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Sarkar M, Adams F, Dar SA, Penn J, Ji Y, Gundimeda A, Zhu T, Liu C, Hirshy H, Massabuau FCP, O'Hanlon T, Kappers MJ, Ghosh S, Kusch G, Oliver RA. Sub-surface Imaging of Porous GaN Distributed Bragg Reflectors via Backscattered Electrons. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2024; 30:208-225. [PMID: 38578956 DOI: 10.1093/mam/ozae028] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/13/2023] [Revised: 02/09/2024] [Accepted: 03/04/2024] [Indexed: 04/07/2024]
Abstract
In this article, porous GaN distributed Bragg reflectors (DBRs) were fabricated by epitaxy of undoped/doped multilayers followed by electrochemical etching. We present backscattered electron scanning electron microscopy (BSE-SEM) for sub-surface plan-view imaging, enabling efficient, non-destructive pore morphology characterization. In mesoporous GaN DBRs, BSE-SEM images the same branching pores and Voronoi-like domains as scanning transmission electron microscopy. In microporous GaN DBRs, micrographs were dominated by first porous layer features (45 nm to 108 nm sub-surface) with diffuse second layer (153 nm to 216 nm sub-surface) contributions. The optimum primary electron landing energy (LE) for image contrast and spatial resolution in a Zeiss GeminiSEM 300 was approximately 20 keV. BSE-SEM detects porosity ca. 295 nm sub-surface in an overgrown porous GaN DBR, yielding low contrast that is still first porous layer dominated. Imaging through a ca. 190 nm GaN cap improves contrast. We derived image contrast, spatial resolution, and information depth expectations from semi-empirical expressions. These theoretical studies echo our experiments as image contrast and spatial resolution can improve with higher LE, plateauing towards 30 keV. BSE-SEM is predicted to be dominated by the uppermost porous layer's uppermost region, congruent with experimental analysis. Most pertinently, information depth increases with LE, as observed.
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Affiliation(s)
- Maruf Sarkar
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Francesca Adams
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Sidra A Dar
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Jordan Penn
- Department of Physics, University of Oxford, Oxford OX1 3PJ, UK
| | - Yihong Ji
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Abhiram Gundimeda
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | | | | | | | | | - Thomas O'Hanlon
- Plymouth Electron Microscopy Center, University of Plymouth, Plymouth PL4 8AA, UK
| | - Menno J Kappers
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Saptarsi Ghosh
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Gunnar Kusch
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
| | - Rachel A Oliver
- Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK
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2
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Rau EI, Tatarintsev AA, Zykova EY. A novel method for measuring the charging kinetics of dielectrics under electron irradiation in SEM. Micron 2023; 173:103516. [PMID: 37531793 DOI: 10.1016/j.micron.2023.103516] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/29/2023] [Revised: 07/16/2023] [Accepted: 07/17/2023] [Indexed: 08/04/2023]
Abstract
A novel method is proposed to measure the charging potential of dielectric targets under medium energy electron irradiation in a scanning electron microscope. The method is based on the measurement of backscattered electron signals by standard semiconductor or scintillation detectors. The signal is pre-calibrated by grey scale levels on the SEM screen. The detector signal is made up with backscattered and secondary electrons which are accelerated in the electric field created above the dielectric surface under irradiation.
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Affiliation(s)
- E I Rau
- M.V.Lomonosov Moscow State University, Faculty of Physics, Leninskie Gory, Moscow 119991, Russia
| | - A A Tatarintsev
- M.V.Lomonosov Moscow State University, Faculty of Physics, Leninskie Gory, Moscow 119991, Russia
| | - E Yu Zykova
- M.V.Lomonosov Moscow State University, Faculty of Physics, Leninskie Gory, Moscow 119991, Russia.
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Skoupý R, Boltje DB, Slouf M, Mrázová K, Láznička T, Taisne CM, Krzyžánek V, Hoogenboom JP, Jakobi AJ. Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM. SMALL METHODS 2023; 7:e2300258. [PMID: 37248805 DOI: 10.1002/smtd.202300258] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/27/2023] [Revised: 04/21/2023] [Indexed: 05/31/2023]
Abstract
A quantitative four-dimensional scanning transmission electron microscopy (4D-STEM) imaging technique (q4STEM) for local thickness estimation across amorphous specimen such as obtained by focused ion beam (FIB)-milling of lamellae for (cryo-)TEM analysis is presented. This study is based on measuring spatially resolved diffraction patterns to obtain the angular distribution of electron scattering, or the ratio of integrated virtual dark and bright field STEM signals, and their quantitative evaluation using Monte Carlo simulations. The method is independent of signal intensity calibrations and only requires knowledge of the detector geometry, which is invariant for a given instrument. This study demonstrates that the method yields robust thickness estimates for sub-micrometer amorphous specimen using both direct detection and light conversion 2D-STEM detectors in a coincident FIB-SEM and a conventional SEM. Due to its facile implementation and minimal dose reauirements, it is anticipated that this method will find applications for in situ thickness monitoring during lamella fabrication of beam-sensitive materials.
