic mechanical metamaterials from flat sheets and measured the deformation-driven change in their negative Poisson's ratio. Finally, we show how free-form 3D ornaments could be applied on the surface of flat sheets with nanometer resolution. Together, these folding patterns and experimental techniques present a unique platform for the fabrication of metamaterials with unprecedented combination of physical properties and surface-driven functionalities.
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Affiliation(s)
- Shahram Janbaz
- Additive Manufacturing Laboratory, Department of Biomechanical Engineering, Delft University of Technology (TU Delft), Mekelweg 2, Delft 2628CD, Netherlands
| | - Niels Noordzij
- Department of Imaging Physics, Faculty of Applied Physics, Delft University of Technology (TU Delft), Lorentzweg 1, Delft 2628CJ, Netherlands
| | - Dwisetya S. Widyaratih
- Additive Manufacturing Laboratory, Department of Biomechanical Engineering, Delft University of Technology (TU Delft), Mekelweg 2, Delft 2628CD, Netherlands
| | - Cornelis W. Hagen
- Department of Imaging Physics, Faculty of Applied Physics, Delft University of Technology (TU Delft), Lorentzweg 1, Delft 2628CJ, Netherlands
| | - Lidy E. Fratila-Apachitei
- Additive Manufacturing Laboratory, Department of Biomechanical Engineering, Delft University of Technology (TU Delft), Mekelweg 2, Delft 2628CD, Netherlands
| | - Amir A. Zadpoor
- Additive Manufacturing Laboratory, Department of Biomechanical Engineering, Delft University of Technology (TU Delft), Mekelweg 2, Delft 2628CD, Netherlands
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Wang P, Michael A, Kwok CY. High aspect ratio sharp nanotip for nanocantilever integration at CMOS compatible temperature. NANOTECHNOLOGY 2017; 28:32LT01. [PMID: 28718454 DOI: 10.1088/1361-6528/aa7a54] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
In this paper, we demonstrate a novel low temperature nanofabrication approach that enables the formation of ultra-sharp high aspect ratio (HAR) and high density nanotip structures and their integration onto nanoscale cantilever beams. The nanotip structure consists of a nanoscale thermally evaporated Cr Spindt tip on top of an amorphous silicon rod. An apex radius of the tip, as small as 2.5 nm, has been achieved, and is significantly smaller than any other Spindt tips reported so far. 100 nm wide tips with aspect ratio of more than 50 and tip density of more than 5 × 109 tips cm-2 have been fabricated. The HAR tips have been integrated onto an array of 460 nm wide cantilever beams with high precision and yield. In comparison with other approaches, this approach allows the integration of HAR sharp nanotips with nano-mechanical structures in a parallel and CMOS compatible fashion for the first time to our knowledge. Potential applications include on-chip high-speed atomic force microscopy and field emission devices.
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Affiliation(s)
- P Wang
- The University of New South Wales, Sydney, NSW, Australia
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8
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Shen Y, Zhang Z, Fukuda T. Bending spring rate investigation of nanopipette for cell injection. NANOTECHNOLOGY 2015; 26:155702. [PMID: 25797950 DOI: 10.1088/0957-4484/26/15/155702] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Bending of nanopipette tips during cell penetration is a major cause of cell injection failure. However, the flexural rigidity of nanopipettes is little known due to their irregular structure. In this paper, we report a quantitative method to estimate the flexural rigidity of a nanopipette by investigating its bending spring rate. First nanopipettes with a tip size of 300 nm are fabricated from various glass tubes by laser pulling followed by focused ion beam (FIB) milling. Then the bending spring rate of the nanopipettes is investigated inside a scanning electron microscope (SEM). Finally, a yeast cell penetration test is performed on these nanopipettes, which have different bending spring rates. The results show that nanopipettes with a higher bending spring rate have better cell penetration capability, which confirms that the bending spring rate may well reflect the flexural rigidity of a nanopipette. This method provides a quantitative parameter for characterizing the mechanical property of a nanopipette that can be potentially taken as a standard specification in the future. This general method can also be used to estimate other one-dimensional structures for cell injection, which will greatly benefit basic cell biology research and clinical applications.
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Affiliation(s)
- Yajing Shen
- Department of Mechanical and Biomedical Engineering, City University of Hong Kong, Hong Kong, People's Republic of China
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9
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Beard JD, Aleksandrov S, Walker CH, Wolverson D, Mitchels JM, Gordeev SN. Magnetically enhanced plasma coating of nanostructures with ultrathin diamond-like carbon films. RSC Adv 2014. [DOI: 10.1039/c4ra02841d] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
Coating using magnetically enhanced plasma deposition gives smooth diamond-like carbon films that increase hardness and wear resistance of nanostructures.
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Affiliation(s)
- J. D. Beard
- Department of Physics
- University of Bath
- Bath, UK
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10
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Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum. Ultramicroscopy 2013; 133:62-6. [DOI: 10.1016/j.ultramic.2013.05.005] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/31/2011] [Revised: 04/30/2013] [Accepted: 05/13/2013] [Indexed: 11/22/2022]
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Beard JD, Guy RH, Gordeev SN. Mechanical Tomography of Human Corneocytes with a Nanoneedle. J Invest Dermatol 2013; 133:1565-71. [DOI: 10.1038/jid.2012.465] [Citation(s) in RCA: 25] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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