Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001)

How Precisely Can Individual Molecules Be Analyzed? A Case Study on Locally Quantifying Forces and Energies Using Scanning Probe Microscopy

Recent advances in scanning probe microscopy methodology have enabled the measurement of tip-sample interactions with picometer accuracy in all three spatial dimensions, thereby providing a detailed site-specific and distance-dependent picture of the related properties. This paper explores the degree of detail and accuracy that can be achieved in locally quantifying probe-molecule interaction forces and energies for adsorbed molecules. Toward this end, cobalt phthalocyanine (CoPc), a promising CO2 reduction catalyst, was studied on Ag(111) as a model system using low-temperature, ultrahigh vacuum noncontact atomic force microscopy. Data were recorded as a function of distance from the surface, from which detailed three-dimensional maps of the molecule's interaction with the tip for normal and lateral forces as well as the tip-molecule interaction potential were constructed. The data were collected with a CO molecule at the tip apex, which enabled a detailed visualization of the atomic structure. Determination of the tip-substrate interaction as a function of distance allowed isolation of the molecule-tip interactions; when analyzing these in terms of a Lennard-Jones-type potential, the atomically resolved equilibrium interaction energies between the CO tethered to the tip and the CoPc molecule could be recovered. Interaction energies peaked at less than 160 meV, indicating a physisorption interaction. As expected, the interaction was weakest at the aromatic hydrogens around the periphery of the molecule and strongest surrounding the metal center. The interaction, however, did not peak directly above the Co atom but rather in pockets surrounding it.

Torsional and lateral eigenmode oscillations for atomic resolution imaging of HOPG in air under ambient conditions

Combined in-plane and out-of-plane multifrequency atomic force microscopy techniques have been demonstrated to be important tools to decipher spatial differences of sample surfaces at the atomic scale. The analysis of physical properties perpendicular to the sample surface is routinely achieved from flexural cantilever oscillations, whereas the interpretation of in-plane sample properties via force microscopy is still challenging. Besides the torsional oscillation, there is the additional option to exploit the lateral oscillation of the cantilever for in-plane surface analysis. In this study, we used different multifrequency force microscopy approaches to attain better understanding of the interactions between a super-sharp tip and an HOPG surface focusing on the discrimination between friction and shear forces. We found that the lateral eigenmode is suitable for the determination of the shear modulus whereas the torsional eigenmode provides information on local friction forces between tip and sample. Based on the results, we propose that the full set of elastic constants of graphite can be determined from combined in-plane and out-of-plane multifrequency atomic force microscopy if ultrasmall amplitudes and high force constants are used.