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Affiliation(s)
- Radim Skoupý
- Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ
- Department of Bionanoscience, Delft University of Technology, Delft, 2628 CD, NL
- Kavli Institute of Nanoscience, Delft University of Technology, Delft, 2628 CJ, NL
- Department of Imaging Physics, Delft University of Technology, Delft, 2628 CJ, NL
| | - Daan B Boltje
- Department of Imaging Physics, Delft University of Technology, Delft, 2628 CJ, NL
| | - Miroslav Slouf
- Institute of Macromolecular Chemistry, Czech Academy of Sciences, Prague, 162 00, CZ
| | - Kateřina Mrázová
- Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ
| | - Tomáš Láznička
- Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ
| | - Clémence M Taisne
- Department of Bionanoscience, Delft University of Technology, Delft, 2628 CD, NL
| | - Vladislav Krzyžánek
- Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ
| | - Jacob P Hoogenboom
- Department of Imaging Physics, Delft University of Technology, Delft, 2628 CJ, NL
| | - Arjen J Jakobi
- Department of Bionanoscience, Delft University of Technology, Delft, 2628 CD, NL
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4
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Čalkovský M, Müller E, Gerthsen D. Quantitative analysis of backscattered-electron contrast in scanning electron microscopy. J Microsc 2023; 289:32-47. [PMID: 36245312 DOI: 10.1111/jmi.13148] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/27/2022] [Revised: 09/21/2022] [Accepted: 09/28/2022] [Indexed: 12/15/2022]
Abstract
Backscattered-electron scanning electron microscopy (BSE-SEM) imaging is a valuable technique for materials characterisation because it provides information about the homogeneity of the material in the analysed specimen and is therefore an important technique in modern electron microscopy. However, the information contained in BSE-SEM images is up to now rarely quantitatively evaluated. The main challenge of quantitative BSE-SEM imaging is to relate the measured BSE intensity to the backscattering coefficient η and the (average) atomic number Z to derive chemical information from the BSE-SEM image. We propose a quantitative BSE-SEM method, which is based on the comparison of Monte-Carlo (MC) simulated and measured BSE intensities acquired from wedge-shaped electron-transparent specimens with known thickness profile. The new method also includes measures to improve and validate the agreement of the MC simulations with experimental data. Two different challenging samples (ZnS/Zn(Ox S1- x )/ZnO/Si-multilayer and PTB7/PC71 BM-multilayer systems) are quantitatively analysed, which demonstrates the validity of the proposed method and emphasises the importance of realistic MC simulations for quantitative BSE-SEM analysis. Moreover, MC simulations can be used to optimise the imaging parameters (electron energy, detection-angle range) in advance to avoid tedious experimental trial and error optimisation. Under optimised imaging conditions pre-determined by MC simulations, the BSE-SEM technique is capable of distinguishing materials with small composition differences.
