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For: Bright AN, Sharma N, Humphreys CJ. Analysis of contacts and V-defects in GaN device structures by transmission electron microscopy. QJM 2001;50:489-95. [PMID: 11918415 DOI: 10.1093/jmicro/50.6.489] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Submit a Manuscript] [Subscribe] [Scholar Register] [Indexed: 04/18/2023] Open

For:	Bright AN, Sharma N, Humphreys CJ. Analysis of contacts and V-defects in GaN device structures by transmission electron microscopy. QJM 2001;50:489-95. [PMID: 11918415 DOI: 10.1093/jmicro/50.6.489] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Submit a Manuscript] [Subscribe] [Scholar Register] [Indexed: 04/18/2023] Open

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(The first 100,000 artilces are displayed in RCA.)