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For: Paul P, Knoll AW, Holzner F, Duerig U. Field stitching in thermal probe lithography by means of surface roughness correlation. Nanotechnology 2012;23:385307. [PMID: 22948486 DOI: 10.1088/0957-4484/23/38/385307] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Number Cited by Other Article(s)
1
Das T, Smith JD, Uddin MH, Dagastine RR. Anisotropic Particle Fabrication Using Thermal Scanning Probe Lithography. ACS APPLIED MATERIALS & INTERFACES 2022;14:19878-19888. [PMID: 35451830 DOI: 10.1021/acsami.2c02885] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
2
Chemical carving lithography with scanning catalytic probes. Sci Rep 2020;10:13411. [PMID: 32770060 PMCID: PMC7415144 DOI: 10.1038/s41598-020-70407-1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/21/2019] [Accepted: 05/26/2020] [Indexed: 11/09/2022]  Open
3
Howell ST, Grushina A, Holzner F, Brugger J. Thermal scanning probe lithography-a review. MICROSYSTEMS & NANOENGINEERING 2020;6:21. [PMID: 34567636 PMCID: PMC8433166 DOI: 10.1038/s41378-019-0124-8] [Citation(s) in RCA: 37] [Impact Index Per Article: 9.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/12/2019] [Revised: 11/05/2019] [Accepted: 11/25/2019] [Indexed: 05/08/2023]
4
Xu K, Chen J. High-resolution scanning probe lithography technology: a review. APPLIED NANOSCIENCE 2019. [DOI: 10.1007/s13204-019-01229-5] [Citation(s) in RCA: 29] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/12/2022]
5
Thermal scanning probe lithography. ACTA ACUST UNITED AC 2016. [DOI: 10.1016/b978-0-08-100354-1.00016-8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
6
Garcia R, Knoll AW, Riedo E. Advanced scanning probe lithography. NATURE NANOTECHNOLOGY 2014;9:577-87. [PMID: 25091447 DOI: 10.1038/nnano.2014.157] [Citation(s) in RCA: 252] [Impact Index Per Article: 25.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/03/2014] [Accepted: 07/04/2014] [Indexed: 05/24/2023]
7
Cheong LL, Paul P, Holzner F, Despont M, Coady DJ, Hedrick JL, Allen R, Knoll AW, Duerig U. Thermal probe maskless lithography for 27.5 nm half-pitch Si technology. NANO LETTERS 2013;13:4485-91. [PMID: 23965001 DOI: 10.1021/nl4024066] [Citation(s) in RCA: 26] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
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