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Affiliation(s)
- Martin Čalkovský
- 3DMM2O, Cluster of Excellence (EXC-2082/1-390761711), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.,Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
| | - Erich Müller
- Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
| | - Dagmar Gerthsen
- 3DMM2O, Cluster of Excellence (EXC-2082/1-390761711), Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.,Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany
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Vasile E, Ciocanea A, Ionescu V, Lepadatu I, Diac C, Stamatin SN. Making precious metals cheap: A sonoelectrochemical - Hydrodynamic cavitation method to recycle platinum group metals from spent automotive catalysts. ULTRASONICS SONOCHEMISTRY 2021; 72:105404. [PMID: 33341709 PMCID: PMC7803685 DOI: 10.1016/j.ultsonch.2020.105404] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/29/2020] [Revised: 11/01/2020] [Accepted: 11/08/2020] [Indexed: 06/12/2023]
Abstract
Platinum group metals, such as Pd and Pt, found in three-way catalyst converters were recycled in a two-step method: hydrodynamic cavitation followed by sonoelectrochemical dissolution. High shear forces were obtained by using a convergent nozzle with a throat diameter of 0.2 mm, feeded by a plunger pump at a pressure of 60 MPa. Cavitating submerged jets acted locally on the water dispersed waste catalyst. As-obtained samples were analyzed by scanning electron microscopy and transmission electron microscopy. Electron microscopy on the initial sample showed that round shaped Pd and Pt nanoparticles were randomly distributed on the Al2O3 matrix. Cavitated samples show two zones in which Pt and Pd were partially and completely separated from the cordierite. The hydrodynamic cavitation separates the Pd and Pt from the cordierite leading to an apparent increase in Pd and Pt concentrations of 9% and 34% respectively. Conventional electrochemistry showed a dissolution of 20% in 1 h. To further accelerate the dissolution, a sonotrode operating at 20 kHz and 75 W was placed inside an electrochemical cell in order to increase the mass transport and obtain high dissolution rates. Indeed, the results showed that 40% of the available Pd and Pt can be recycled in just 1 h. In the absence of hydrodynamic cavitation and using conventional electrochemistry less than 10% of the available Pt and Pd is recovered in 1 h. The cost analysis showed that Pd and Pt can be recovered at less than 10 EUR per g which is 5 times smaller than their current market price.
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Affiliation(s)
- Eugeniu Vasile
- Department of Oxide Materials and Nanomaterials, Faculty of Applied Chemistry and Material Science, University "Politehnica" of Bucharest, Bucharest 060042, Romania
| | - Adrian Ciocanea
- Power Engineering Faculty Hydraulics, Hydraulic Machines, and Environmental Engineering Department, University "Politehnica" of Bucharest, Bucharest 060042, Romania.
| | - Viorel Ionescu
- Department of Physics and Electronics, Ovidius University of Constanta, Constanta 900527, Romania
| | - Ioan Lepadatu
- National R&D Institute for Optoelectronics - INOE 2000, Bucharest 077125, Romania
| | - Cornelia Diac
- 3Nano-SAE Research Centre, University of Bucharest, 077125, Romania; Faculty of Physics, University of Bucharest, 077125, Romania
| | - Serban N Stamatin
- 3Nano-SAE Research Centre, University of Bucharest, 077125, Romania; Faculty of Physics, University of Bucharest, 077125, Romania.
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Determination of electron backscattering coefficient of beryllium by a high-precision Monte Carlo simulation. NUCLEAR MATERIALS AND ENERGY 2021. [DOI: 10.1016/j.nme.2020.100862] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
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Dominant rule of community effect in synchronized beating behavior of cardiomyocyte networks. Biophys Rev 2020; 12:481-501. [PMID: 32367300 DOI: 10.1007/s12551-020-00688-3] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/02/2020] [Accepted: 03/03/2020] [Indexed: 10/24/2022] Open
Abstract
Exploiting the combination of latest microfabrication technologies and single cell measurement technologies, we can measure the interactions of single cells, and cell networks from "algebraic" and "geometric" perspectives under the full control of their environments and interactions. However, the experimental constructive single cell-based approach still remains the limitations regarding the quality and condition control of those cells. To overcome these limitations, mathematical modeling is one of the most powerful complementary approaches. In this review, we first explain our on-chip experimental methods for constructive approach, and we introduce the results of the "community effect" of beating cardiomyocyte networks as an example of this approach. On-chip analysis revealed that (1) synchronized interbeat intervals (IBIs) of cell networks were followed to the more stable beating cells even their IBIs were slower than the other cells, which is against the conventional faster firing regulation or "overdrive suppression," and (2) fluctuation of IBIs of cardiomyocyte networks decreased according to the increase of the number of connected cells regardless of their geometry. The mathematical simulation of this synchronous behavior of cardiomyocyte networks also fitted well with the experimental results after incorporating the fluctuation-dissipation theorem into the oscillating stochastic phase model, in which the concept of spatially arranged cardiomyocyte networks was involved. The constructive experiments and mathematical modeling indicated the dominant rule of synchronization behavior of beating cardiomyocyte networks is a kind of stability-oriented synchronization phenomenon as the "community effect" or a fluctuation-dissipation phenomenon. Finally, as a practical application of this approach, the predictive cardiotoxicity is introduced.
