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Ootsuki S, Ikeno H, Umeda Y, Yonezawa Y, Moriwake H, Kuwabara A, Kido O, Ueda S, Tanaka I, Fujikawa Y, Mizoguchi T. Impact of local strain on Ti-L2,3electron energy-loss near-edge structures of BaTiO3: a first-principles multiplet study. Microscopy (Oxf) 2014; 63:249-54. [PMID: 24737830 DOI: 10.1093/jmicro/dfu011] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Affiliation(s)
- Shirou Ootsuki
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan Institute of Industrial Science, The University of Tokyo 4-6-1, Komaba, Meguro, Tokyo 153-8505, Japan
| | - Hidekazu Ikeno
- Nanoscience and Nanotechnology Research Center, Research Organization for 21st Century, Osaka Prefecture University, 1-2 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8570, Japan
| | - Yuji Umeda
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Yu Yonezawa
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Hiroki Moriwake
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan
| | - Akihide Kuwabara
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan
| | - Osamu Kido
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Satoko Ueda
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Isao Tanaka
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan Department of Materials Science and Engineering, Kyoto University, Yoshida, Sakyo, Kyoto 606-8501, Japan
| | - Yoshinori Fujikawa
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Teruyasu Mizoguchi
- Institute of Industrial Science, The University of Tokyo 4-6-1, Komaba, Meguro, Tokyo 153-8505, Japan
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Ricolleau C, Nelayah J, Oikawa T, Kohno Y, Braidy N, Wang G, Hue F, Florea L, Pierron Bohnes V, Alloyeau D. Performances of an 80-200 kV microscope employing a cold-FEG and an aberration-corrected objective lens. Microscopy (Oxf) 2012; 62:283-93. [PMID: 23160361 DOI: 10.1093/jmicro/dfs072] [Citation(s) in RCA: 38] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Abstract
The performances of a newly developed 80-200 kV cold field emission gun (CFEG) transmission electron microscope (TEM) integrating a spherical aberration corrector for a TEM image-forming lens have been evaluated. To begin, we show that the stability of both emission and probe currents makes use of this new CFEG much friendlier. The energy spread of electrons emitted from the CFEG has been measured as a function of emission current and shows a very last 0.26 eV energy resolution at 200 kV and even 0.23 eV at 80 kV. The combination of the CFEG and the CEOS™ aberration corrector, associated with enhanced mechanical and electrical stabilities of this new microscope, allows reaching an information transfer below 75 pm at 200 and 80 pm at 80 kV. This unseen resolution at 200 kV has allowed us to study the structure of CoPt nanoparticles by observing direct images of their atomic arrangement along the high indexes zone axis. We have evidenced the presence of defects in these nanostructures that are not parallel to the electron beam. The precise stoichiometry of two iron oxides, FeO and Fe2O3, has been determined from an analysis of iron valence state that was obtained from a direct analysis of EELS fine structures spectrum of the two oxides.
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Affiliation(s)
- Christian Ricolleau
- Laboratoire Matériaux et Phénomènes Quantiques, Université Paris 7/CNRS, UMR 7162, Case 7021, 75205 Paris Cedex 13, France.
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Alloyeau D. Transmission Electron Microscopy: A Multifunctional Tool for the Atomic-scale Characterization of Nanoalloys. NANOALLOYS 2012. [DOI: 10.1007/978-1-4471-4014-6_4] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
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