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For: Lv Y, Cui J, Jiang ZM, Yang XJ. Composition and conductance distributions of single GeSi quantum rings studied by conductive atomic force microscopy combined with selective chemical etching. Nanotechnology 2013;24:065702. [PMID: 23324538 DOI: 10.1088/0957-4484/24/6/065702] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]

For:	Lv Y, Cui J, Jiang ZM, Yang XJ. Composition and conductance distributions of single GeSi quantum rings studied by conductive atomic force microscopy combined with selective chemical etching. Nanotechnology 2013;24:065702. [PMID: 23324538 DOI: 10.1088/0957-4484/24/6/065702] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]

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Cited by Other Article(s)

Zhong J, Yan J. Seeing is believing: atomic force microscopy imaging for nanomaterial research. RSC Adv 2016. [DOI: 10.1039/c5ra22186b] [Citation(s) in RCA: 33] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/01/2023] Open