• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (5075827)   Today's Articles (43)
For: Morikawa D, Ageishi M, Sato K, Tsuda K, Terauchi M. Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction. Microscopy (Oxf) 2021;70:394-397. [PMID: 33449081 DOI: 10.1093/jmicro/dfab002] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/23/2020] [Revised: 01/05/2021] [Accepted: 01/14/2021] [Indexed: 11/13/2022]  Open
Number Cited by Other Article(s)
1
Kobayashi K, Kizu R. Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV. Ultramicroscopy 2023;256:113876. [PMID: 37890437 DOI: 10.1016/j.ultramic.2023.113876] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/08/2023] [Revised: 10/12/2023] [Accepted: 10/21/2023] [Indexed: 10/29/2023]
2
Kobayashi K, Misumi I, Yamamoto K. Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens. Ultramicroscopy 2022;238:113537. [DOI: 10.1016/j.ultramic.2022.113537] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/05/2022] [Revised: 04/15/2022] [Accepted: 04/23/2022] [Indexed: 10/18/2022]
PrevPage 1 of 1 1Next
© 2004-2025 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA