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For: Lei D, Mitsuishi K, Harada K, Shimojo M, Ju D, Takeguchi M. Direct acquisition of interferogram by stage scanning in electron interferometry. Microscopy (Oxf) 2013;62:563-70. [PMID: 23709762 DOI: 10.1093/jmicro/dft032] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open

For:	Lei D, Mitsuishi K, Harada K, Shimojo M, Ju D, Takeguchi M. Direct acquisition of interferogram by stage scanning in electron interferometry. Microscopy (Oxf) 2013;62:563-70. [PMID: 23709762 DOI: 10.1093/jmicro/dft032] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open

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(The first 100,000 artilces are displayed in RCA.)