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Skoupy R, Fort T, Krzyzanek V. Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration. NANOMATERIALS 2020; 10:nano10020332. [PMID: 32075242 PMCID: PMC7075161 DOI: 10.3390/nano10020332] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/07/2020] [Revised: 01/27/2020] [Accepted: 02/12/2020] [Indexed: 11/23/2022]
Abstract
The thickness of electron transparent samples can be measured in an electron microscope using several imaging techniques like electron energy loss spectroscopy (EELS) or quantitative scanning transmission electron microscopy (STEM). We extrapolate this method for using a back-scattered electron (BSE) detector in the scanning electron microscope (SEM). This brings the opportunity to measure the thickness not just of the electron transparent samples on TEM mesh grids, but, in addition, also the thickness of thin films on substrates. Nevertheless, the geometry of the microscope and the BSE detector poses a problem with precise calibration of the detector. We present a simple method which can be used for such a type of detector calibration that allows absolute (standardless) measurement of thickness, together with a proof of the method on test samples.
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Quantitative analysis of backscattered electron (BSE) contrast using low voltage scanning electron microscopy (LVSEM) and its application to Al 0.22Ga 0.78N/GaN layers. Ultramicroscopy 2018; 195:47-52. [PMID: 30179774 DOI: 10.1016/j.ultramic.2018.08.026] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/04/2017] [Revised: 12/04/2017] [Accepted: 08/26/2018] [Indexed: 11/20/2022]
Abstract
A novel method to quantify and predict the material contrast using Backscattered Electron (BSE) imaging in Scanning Electron Microscopy (SEM) is presented while using low primary electron beam energies (Ep). In this study, the parameters for BSE imaging in Low Voltage Scanning Electron Microscopy (LVSEM) are optimized for the layer system Al0.22Ga0.78N/GaN, which is typically used in High Electron Mobility Transistors (HEMTs). The layers are imaged at high resolution and the compounds are identified based on the quantitative BSE material contrast between Al0.22Ga0.78N and GaN. The quantification process described in this study is based on an analytical description that predicts the material contrast using a function that correlates the effective backscattering coefficient (η) with the atomic number Z.
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García-Betancourt ML, Magaña-Zavala C, Crespo-Sosa A. Structural and Optical Properties Correlated with the Morphology of Gold Nanoparticles Embedded in Synthetic Sapphire: A Microscopy Study. J Microsc Ultrastruct 2018; 6:72-82. [PMID: 30221131 PMCID: PMC6130246 DOI: 10.4103/jmau.jmau_19_18] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
Abstract
This work reports on the electron microscopy analysis of the structure and morphology of gold nanoparticles produced by ion implantation as well as their relationship to their optical properties. Metalic nanoparticles by ion implantation are usually spherical and formed beneath the surface of a dielectric matrix. In this experiment, the matrix was sapphire. After high-energy Si ion irradiation, the gold nanoparticles were elongated into prolate spheroids. Since the nanoparticles are embedded in a dielectric matrix, secondary electron imaging in a JEOL JSM-7800F at low voltage did not allow their analysis. This work proposes an analysis using backscattered electron imaging in a field emission scanning electron microscopy at higher voltages (20 kV) to explore the morphology of the embedded nanoparticles. The samples were observed by cross-sectional view as well as a top view of the surface of the sapphire matrix for exploration and recognition of their morphology, dimensions, distribution, and composition. The analysis was extended by means of Rutherford backscattering spectrometry, X-ray diffraction, and optical extinction spectroscopy. The nanoparticles exhibited structural and optical properties correlated directly to the morphology observed by microscopy. The beam interaction with the sample and the used parameters was simulated in the CASINO code, from which the depth of exploration with distinct parameters used in microscopy analysis was estimated.
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Affiliation(s)
- María Luisa García-Betancourt
- Department of Experimental Physics, Institute of Physics, National Autonomous University of Mexico (UNAM), CDMX, Mexico
| | - Carlos Magaña-Zavala
- Department of Experimental Physics, Institute of Physics, National Autonomous University of Mexico (UNAM), CDMX, Mexico
| | - Alejandro Crespo-Sosa
- Department of Experimental Physics, Institute of Physics, National Autonomous University of Mexico (UNAM), CDMX, Mexico
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García-Betancourt ML, Magaña-Zavala C, Crespo-Sosa A. Microscopy study, structural and optical properties correlated with the morphology of metallic nanoparticles embedded in synthetic sapphire. J Microsc Ultrastruct 2017. [DOI: 10.1016/j.jmau.2017.02.002] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Open
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12
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Backscattered electron imaging at low emerging angles: A physical approach to contrast in LVSEM. Ultramicroscopy 2013; 135:43-9. [DOI: 10.1016/j.ultramic.2013.06.002] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/28/2013] [Revised: 06/03/2013] [Accepted: 06/08/2013] [Indexed: 11/21/2022]
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